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max v device handbook may 2011 altera corporation ? 2011 altera corporation. all rights reserved. altera, arria, cyclone, hardcopy, max, megacore, nios, quartus and stratix are reg. u.s. pat. & tm. off. and/or trademarks of altera corporation in the u.s. and other countries. all other trademarks and service marks are the property of their respective holders as described at www.altera.com/common/legal.html . altera warrants performance of its semiconductor products to current specifications in accordance with altera?s standard warranty, but reserves the right to make changes to any products and services at any time without notice . altera assumes no responsibility or liability arising out of the application or use of any information, product, or service described herein except as expressly ag reed to in writing by altera. altera customers are advised to obtain the latest version of device specifications before relying on any published information and bef ore placing orders for products or services.
may 2011 altera corporation max v device handbook contents section i. max v device core chapter 1. max v device family overview feature summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1?1 integrated software platform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1?3 device pin-outs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1?3 ordering information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1?4 document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1?4 chapter 2. max v architecture functional description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?1 logic array blocks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?4 lab interconnects . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?6 lab control signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?6 logic elements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?8 lut chain and register chain . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?9 addnsub signal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?9 le operating modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?9 normal mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?10 dynamic arithmetic mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?10 carry-select chain . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?11 clear and preset logic control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?13 le ram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?13 multitrack interconnect . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?14 global signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?19 user flash memory block . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?21 ufm storage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?22 internal oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?22 program, erase, and busy signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?23 auto-increment addressing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?23 serial interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?23 ufm block to logic array interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?24 core voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?25 i/o structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?26 fast i/o connection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?27 i/o blocks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?28 i/o standards and banks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?29 pci compliance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?32 lvds and rsds channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?32 schmitt trigger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?32 output enable signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?33 programmable drive strength . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?33 slew-rate control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?34 open-drain output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?34 programmable ground pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?34 bus-hold . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?34 programmable pull-up resistor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?35 programmable input delay . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?35
iv contents max v device handbook may 2011 altera corporation multivolt i/o interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?35 document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2?36 chapter 3. dc and switching characteristics for max v devices operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?1 absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?1 recommended operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?2 programming/erasure specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?3 dc electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?3 output drive characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?5 i/o standard specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?5 bus hold specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?8 power-up timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?9 power consumption . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?10 timing model and specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?10 preliminary and final timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?11 performance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?11 internal timing parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?12 external timing parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?19 external timing i/o delay adders . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?23 maximum input and output clock rates . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?26 lvds and rsds output timing specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?27 jtag timing specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?29 document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3?30 section ii. system integration in max v devices chapter 4. hot socketing and power-on reset in max v devices max v hot-socketing specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4?1 devices can be driven before power up . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4?2 i/o pins remain tri-stated during power up . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4?2 signal pins do not drive the v ccio or v ccint power supplies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4?2 ac and dc specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4?2 hot-socketing feature implementation in max v devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4? 3 power-on reset circuitry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4?5 power-up characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4?5 document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4?6 chapter 5. using max v devices in multi-voltage systems i/o standards . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5?1 multivolt i/o operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5?3 5.0-v device compatibility . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5?3 recommended operating conditions for 5.0-v compatibility . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5?7 power-up sequencing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5?8 document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5?8 chapter 6. jtag and in-system programmability in max v devices ieee std. 1149.1 boundary-scan support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6?1 jtag block . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6?4 parallel flash loader . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6?4 in-system programmability . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6?5 ieee 1532 support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6?6 jam standard test and programming language . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6?6
contents v may 2011 altera corporation max v device handbook programming sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6?6 user flash memory programming . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6?7 in-system programming clamp . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6?7 real-time isp . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6?8 design security . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6?8 programming with external hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6?8 document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6?9 chapter 7. user flash memory in max v devices ufm array description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?1 memory organization map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?2 using and accessing ufm storage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?2 ufm functional description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?3 ufm address register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?5 ufm data register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?6 ufm program/erase control block . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?6 oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?7 instantiating the oscillator without the ufm . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?7 ufm operating modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?8 read/stream read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?9 program . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?10 erase . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?11 programming and reading the ufm with jtag . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?12 jam files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?12 jam players . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?12 software support for ufm block . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?13 inter-integrated circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?13 i 2 c protocol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?13 device addressing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?15 byte write operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?16 page write operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?17 acknowledge polling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?17 write protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?17 erase operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?17 read operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?20 altufm_i2c interface timing specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 ?22 instantiating the i 2 c interface using the quartus ii altufm_i2c megafunction . . . . . . . . . . . 7?23 serial peripheral interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?23 opcodes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?25 altufm spi timing specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?35 instantiating spi using quartus ii altufm_spi megafunction . . . . . . . . . . . . . . . . . . . . . . . . . 7?35 parallel interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?36 altufm parallel interface timing specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7? 37 instantiating parallel interface using quartus ii altufm_parallel megafunction . . . . . . 7?37 none (altera serial interface) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?38 instantiating none using quartus ii altufm_none megafunction . . . . . . . . . . . . . . . . . . . . 7?38 creating memory content file . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?39 memory initialization for the altufm_parallel megafunction . . . . . . . . . . . . . . . . . . . . . . 7?39 memory initialization for the altufm_spi megafunction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?39 memory initialization for the altufm_i2c megafunction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?40 simulation parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?43 document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7?43
vi contents max v device handbook may 2011 altera corporation chapter 8. jtag boundary-scan testing in max v devices ieee std. 1149.1 bst architecture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?2 ieee std. 1149.1 boundary-scan register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?3 boundary-scan cells of a max v device i/o pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?4 jtag pins and power pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?5 ieee std. 1149.1 bst operation control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?6 sample/preload instruction mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?8 extest instruction mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?10 bypass instruction mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?12 idcode instruction mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?12 usercode instruction mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?13 clamp instruction mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?13 highz instruction mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?13 i/o voltage support in the jtag chain . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?13 boundary-scan test for programmed devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?14 disabling ieee std. 1149.1 bst circuitry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?15 guidelines for ieee std. 1149.1 boundary-scan testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?15 boundary-scan description language support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?15 document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8?16 additional information document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . info?1 how to contact altera . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . info?1 typographic conventions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . info?1
may 2011 altera corporation max v device handbook section i. max v device core this section provides a complete overview of all features relating to the max ? v device family. this section includes the following chapters: chapter 1, max v device family overview chapter 2, max v architecture chapter 3, dc and switching characteristics for max v devices
i?2 section i: max v device core max v device handbook may 2011 altera corporation
max v device handbook may 2011 mv51001-1.2 subscribe ? 2011 altera corporation. all rights reserved. altera, arria, cyclone, hardcopy, max, megacore, nios, quartus and stratix are reg. u.s. pat. & tm. off. and/or trademarks of altera corporation in the u.s. and other countries. all other trademarks and service marks are the propert y of their respective holders as described at www.altera.com/common/legal.html . altera warrants performance of its semiconductor products to current specifications in accordance with altera?s standard warr anty, but reserves the right to make changes to any products and services at any time without notice. altera assumes no responsibility or liability arising out of the application or use of any information, product, or service described herein except as expressly agreed to in writing by altera. altera customers are advi sed to obtain the latest version of device specifications before relying on any published information and before placing orders for products or services. 1. max v device family overview the max ? v family of low cost and low power cplds offer more density and i/os per footprint versus other cplds. ranging in density from 40 to 2,210 logic elements (les) (32 to 1,700 equivalent macrocells) and up to 271 i/os, max v devices provide programmable solutions for applications such as i/o expansion, bus and protocol bridging, power monitoring and control, fpga configuration, and analog ic interface. max v devices feature on-chip flash storage, internal oscillator, and memory functionality. with up to 50% lower total power versus other cplds and requiring as few as one power supply, max v cplds can help you meet your low power design requirement. this chapter contains the following sections: ?feature summary? on page 1?1 ?integrated software platform? on page 1?3 ?device pin-outs? on page 1?3 ?ordering information? on page 1?4 feature summary the following list summarizes the max v device family features: low-cost, low-power, and non-volatile cpld architecture instant-on (0.5 ms or less) configuration time standby current as low as 25 a and fast power-down/reset operation fast propagation delay and clock-to-output times internal oscillator emulated rsds output support with a data rate of up to 200 mbps emulated lvds output support with a data rate of up to 304 mbps four global clocks with two clocks available per logic array block (lab) user flash memory block up to 8 kbits for non-volatile storage with up to 1000 read/write cycles single 1.8-v external supply for device core multivolt i/o interface supporting 3.3-v, 2.5-v, 1.8-v, 1.5-v, and 1.2-v logic levels bus-friendly architecture including programmable slew rate, drive strength, bus-hold, and programmable pull-up resistors schmitt triggers enabling noise tolerant inputs (programmable per pin)
1?2 chapter 1: max v device family overview feature summary max v device handbook may 2011 altera corporation i/os are fully compliant with the pci-sig ? pci local bus specification, revision 2.2 for 3.3-v operation hot-socket compliant built-in jtag bst circuitry compliant with ieee std. 1149.1-1990 ta b l e 1 ?1 lists the max v family features. max v devices accept 1.8 v on their vccint pins. the 1.8-v v ccint external supply powers the device core directly. max v devices operate internally at 1.8 v. the supported multivolt i/o interface voltage levels (v ccio ) are 1.2 v, 1.5 v, 1.8 v, 2.5 v, and 3.3 v. max v devices are available in two speed grades: ?4 and ?5, with ?4 being the fastest. for commercial applications, speed grades ?c4 and ?c5 are available. for industrial and automotive applications, speed grade ?i5 and ?a5 are available, respectively. these speed grades represent the overall relative performance, not any specific timing parameter. f for propagation delay timing numbers within each speed grade and density, refer to the dc and switching characteristics for max v devices chapter. max v devices are available in space-saving fineline bga (fbga), micro fineline bga (mbga), plastic enhanced quad flat pack (eqfp), and thin quad flat pack (tqfp) packages (refer to table 1?2 and ta b l e 1 ?3 ). max v devices support vertical migration within the same package (for example, you can migrate between the 5m570z, 5m1270z, and 5m2210z devices in the 256-pin fineline bga package). vertical migration means that you can migrate to devices whose dedicated pins and jtag pins are the same and power pins are subsets or supersets for a given package across device densities. the largest density in any package has the highest number of power pins; you must lay out for the largest planned density in a package to provide table 1?1. max v family features feature 5m40z 5m80z 5m160z 5m240z 5m570z 5m1270z 5m2210z les 40 80 160 240 570 1,270 2,210 typical equivalent macrocells 32 64 128 192 440 980 1,700 user flash memory size (bits) 8,192 8,192 8,192 8,192 8,192 8,192 8,192 global clocks 4444444 internal oscillator 1 1 1 1 1 1 1 maximum user i/o pins 54 79 79 114 159 271 271 t pd1 (ns) (1) 7.5 7.5 7.5 7.5 9.0 6.2 7.0 f cnt (mhz) (2) 152 152 152 152 152 304 304 t su (ns) 2.3 2.3 2.3 2.3 2.2 1.2 1.2 t co (ns) 6.5 6.5 6.5 6.5 6.7 4.6 4.6 notes to table 1?1 : (1) t pd1 represents a pin-to-pin delay for the worst case i/o placement with a full diagonal path across the device and combinational l ogic implemented in a single lut and lab that is adjacent to the output pin. (2) the maximum global clock frequency, f cnt , is limited by the i/o standard on the clock input pin. the 16-bit counter critical delay will run faster than this number.
chapter 1: max v device family overview 1?3 integrated software platform may 2011 altera corporation max v device handbook the necessary power pins for migration. for i/o pin migration across densities, cross reference the available i/o pins using the device pin-outs for all planned densities of a given package type to identify which i/o pins can be migrated. the quartus ? ii software can automatically cross-reference and place all pins for you when given a device migration list. integrated software platform the quartus ii software provides an integrated environment for hdl and schematic design entry, compilation and logic synthesis, full simulation and advanced timing analysis, and programming of max v devices. f for more information about the quartus ii software features, refer to the quartus ii handbook . you can debug your max v designs using in-system sources and probes editor in the quartus ii software. this feature allows you to easily control any internal signal and provides you with a completely dynamic debugging environment. f for more information about the in-system sources and probes editor, refer to the design debugging using in-system sources and probes chapter of the quartus ii handbook . device pin-outs f for more information, refer to the max v device pin-out files page. table 1?2. max v packages and user i/o pins (note 1) device 64-pin mbga 64-pin eqfp 68-pin mbga 100-pin tqfp 100-pin mbga 144-pin tqfp 256-pin fbga 324-pin fbga 5m40z 30 54 ? ? ? ? ? ? 5m80z 30 54 52 79 ? ? ? ? 5m160z ? 54 52 79 79 ? ? ? 5m240z ? ? 52 79 79 114 ? ? 5m570z ? ? ? 74 74 114 159 ? 5m1270z ? ? ? ? ? 114 211 271 5m2210z ? ? ? ? ? ? 203 271 note to table 1?2 : (1) device packages under the same arrow sign have vertical migration capability. table 1?3. max v package sizes package 64-pin mbga 64-pin eqfp 68-pin mbga 100-pin tqfp 100-pin mbga 144-pin tqfp 256-pin fbga 324-pin fbga pitch (mm) 0.5 0.4 0.5 0.5 0.5 0.5 1 1 area (mm 2 ) 20.25 81 25 256 36 484 289 361 length width (mm mm) 4.5 4.5 9 9 5 5 16 16 6 6 22 22 17 17 19 19
1?4 chapter 1: max v device family overview ordering information max v device handbook may 2011 altera corporation ordering information figure 1?1 shows the ordering codes for max v devices. document revision history ta b l e 1 ?4 lists the revision history for this chapter. figure 1?1. max v device packaging ordering information package type t: thin quad flat pack (tqfp) f: fineline bga (fbga) m: micro fineline bga (mbga) e: plastic enhanced quad flat pack (eqfp) speed grade family signature 5m: max v operating temperature pin count device type 40z: 40 logic elements 80z: 80 logic elements 160z: 160 logic elements 240z: 240 logic elements 570z: 570 logic elements 1270z: 1,270 logic elements 2210z: 2,210 logic elements optional suffix 4 or 5, with 4 being the fastest number of pins for a particular package c: commercial temperature (t j = 0 c to 85 c) i: industrial temperature (t j = -40 c to 100 c) a: automotive temperature (t j = -40 c to 125 c) 5m 40z e 64 c 4 n indicates specific device options or shipment method n: lead-free packaging table 1?4. document revision history date version changes may 2011 1.2 updated figure 1?1 . updated table 1?3 . january 2011 1.1 updated ?feature summary? section. december 2010 1.0 initial release.
max v device handbook december 2010 mv51002-1.0 subscribe ? 2010 altera corporation. all rights reserved. altera, arria, cyclone, hardcopy, max, megacore, nios, quartus and stratix are reg. u.s. pat. & tm. off. and/or trademarks of altera corporation in the u.s. and other countries. all other trademarks and service marks are the property of their respective holders as described at www.altera.com/common/legal.html . altera warrants performance of its semiconductor products to current specifications in accordance with altera?s standard warranty, but reserves the right to make changes to any products and services at any time without notice. altera assumes no responsibility or liability aris ing out of the app lication or u se of any information, product, or service described herein except as expressly agreed to in writing by altera. altera customers are advi sed to obtain the latest version of device specifications before relying on any published information and before placing orders for products or services. 2. max v architecture this chapter describes the architecture of the max ? v device and contains the following sections: ?functional description? on page 2?1 ?logic array blocks? on page 2?4 ?logic elements? on page 2?8 ?multitrack interconnect? on page 2?14 ?global signals? on page 2?19 ?user flash memory block? on page 2?21 ?internal oscillator? on page 2?22 ?core voltage? on page 2?25 ?i/o structure? on page 2?26 functional description max v devices contain a two-dimensional row- and column-based architecture to implement custom logic. row and column interconnects provide signal interconnects between the logic array blocks (labs). each lab in the logic array contains 10 logic elements (les). an le is a small unit of logic that provides efficient implementation of user logic functions. labs are grouped into rows and columns across the device. the multitrack interconnect provides fast granular timing delays between labs. the fast routing between les provides minimum timing delay for added levels of logic versus globally routed interconnect structures. the i/o elements (ioes) located after the lab rows and columns around the periphery of the max v device feeds the i/o pins. each ioe contains a bidirectional i/o buffer with several advanced features. i/o pins support schmitt trigger inputs and various single-ended standards, such as 33-mhz, 32-bit pci?, and lvttl. max v devices provide a global clock networ k. the global clock network consists of four global clock lines that drive throughout the entire device, providing clocks for all resources within the device. you can also use the global clock lines for control signals such as clear, preset, or output enable.
2?2 chapter 2: max v architecture functional description max v device handbook december 2010 altera corporation figure 2?1 shows a functional block diagram of the max v device. each max v device contains a flash memory block within its floorplan. this block is located on the left side of the 5m40z, 5m80z, 5m160z, and 5m240z devices. on the 5m240z (t144 package), 5m570z, 5m1270z, and 5m2210z devices, the flash memory block is located on the bottom-left area of the device. the majority of this flash memory storage is partitioned as the dedicated configuration flash memory (cfm) block. the cfm block provides the non-volatile storage for all of the sram configuration information. the cfm automatically downloads and configures the logic and i/o at power-up, providing instant-on operation. f for more information about configuration upon power-up, refer to the hot socketing and power-on reset for max v devices chapter. a portion of the flash memory within the max v device is partitioned into a small block for user data. this user flash memory (ufm) block provides 8,192 bits of general-purpose user storage. the ufm provides programmable port connections to the logic array for reading and writing. there are three lab rows adjacent to this block, with column numbers varying by device. figure 2?1. device block diagram logic array block (lab) multitrack interconnect multitrack interconnect logic element logic element ioe ioe ioe ioe logic element logic element ioe ioe logic element logic element ioe ioe logic element logic element logic element logic element ioe ioe logic element logic element
chapter 2: max v architecture 2?3 functional description december 2010 altera corporation max v device handbook table 2?1 lists the number of lab rows and columns in each device, as well as the number of lab rows and columns adjacent to the flash memory area. the long lab rows are full lab rows that extend from one side of row i/o blocks to the other. the short lab rows are adjacent to the ufm block; their length is shown as width in lab columns. table 2?1. device resources for max v devices device ufm blocks lab columns lab rows tot al l ab s long lab rows short lab rows (width) (1) 5m40z 1 6 4 ? 24 5m80z 1 6 4 ? 24 5m160z 1 6 4 ? 24 5m240z (2) 164 ? 2 4 5m240z (3) 11 24 3 ( 3 ) 5 7 5m570z 1 12 4 3 (3) 57 5m1270z (4) 11 67 3 ( 5 ) 1 2 7 5m1270z (5) 12 01 0 3 ( 7 ) 2 2 1 5m2210z 1 20 10 3 (7) 221 notes to ta bl e 2? 1 : (1) the width is the number of lab columns in length. (2) not applicable to t144 package of the 5m240z device. (3) only applicable to t144 package of the 5m240z device. (4) not applicable to f 324 package of the 5m1270z device. (5) only applicable to f324 package of the 5m1270z device.
2?4 chapter 2: max v architecture logic array blocks max v device handbook december 2010 altera corporation figure 2?2 shows a floorplan of a max v device. logic array blocks each lab consists of 10 les, le carry chains, lab control signals, a local interconnect, a look-up table (lut) chain, and register chain connection lines. there are 26 possible unique inputs into an lab, with an additional 10 local feedback input lines fed by le outputs in the same lab. the local interconnect transfers signals between les in the same lab. lut chain connections transfer the lut output from one le to the figure 2?2. device floorplan for max v devices (note 1) note to figure 2?2 : (1) the device shown is a 5m570z device. 5m1270z and 5m2210z devices have a similar floorplan with more labs. for 5m40z, 5m80z, 5m160z, and 5m240z devices, the cfm and ufm blocks are located on the left side of the device. ufm block cfm block i/o blocks logic array blocks i/o blocks logic arra y blocks 2 gclk inputs 2 gclk inputs i/o blocks
chapter 2: max v architecture 2?5 logic array blocks december 2010 altera corporation max v device handbook adjacent le for fast sequential lut connections within the same lab. register chain connections transfer the output of one le?s register to the adjacent le?s register within an lab. the quartus ? ii software places associated logic within an lab or adjacent labs, allowing the use of local, lut chain, and register chain connections for performance and area efficiency. figure 2?3 shows the max v lab. figure 2?3. lab structure for max v devices note to figure 2?3 : (1) only from labs adjacent to ioes. directlink interconnect from adjacent lab or ioe directlink interconnect to adjacent lab or ioe row interconnect column interconnect local interconnect lab directlink interconnect from adjacent lab or ioe directlink interconnect to adjacent lab or ioe fast i/o connection to ioe (1) fast i/o connection to ioe (1) le0 le1 le2 le3 le4 le6 le7 le8 le9 le5 logic element
2?6 chapter 2: max v architecture logic array blocks max v device handbook december 2010 altera corporation lab interconnects column and row interconnects and le outputs within the same lab drive the lab local interconnect. adjacent labs, from the left and right, can also drive an lab?s local interconnect through the directlink connection. the directlink connection feature minimizes the use of row and column interconnects, providing higher performance and flexibility. each le can drive 30 other les through fast local and directlink interconnects. figure 2?4 shows the directlink connection. lab control signals each lab contains dedicated logic for driving control signals to its les. the control signals include two clocks, two clock enables, two asynchronous clears, a synchronous clear, an asynchronous preset/load, a synchronous load, and add/subtract control signals, providing a maximum of 10 control signals at a time. synchronous load and clear signals are generally used when implementing counters but they can also be used with other functions. each lab can use two clocks and two clock enable signals. each lab?s clock and clock enable signals are linked. for example, any le in a particular lab using the labclk1 signal also uses labclkena1 . if the lab uses both the rising and falling edges of a clock, it also uses both lab-wide clock signals. deasserting the clock enable signal turns off the lab-wide clock. each lab can use two asynchronous clear signals and an asynchronous load/preset signal. by default, the quartus ii software uses a not gate push-back technique to achieve preset. if you disable the not gate push-back option or assign a given register to power-up high using the quartus ii software, the preset is then achieved using the asynchronous load signal with asynchronous load data input tied high. figure 2?4. directlink connection lab directlink interconnect to right directlink interconnect from right lab or ioe output directlink interconnect from left lab or ioe output local interconnect directlink interconnect to left le0 le1 le2 le3 le4 le6 le7 le8 le9 le5 logic element
chapter 2: max v architecture 2?7 logic array blocks december 2010 altera corporation max v device handbook with the lab-wide addnsub control signal, a single le can implement a one-bit adder and subtractor. this signal saves le resources and improves performance for logic functions such as correlators and signed multipliers that alternate between addition and subtraction depending on data. the lab column clocks [3..0] , driven by the global clock network, and lab local interconnect generate the lab-wide control signals. the multitrack interconnect structure drives the lab local interconnect for non-global control signal generation. the multitrack interconnect?s inherent low skew allows clock and control signal distribution in addition to data signals. figure 2?5 shows the lab control signal generation circuit. figure 2?5. lab-wide control signals labclkena1 labclk2 labclk1 labclkena2 asyncload or labpre syncload dedicated lab column clocks local interconnect local interconnect local interconnect local interconnect local interconnect local interconnect labclr1 labclr2 synclr addnsub 4
2?8 chapter 2: max v architecture logic elements max v device handbook december 2010 altera corporation logic elements the smallest unit of logic in the max v architecture, the le, is compact and provides advanced features with efficient logic utilization. each le contains a four-input lut, which is a function generator that can implement any function of four variables. in addition, each le contains a programmable register and carry chain with carry-select capability. a single le also supports dynamic single-bit addition or subtraction mode that is selected by an lab-wide control signal. each le drives all types of interconnects: local, row, column, lut chain, register chain, and directlink interconnects as shown in figure 2?6 . you can configure each le?s programmable register for d, t, jk, or sr operation. each register has data, true asynchronous load data, clock, clock enable, clear, and asynchronous load/preset inputs. global signals, general purpose i/o (gpio) pins, or any le can drive the register ?s clock and clear control signals. either gpio pins or les can drive the clock enable, preset, asynchronous load, and asynchronous data. the asynchronous load data input comes from the data3 input of the le. for combinational functions, the lut output bypasses the register and drives directly to the le outputs. each le has three outputs that drive the local, row, and column routing resources. the lut or register output can drive these three outputs independently. two le outputs drive either a column or row and directlink routing connections while one output drives the local interconnect resources. this configuration allows the lut to drive one output while the register drives another output. this register packing feature figure 2?6. le for max v devices labclk1 labclk2 labclr2 labpre/aload carry-in1 carry-in0 lab carry-in clock and clock ena b le select lab carry-o ut carry-o ut1 carry-o ut0 look-up ta b le (lut) carry chain row, col umn, and directlink routing row, col umn, and directlink routing programmable registe r prn/ald clrn d q ena registe r bypass packed registe r select chip-wide reset (dev_clrn) lab clkena1 lab clkena2 synchronous load and clear logic lab-wide synchronous load lab-wide synchrono us clear asynchronous clear/preset/ load logic data1 data2 data3 data4 lut chain rou ting to next le labclr1 local routing register chain output adata addnsub registe r feedback register chain routing from previo us le
chapter 2: max v architecture 2?9 logic elements december 2010 altera corporation max v device handbook improves device utilization because the device can use the register and the lut for unrelated functions. another special packing mode allows the register output to feed back into the lut of the same le so that the register is packed with its own fan-out lut. this mode provides another mechanism for improved fitting. the le can also drive out registered and unregistered versions of the lut output. lut chain and register chain in addition to the three general routing outputs, the les within a lab have lut chain and register chain outputs. lut chain connections allow luts within the same lab to cascade together for wide input functions. register chain outputs allow registers within the same lab to cascade together. the register chain output allows a lab to use luts for a single combinational function and the registers for an unrelated shift register implementation. these resources speed up connections between labs while saving local interconnect resources. for more information about lut chain and register chain connections, refer to ?multitrack interconnect? on page 2?14 . addnsub signal the le?s dynamic adder/subtractor feature saves logic resources by using one set of les to implement both an adder and a subtractor. this feature is controlled by the lab-wide control signal addnsub . the addnsub signal sets the lab to perform either a + b or a ? b. the lut computes addition; subtraction is computed by adding the two?s complement of the intended subtractor. the lab-wide signal converts to two?s complement by inverting the b bits within the lab and setting carry-in to 1, which adds one to the lsb. the lsb of an adder/subtractor must be placed in the first le of the lab, where the lab-wide addnsub signal automatically sets the carry-in to 1. the quartus ii compiler automatically places and uses the adder/subtractor feature when using adder/subtractor parameterized functions. le operating modes the max v le can operate in one of the following modes: ?normal mode? ?dynamic arithmetic mode? each mode uses le resources differently. in each mode, eight available inputs to the le, the four data inputs from the lab local interconnect, carry-in0 and carry-in1 from the previous le, the lab carry-in from the previous carry-chain lab, and the register chain connection are directed to different destinations to implement the desired logic function. lab-wide signals provide clock, asynchronous clear, asynchronous preset/load, synchronous clear, synchronous load, and clock enable control for the register. these lab-wide signals are available in all le modes. the addnsub control signal is allowed in arithmetic mode. the quartus ii software, along with parameterized functions such as the library of parameterized modules (lpm) functions, automatically chooses the appropriate mode for common functions such as counters, adders, subtractors, and arithmetic functions.
2?10 chapter 2: max v architecture logic elements max v device handbook december 2010 altera corporation normal mode the normal mode is suitable for general logic applications and combinational functions. in normal mode, four data inputs from the lab local interconnect are inputs to a four-input lut as shown in figure 2?7 . the quartus ii compiler automatically selects the carry-in or the data3 signal as one of the inputs to the lut. each le can use lut chain connections to drive its combinational output directly to the next le in the lab. asynchronous load data for the register comes from the data3 input of the le. les in normal mode support packed registers. dynamic arithmetic mode the dynamic arithmetic mode is ideal for implementing adders, counters, accumulators, wide parity functions, and comparators. a le in dynamic arithmetic mode uses four 2-input luts configurable as a dynamic adder/subtractor. the first two 2-input luts compute two summations based on a possible carry-in of 1 or 0; the other two luts generate carry outputs for the two chains of the carry-select circuitry. as shown in figure 2?8 , the lab carry-in signal selects either the carry-in0 or carry-in1 chain. the selected chain?s logic level in turn determines which parallel sum is generated as a combinational or registered output. for example, when implementing an adder, the sum output is the selection of two possible calculated sums: data1 + data2 + carry-in0 or data1 + data2 + carry-in1 figure 2?7. le in normal mode note to figure 2?7 : (1) this signal is only allowed in normal mode if the le is after an adder/subtractor chain. data1 4-input lut data2 data3 cin (from cout of pre vious le) data4 addnsub (lab w ide) clock (lab w ide) ena (lab w ide) aclr (lab w ide) aload (lab w ide) ald/pre clrn d q ena adata sclear (lab w ide) sload (lab w ide) register chain connection lut chain connection register chain output ro w , column, and directlink routing ro w , column, and directlink routing local routing register feedback (1)
chapter 2: max v architecture 2?11 logic elements december 2010 altera corporation max v device handbook the other two luts use the data1 and data2 signals to generate two possible carry-out signals: one for a carry of 1 and the other for a carry of 0. the carry-in0 signal acts as the carry-select for the carry-out0 output and carry-in1 acts as the carry-select for the carry-out1 output. les in arithmetic mode can drive out registered and unregistered versions of the lut output. the dynamic arithmetic mode also offers clock enable, counter enable, synchronous up/down control, synchronous clear, synchronous load, and dynamic adder/subtractor options. the lab local interconnect data inputs generate the counter enable and synchronous up/down control signals. the synchronous clear and synchronous load options are lab-wide signals that affect all registers in the lab. the quartus ii software automatically places any registers that are not used by the counter into other labs. the addnsub lab-wide signal controls whether the le acts as an adder or subtractor. carry-select chain the carry-select chain provides a very fast carry-select function between les in dynamic arithmetic mode. the carry-select chain uses the redundant carry calculation to increase the speed of carry functions. the le is configured to calculate outputs for a possible carry-in of 0 and carry-in of 1 in parallel. the carry-in0 and carry-in1 signals from a lower-order bit feed forward into the higher-order bit via the parallel carry chain and feed into both the lut and the next portion of the carry chain. carry-select chains can begin in any le within an lab. figure 2?8. le in dynamic arithmetic mode note to figure 2?8 : (1) the addnsub signal is tied to the carry input for the first le of a carry chain only. data1 lut data2 data3 addnsub (lab w ide) clock (lab w ide) ena (lab w ide) aclr (lab w ide) ald/pre clrn d q ena adata register chain connection lut lut lut carry-out1 carry-out0 lab carry-in carry-in0 carry-in1 (1) sclear (lab w ide) sload (lab w ide) lut chain connection register chain output ro w , column, an d direct link routing ro w , column, an d direct link routing local routing aload (lab w ide) register feedback
2?12 chapter 2: max v architecture logic elements max v device handbook december 2010 altera corporation the speed advantage of the carry-select chain is in the parallel pre-computation of carry chains. because the lab carry-in selects the precomputed carry chain, not every le is in the critical path. only the propagation delays between lab carry-in generation ( le5 and le10 ) are now part of the critical path. this feature allows the max v architecture to implement high-speed counters, adders, multipliers, parity functions, and comparators of arbitrary width. figure 2?9 shows the carry-select circuitry in an lab for a 10-bit full adder. one portion of the lut generates the sum of two bits using the input signals and the appropriate carry-in bit; the sum is routed to the output of the le. the register can be bypassed for simple adders or used for accumulator functions. another portion of the lut generates carry-out bits. an lab-wide carry-in bit selects which chain is used for the addition of given inputs. the carry-in signal for each chain, carry-in0 or carry-in1 , selects the carry-out to carry forward to the carry-in signal of the next-higher-order bit. the final carry-out signal is routed to an le, where it is fed to local, row, or column interconnects. figure 2?9. carry-select chain le3 le2 le1 le0 a1 b1 a2 b2 a3 b3 a4 b4 sum1 sum2 sum3 sum4 le9 le8 le7 le6 a7 b7 a8 b8 a9 b9 a10 b10 sum7 le5 a6 b6 sum6 le4 a5 b5 sum5 sum8 sum9 sum10 01 01 lab carry-in lab carry-out lut lut lut lut data1 lab carry-in data2 carry-in0 carry-in1 carry-out0 carry-out1 sum to top of adjacent lab
chapter 2: max v architecture 2?13 logic elements december 2010 altera corporation max v device handbook the quartus ii software automatically creates carry chain logic during design processing, or you can create it manually during design entry. parameterized functions such as lpm functions automatically take advantage of carry chains for the appropriate functions. the quartus ii software creates carry chains longer than 10 les by linking adjacent labs within the same row together automatically. a carry chain can extend horizontally up to one full lab row, but does not extend between lab rows. clear and preset logic control lab-wide signals control the logic for the register ?s clear and preset signals. the le directly supports an asynchronous clear and preset function. the register preset is achieved through the asynchronous load of a logic high. max v devices support simultaneous preset/asynchronous load and clear signals. an asynchronous clear signal takes precedence if both signals are asserted simultaneously. each lab supports up to two clears and one preset signal. in addition to the clear and preset ports, max v devices provide a chip-wide reset pin ( dev_clrn ) that resets all registers in the device. an option set before compilation in the quartus ii software controls this pin. this chip-wide reset overrides all other control signals and uses its own dedicated routing resources without using any of the four global resources. driving this signal low before or during power-up prevents user mode from releasing clears within the design. this allows you to control when clear is released on a device that has just been powered-up. if not set for its chip-wide reset function, the dev_clrn pin is a regular i/o pin. by default, all registers in max v devices are set to power-up low. however, this power-up state can be set to high on individual registers during design entry using the quartus ii software. le ram the quartus ii memory compiler can configure the unused les as le ram. max v devices support the following memory types: fifo synchronous r/w fifo asynchronous r/w 1 port sram 2 port sram 3 port sram shift registers f for more information about memory, refer to the internal memory (ram and rom) user guide .
2?14 chapter 2: max v architecture multitrack interconnect max v device handbook december 2010 altera corporation multitrack interconnect in the max v architecture, connections between les, the ufm, and device i/o pins are provided by the multitrack interconnect structure. the multitrack interconnect consists of continuous, performance-optimized routing lines used for inter- and intra-design block connectivity. the quartus ii compiler automatically places critical design paths on faster interconnects to improve design performance. the multitrack interconnect consists of row and column interconnects that span fixed distances. a routing structure with fixed length resources for all devices allows predictable and short delays between logic levels instead of large delays associated with global or long routing lines. dedicated row interconnects route signals to and from labs within the same row. these row resources include: directlink interconnects between labs r4 interconnects traversing four labs to the right or left the directlink interconnect allows an lab to drive into the local interconnect of its left and right neighbors. the directlink interconnect provides fast communication between adjacent labs and blocks without using row interconnect resources. the r4 interconnects span four labs and are used for fast row connections in a four-lab region. every lab has its own set of r4 interconnects to drive either left or right. figure 2?10 shows r4 interconnect connections from an lab. r4 interconnects can drive and be driven by row ioes. for lab interfacing, a primary lab or horizontal lab neighbor can drive a given r4 interconnect. for r4 interconnects that drive to the right, the primary lab and right neighbor can drive on to the interconnect. for r4 interconnects that drive to the left, the primary lab and its left neighbor can drive on to the interconnect. r4 interconnects can drive other r4 interconnects to extend the range of labs they can drive. r4 interconnects can also drive c4 interconnects for connections from one row to another.
chapter 2: max v architecture 2?15 multitrack interconnect december 2010 altera corporation max v device handbook the column interconnect operates similarly to the row interconnect. each column of labs is served by a dedicated column interconnect, which vertically routes signals to and from labs and row and column ioes. these column resources include: lut chain interconnects within an lab register chain interconnects within an lab c4 interconnects traversing a distance of four labs in an up and down direction max v devices include an enhanced interconnect structure within labs for routing le output to le input connections faster using lut chain connections and register chain connections. the lut chain connection allows the combinational output of an le to directly drive the fast input of the le right below it, bypassing the local interconnect. these resources can be used as a high-speed connection for wide fan-in functions from le 1 to le 10 in the same lab. the register chain connection allows the register output of one le to connect directly to the register input of the next le in the lab for fast shift registers. the quartus ii compiler automatically takes advantage of these resources to improve utilization and performance. figure 2?11 shows the lut chain and register chain interconnects. figure 2?10. r4 interconnect connections notes to figure 2?10 : (1) c4 interconnects can drive r4 interconnects. (2) this pattern is repeated for every lab in the lab row. primar y lab (2) r4 inter connect driving left adjacent lab can drive onto another lab? s r4 inter connect c4 column inter connects (1) r4 inter connect driving right lab neighbor lab neighbor
2?16 chapter 2: max v architecture multitrack interconnect max v device handbook december 2010 altera corporation the c4 interconnects span four labs up or down from a source lab. every lab has its own set of c4 interconnects to drive either up or down. figure 2?12 shows the c4 interconnect connections from an lab in a column. the c4 interconnects can drive and be driven by column and row ioes. for lab interconnection, a primary lab or its vertical lab neighbor can drive a given c4 interconnect. c4 interconnects can drive each other to extend their range as well as drive row interconnects for column-to-column connections. figure 2?11. lut chain and register chain interconnects le0 le1 le2 le3 le4 le5 le6 le7 le8 le9 lut chain routing to adjacent le local interconnect register chain routing to adjacent le's register input local interconnect routing among les in the lab
chapter 2: max v architecture 2?17 multitrack interconnect december 2010 altera corporation max v device handbook figure 2?12. c4 interconnect connections (note 1) note to figure 2?12 : (1) each c4 interconnect can drive either up or down four rows. c4 interconnect drives local and r4 interconnects up to four rows adjacent lab can dri v e onto neighboring lab's c4 interconnect c4 interconnect driving up c4 interconnect driving down lab row interconnect local interconnect
2?18 chapter 2: max v architecture multitrack interconnect max v device handbook december 2010 altera corporation the ufm block communicates with the logic array similar to lab-to-lab interfaces. the ufm block connects to row and column interconnects and has local interconnect regions driven by row and column interconnects. this block also has directlink interconnects for fast connections to and from a neighboring lab. for more information about the ufm interface to the logic array, refer too ?user flash memory block? on page 2?21 . table 2?2 lists the max v device routing scheme. table 2?2. routing scheme for max v devices source destination lut chain register chain local (1) directlink (1) r4 (1) c4 (1) le ufm block column ioe row ioe fast i/o (1) lut chain ? ? ? ? ? ? v ???? register chain ? ? ? ? ? ? v ???? local interconnect ?? ? ? ?? vv vv ? directlink interconnect ?? v ? ? ??? ??? r4 interconnect ? ? v ? vv ?? ??? c4 interconnect ? ? v ? vv ?? ??? le vv v v vv ?? vvv ufm block ? ? vv vv ?? ??? column ioe ? ? ? ? ? v ?? ??? row ioe ? ? ? vvv ?? ??? note to tab l e 2 ?2 : (1) these categories are interconnects.
chapter 2: max v architecture 2?19 global signals december 2010 altera corporation max v device handbook global signals each max v device has four dual-purpose dedicated clock pins ( gclk[3..0] , two pins on the left side and two pins on the ri ght side) that drive the global clock network for clocking, as shown in figure 2?13 . these four pins can also be used as gpios if they are not used to drive the global clock network. the four global clock lines in the global clock network drive throughout the entire device. the global clock network can provide clocks for all resources within the device including les, lab local interconnect, ioes, and the ufm block. the global clock lines can also be used for global control signals, such as clock enables, synchronous or asynchronous clears, presets, output enables, or protocol control signals such as trdy and irdy for the pci i/o standard. internal logic can drive the global clock network for internally-generated global clocks and control signals. figure 2?13 shows the various sources that drive the global clock network. the global clock network drives to individual lab column signals, lab column clocks [3..0] , that span an entire lab column from the top to the bottom of the device. unused global clocks or control signals in an lab column are turned off at the lab column clock buffers shown in figure 2?14 . the lab column clocks [3..0] are multiplexed down to two lab clock signals and one lab clear signal. other control signal types route from the global clock network into the lab local interconnect. for more information, refer to ?lab control signals? on page 2?6 . figure 2?13. global clock generation note to figure 2?13 : (1) any i/o pin can use a multitrack interconnect to route as a logic array-generated global clock signal. 4 4 gclk0 global clock netw ork gclk1 gclk2 gclk3 logic array (1)
2?20 chapter 2: max v architecture global signals max v device handbook december 2010 altera corporation figure 2?14. global clock network (note 1) notes to figure 2?14 : (1) lab column clocks in i/o block regions provide high fan-out output enable signals. (2) lab column clocks drive to the ufm block. ufm block (2) cfm block i/o block region i/o block region i/o block region lab col u mn clock[3..0] lab col u mn clock[3..0] 4 4 4 4 4 4 4 4
chapter 2: max v architecture 2?21 user flash memory block december 2010 altera corporation max v device handbook user flash memory block max v devices feature a single ufm block, which can be used like a serial eeprom for storing non-volatile information up to 8,192 bits. the ufm block connects to the logic array through the multitrack interconnect, allowing any le to interface to the ufm block. figure 2?15 shows the ufm block and interface signals. the logic array is used to create customer interface or protocol logic to interface the ufm block data outside of the device. the ufm block offers the following features: non-volatile storage up to 16-bit wide and 8,192 total bits two sectors for partitioned sector erase built-in internal oscillator that optionally drives logic array program, erase, and busy signals auto-increment addressing serial interface to logic array with programmable interface figure 2?15. ufm block and interface signals osc 4 program erase control ufm sector 1 ufm sector 0 : _ address register program erase osc_ena rtp_busy busy osc data register ufm block drdin drdout arclk arshft ardin drclk drshft 16 16 9
2?22 chapter 2: max v architecture user flash memory block max v device handbook december 2010 altera corporation ufm storage each device stores up to 8,192 bits of data in the ufm block. table 2?3 lists the data size, sector, and address sizes for the ufm block. there are 512 locations with 9-bit addressing ranging from 000h to 1ffh . the sector 0 address space is 000h to 0ffh and the sector 1 address space is from 100h to 1ffh . the data width is up to 16 bits of data. the quartus ii software automatically creates logic to accommodate smaller read or program data widths. erasure of the ufm involves individual sector erasing (that is, one erase of sector 0 and one erase of sector 1 is required to erase the entire ufm block). because sector erase is required before a program or write operation, having two sectors enables a sector size of data to be left untouched while the other sector is erased and programmed with new data. internal oscillator as shown in figure 2?15 , the dedicated circuitry within the ufm block contains an oscillator. the dedicated circuitry uses this oscillator internally for its read and program operations. this oscillator's divide by 4 output can drive out of the ufm block as a logic interface clock source or for general-purpose logic clocking. the typical osc output signal frequency ranges from 3.9 to 5.3 mhz, and its exact frequency of operation is not programmable. the ufm internal oscillator can be instantiated using the megawizard ? plug-in manager. you can also use the max ii/max v oscillator megafunction to instantiate the ufm oscillator without using the ufm memory block. table 2?3. ufm array size device total bits sectors address bits data width 5m40z 8,192 2 (4,096 bits per sector) 9 16 5m80z 8,192 2 (4,096 bits per sector) 9 16 5m160z 8,192 2 (4,096 bits per sector) 9 16 5m240z 8,192 2 (4,096 bits per sector) 9 16 5m570z 8,192 2 (4,096 bits per sector) 9 16 5m1270z 8,192 2 (4,096 bits per sector) 9 16 5m2210z 8,192 2 (4,096 bits per sector) 9 16
chapter 2: max v architecture 2?23 user flash memory block december 2010 altera corporation max v device handbook program, erase, and busy signals the ufm block?s dedicated circuitry automatically generates the necessary internal program and erase algorithm after the program or erase input signals have been asserted. the program or erase signal must be asserted until the busy signal deasserts, indicating the ufm internal program or erase operation has completed. the ufm block also supports jtag as the interface for programming and reading. f for more information about programming and erasing the ufm block, refer to the user flash memory in max v devices chapter. auto-increment addressing the ufm block supports standard read or stream read operations. the stream read is supported with an auto-increment address feature. deasserting the arshift signal while clocking the arclk signal increments the address register value to read consecutive locations from the ufm array. serial interface the ufm block supports a serial interface with serial address and data signals. the internal shift registers within the ufm block for address and data are 9 bits and 16 bits wide, respectively. the quartus ii software automatically generates interface logic in les for a parallel address and data interface to the ufm block. other standard protocol interfaces such as spi are also automatically generated in le logic by the quartus ii software. f for more information about the ufm interface signals and the quartus ii le-based alternate interfaces, refer to the user flash memory in max v devices chapter.
2?24 chapter 2: max v architecture user flash memory block max v device handbook december 2010 altera corporation ufm block to logic array interface the ufm block is a small partition of the flash memory that contains the cfm block, as shown in figure 2?1 and figure 2?2 . the ufm block for the 5m40z, 5m80z, 5m160z, and 5m240z devices is located on the left side of the device adjacent to the left most lab column. the ufm blocks for the 5m570z, 5m1270z, and 5m2210z devices are located at the bottom left of the device. the ufm input and output signals interface to all types of interconnects (r4 interconnect, c4 interconnect, and directlink interconnect to/from adjacent lab rows). the ufm signals can also be driven from global clocks, gclk[3..0] . the interface regions for the 5m40z, 5m80z, 5m160z, and 5m240z devices are shown in figure 2?16 . the interface regions for 5m570z, 5m1270z, and 5m2210z devices are shown in figure 2?17 . figure 2?16. 5m40z, 5m80z, 5m160z, and 5m240z ufm block lab row interface (note 1) , (2) notes to figure 2?16 : (1) the ufm block inputs and outputs can drive to and from all types of interconnects, not only directlink interconnects from adjacent row labs. (2) not applicable to the t144 package of the 5m240z device. ufm block cfm block program erase osc_ena drdin drclk drshft arin arclk arshft drdout osc busy rtp_busy lab lab lab
chapter 2: max v architecture 2?25 core voltage december 2010 altera corporation max v device handbook core voltage the max v architecture supports a 1.8-v core voltage on the v ccint supply. you must use a 1.8-v v cc external supply to power the vccint pins. figure 2?17. 5m240z, 5m570z, 5m1270z, and 5m2210z ufm block lab row interface (note 1) note to figure 2?17 : (1) only applicable to the t144 package of the 5m240z device. rtp_busy busy osc drdout drdin program erase osc_ena arclk arshft drdclk drdshft ardin ufm block cfm block lab lab lab figure 2?18. core voltage feature in max v devices max v device 1.8-v on vccint pins 1.8-v core voltage
2?26 chapter 2: max v architecture i/o structure max v device handbook december 2010 altera corporation i/o structure ioes support many features, including: lvttl, lvcmos, lvds, and rsds i/o standards 3.3-v, 32-bit, 33-mhz pci compliance jtag boundary-scan test (bst) support programmable drive strength control weak pull-up resistors during power-up and in system programming slew-rate control tri-state buffers with individual output enable control bus-hold circuitry programmable pull-up resistors in user mode unique output enable per pin open-drain outputs schmitt trigger inputs fast i/o connection programmable input delay max v device ioes contain a bidirectional i/o buffer. figure 2?19 shows the max v ioe structure. registers from adjacent labs can drive to or be driven from the ioe?s bidirectional i/o buffers. the quartus ii software automatically attempts to place registers in the adjacent lab with fast i/o connection to achieve the fastest possible clock-to-output and registered output enable timing. when the fast input registers option is enabled, the quartus ii software automatically routes the register to guarantee zero hold time. you can set timing assignments in the quartus ii software to achieve desired i/o timing.
chapter 2: max v architecture 2?27 i/o structure december 2010 altera corporation max v device handbook fast i/o connection a dedicated fast i/o connection from the adjacent lab to the ioes within an i/o block provides faster output delays for clock-to-output and t pd propagation delays. this connection exists for data output signals, not output enable signals or input signals. figure 2?20 , figure 2?21 , and figure 2?22 illustrate the fast i/o connection. figure 2?19. ioe structure for max v devices notes to figure 2?19 : (1) available only in i/o bank 3 of 5m1270z and 5m2210z devices. (2) the programmable pull-up resistor is active during power-up, in-system programming (isp), and if the device is unprogrammed. data_in optional schmitt t rigger input drive strength control open-drain output slew control fast_o ut data_out oe optional pci clamp (1) programmable pull-up (2) v ccio v ccio i/o pin optional bus-hold cir cuit dev_oe programmable input delay
2?28 chapter 2: max v architecture i/o structure max v device handbook december 2010 altera corporation i/o blocks the ioes are located in i/o blocks around the periphery of the max v device. there are up to seven ioes per row i/o block and up to four ioes per column i/o block. each column or row i/o block interfaces with its adjacent lab and multitrack interconnect to distribute signals throughout the device. the row i/o blocks drive row, column, or directlink interconnects. the column i/o blocks drive column interconnects. 1 5m40z, 5m80z, 5m160z, and 5m240z devices have a maximum of five ioes per row i/o block. figure 2?20 shows how a row i/o block connects to the logic array. figure 2?20. row i/o block connection to the interconnect (note 1) note to figure 2?20 : (1) each of the seven ioes in the row i/o block can have one data_out or fast_out output, one oe output, and one data_in input. 7 r4 interconnects c4 interconnects i/o block local interconnect data_in[6..0] data_out [6..0] 7 oe [6..0] 7 7 fast_out [6..0] row i/o block contains up to seven ioes direct link interconnect to adjacent lab direct link interconnect from adjacent lab lab column clock [3..0] lab local interconnect lab ro w i/o block
chapter 2: max v architecture 2?29 i/o structure december 2010 altera corporation max v device handbook figure 2?21 shows how a column i/o block connects to the logic array. i/o standards and banks table 2?4 lists the i/o standards supported by max v devices. figure 2?21. column i/o block connection to the interconnect (note 1) note to figure 2?21 : (1) each of the four ioes in the column i/o block can have one data_out or fast_out output, one oe output, and one data_in input. column i/o block contains up to 4 ioes i/o block local interconnect r4 interconnects lab local interconnect c4 interconnects lab local interconnect c4 interconnects 4 lab lab lab data_out [3..0] 4 oe [3..0] 4 fast_out [3..0] fast i/o interconnect path 4 data_in [3..0] column i/o block lab local interconnect lab column clock [3..0] table 2?4. max v i/o standards (part 1 of 2) i/o standard type output supply voltage (v ccio ) (v) 3.3-v lvttl/lvcmos single-ended 3.3 2.5-v lvttl/lvcmos single-ended 2.5 1.8-v lvttl/lvcmos single-ended 1.8 1.5-v lvcmos single-ended 1.5 1.2-v lvcmos single-ended 1.2
2?30 chapter 2: max v architecture i/o structure max v device handbook december 2010 altera corporation the 5m40z, 5m80z, 5m160z, 5m240z, and 5m570z devices support two i/o banks, as shown in figure 2?22 . each of these banks support all the lvttl, lvcmos, lvds, and rsds standards shown in table 2?4 . pci compliant i/o is not supported in these devices and banks. 3.3-v pci (1) single-ended 3.3 lvds (2) differential 2.5 rsds (3) differential 2.5 notes to ta bl e 2? 4 : (1) the 3.3-v pci compliant i/o is supported in bank 3 of the 5m1270z and 5m2210z devices. (2) max v devices only support emulated lvds output using a three resistor network (lvds_e_3r). (3) max v devices only support emulated rsds output using a three resistor network (rsds_e_3r). figure 2?22. i/o banks for 5m40z, 5m80z, 5m160z, 5m240z, and 5m570z devices (note 1) , (2) notes to figure 2?22 : (1) figure 2?22 is a top view of the silicon die. (2) figure 2?22 is a graphical representation only. refer to the pin list and the quartus ii software for exact pin locations. (3) this i/o standard is not supported in bank 1. (4) emulated lvds output using a three resistor network (lvds_e_3r). (5) emulated rsds output using a three resistor network (rsds_e_3r). table 2?4. max v i/o standards (part 2 of 2) i/o standard type output supply voltage (v ccio ) (v) all i/o banks support 3.3-v lvttl/lvcmo s, 2.5-v lvttl/lvcmo s, 1.8-v lvttl/lvcmo s, 1.5-v lvcmo s, 1.2-v lvd s (4) rsds (5) , lvcmo s (3), i/o bank 2 i/o bank 1
chapter 2: max v architecture 2?31 i/o structure december 2010 altera corporation max v device handbook the 5m1270z and 5m2210z devices support four i/o banks, as shown in figure 2?23 . each of these banks support all of the lvttl, lvcmos, lvds, and rsds standards shown in table 2?4 . pci compliant i/o is supported in bank 3. bank 3 supports the pci clamping diode on inputs and pci drive compliance on outputs. you must use bank 3 for designs requiring pci compliant i/o pins. the quartus ii software automatically places i/o pins in this bank if assigned with the pci i/o standard. each i/o bank has dedicated v ccio pins that determine the voltage standard support in that bank. a single device can support 1.2-v, 1.5-v, 1.8-v, 2.5-v, and 3.3-v interfaces; each individual bank can support a different standard. each i/o bank can support multiple standards with the same v ccio for input and output pins. for example, when v ccio is 3.3 v, bank 3 can support lvttl, lvcmos, and 3.3-v pci. v ccio powers both the input and output buffers in max v devices. the jtag pins for max v devices are dedicated pins that cannot be used as regular i/o pins. the pins tms , tdi , tdo , and tck support all the i/o standards shown in table 2?4 on page 2?29 except for pci and 1.2-v lvcmos. these pins reside in bank 1 for all max v devices and their i/o standard support is controlled by the v ccio setting for bank 1. figure 2?23. i/o banks for 5m1270z and 5m2210z devices (note 1) , (2) notes to figure 2?23 : (1) figure 2?23 is a top view of the silicon die. (2) figure 2?23 is a graphical representation only. refer to the pin list and the quartus ii software for exact pin locations. (3) this i/o standard is not supported in bank 1. (4) emulated lvds output using a three resistor network (lvds_e_3r). (5) emulated rsds output using a three resistor network (rsds_e_3r). i/o bank 2 i/o bank 3 i/o bank 4 i/o bank 1 also supports the 3.3-v pci i/o standard all i/o banks support 3.3-v lvttl/lvcmo s, 2.5-v lvttl/lvcmo s, 1.8-v lvttl/lvcmo s, 1.5-v lvcmo s, 1.2-v lvcmo s (3), lvd s (4), rsds (5)
2?32 chapter 2: max v architecture i/o structure max v device handbook december 2010 altera corporation pci compliance the max v 5m1270z and 5m2210z devices are compliant with pci applications as well as all 3.3-v electrical specifications in the pci local bus specification revision 2.2 . these devices are also large enough to support pci intellectual property (ip) cores. table 2?5 shows the max v device speed grades that meet the pci timing specifications. lvds and rsds channels the max v device supports emulated lvds and rsds outputs on both row and column i/o banks. you can configure the rows and columns as emulated lvds or rsds output buffers that use two single-ended output buffers with three external resistor networks. schmitt trigger the input buffer for each max v device i/o pin has an optional schmitt trigger setting for the 3.3-v and 2.5-v standards. the schmitt trigger allows input buffers to respond to slow input edge rates with a fast output edge rate. most importantly, schmitt triggers provide hysteresis on the input buffer, preventing slow-rising noisy input signals from ringing or oscillating on the input signal driven into the logic array. this provides system noise tolerance on max v inputs, but adds a small, nominal input delay. the jtag input pins ( tms , tck , and tdi ) have schmitt trigger buffers that are always enabled. 1 the tck input is susceptible to high pulse glitches when the input signal fall time is greater than 200 ns for all i/o standards. table 2?5. 3.3-v pci electrical specifications and pci timing support for max v devices device 33-mhz pci 5m1270z all speed grades 5m2210z all speed grades table 2?6. lvds and rsds channels supported in max v devices (note 1) device 64 mbga 64 eqfp 68 mbga 100 tqfp 100 mbga 144 tqfp 256 fbga 324 fbga 5m40z 10 etx 20 etx ? ? ? ? ? ? 5m80z 10 etx 20 etx 20 etx 33 etx ? ? ? ? 5m160z ? 20 etx 20 etx 33 etx 33 etx ? ? ? 5m240z ? ? 20 etx 33 etx 33 etx 49 etx ? ? 5m570z ? ? ? 28 etx 28 etx 49 etx 75 etx ? 5m1270z ? ? ? ? ? 42 etx 90 etx 115 etx 5m2210z ? ? ? ? ? ? 83 etx 115 etx note to tab l e 2 ?6 : (1) etx = emulated lvds output buffers (lvds_e_3r) or emulated rsds output buffers (rsds_e_3r).
chapter 2: max v architecture 2?33 i/o structure december 2010 altera corporation max v device handbook output enable signals each max v ioe output buffer supports output enable signals for tri-state control. the output enable signal can originate from the gclk[3..0] global signals or from the multitrack interconnect. the multitrack interconnect routes output enable signals and allows for a unique output enable for each output or bidirectional pin. max v devices also provide a chip-wide output enable pin ( dev_oe ) to control the output enable for every output pin in the design. an option set before compilation in the quartus ii software controls this pin. this chip-wide output enable uses its own routing resources and does not use any of the four global resources. if this option is turned on, all outputs on the chip operate normally when dev_oe is asserted. when the pin is deasserted, all outputs are tri-stated. if this option is turned off, the dev_oe pin is disabled when the device operates in user mode and is available as a user i/o pin. programmable drive strength the output buffer for each max v device i/o pin has two levels of programmable drive strength control for each of the lvttl and lvcmos i/o standards. programmable drive strength provides system noise reduction control for high performance i/o designs. although a separate slew-rate control feature exists, using the lower drive strength setting provides signal slew-rate control to reduce system noise and signal overshoot without the large delay adder associated with the slew-rate control feature. table 2?7 lists the possible settings for the i/o standards with drive strength control. the quartus ii software uses the maximum current strength as the default setting. the pci i/o standard is always set at 20 ma with no alternate setting. 1 the programmable drive strength feature can be used simultaneously with the slew-rate control feature. table 2?7. programmable drive strength (note 1) i/o standard ioh/iol current strength setting (ma) 3.3-v lvttl 16 8 3.3-v lvcmos 8 4 2.5-v lvttl/lvcmos 14 7 1.8-v lvttl/lvcmos 6 3 1.5-v lvcmos 4 2 1.2-v lvcmos 3 note to tab l e 2 ?7 : (1) the i oh current strength numbers shown are for a condition of a v out = v oh minimum, where the v oh minimum is specified by the i/o standard. the i ol current strength numbers shown are for a condition of a v out = v ol maximum, where the v ol maximum is specified by the i/o standard. for 2.5-v lvttl/lvcmos, the i oh condition is v out = 1.7 v and the i ol condition is v out = 0.7 v.
2?34 chapter 2: max v architecture i/o structure max v device handbook december 2010 altera corporation slew-rate control the output buffer for each max v device i/o pin has a programmable output slew-rate control that can be configured for low noise or high-speed performance. a faster slew rate provides high-speed transitions for high-performance systems. however, these fast transitions may introduce noise transients into the system. a slow slew rate reduces system noise, but adds a nominal output delay to rising and falling edges. the lower the voltage standard (for example, 1.8-v lvttl) the larger the output delay when slow slew is enabled. each i/o pin has an individual slew-rate control, allowing you to specify the slew rate on a pin-by-pin basis. the slew-rate control affects both the rising and falling edges. if no slew-rate control is specified, the quartus ii software defaults to a fast slew rate. 1 the slew-rate control feature can be used simultaneously with the programmable drive strength feature. open-drain output max v devices provide an optional open-drain (equivalent to open-collector) output for each i/o pin. this open-drain output enables the device to provide system-level control signals (for example, interrupt and write enable signals) that can be asserted by any of several devices. this output can also provide an additional wired-or plane. programmable ground pins each unused i/o pin on max v devices can be used as an additional ground pin. this programmable ground feature does not require the use of the associated les in the device. in the quartus ii software, unused pins can be set as programmable gnd on a global default basis or they can be individually assigned. unused pins also have the option of being set as tri-stated input pins. bus-hold each max v device i/o pin provides an optional bus-hold feature. the bus-hold circuitry can hold the signal on an i/o pin at its last-driven state. because the bus- hold feature holds the last-driven state of the pin until the next input signal is present, an external pull-up or pull-down resistor is not necessary to hold a signal level when the bus is tri-stated. the bus-hold circuitry also pulls un-driven pins away from the input threshold voltage where noise can cause unintended high-frequency switching. you can select this feature individually for each i/o pin. the bus-hold output will drive no higher than v ccio to prevent overdriving signals. if the bus-hold feature is enabled, the device cannot use the programmable pull-up option. the bus-hold circuitry is only active after the device has fully initialized. the bus-hold circuit captures the value on the pin present at the moment user mode is entered.
chapter 2: max v architecture 2?35 i/o structure december 2010 altera corporation max v device handbook programmable pull-up resistor each max v device i/o pin provides an optional programmable pull-up resistor during user mode. if you enable this feature for an i/o pin, the pull-up resistor holds the output to the v ccio level of the output pin?s bank. 1 the programmable pull-up resistor feature should not be used at the same time as the bus-hold feature on a given i/o pin. 1 the programmable pull-up resistor is active during power-up, isp, and if the device is unprogrammed. programmable input delay the max v ioe includes a programmable input delay that is activated to ensure zero hold times. a path where a pin directly drives a register, with minimal routing between the two, may require the delay to ensure zero hold time. however, a path where a pin drives a register through long routing or through combinational logic may not require the delay to achieve a zero hold time. the quartus ii software uses this delay to ensure zero hold times when needed. multivolt i/o interface the max v architecture supports the multivolt i/o interface feature, which allows max v devices in all packages to interface with systems of different supply voltages. the devices have one set of vcc pins for internal operation (v ccint ), and up to four sets for input buffers and i/o output driver buffers (v ccio ), depending on the number of i/o banks available in the devices where each set of vccio pins powers one i/o bank. the 5m40z, 5m80z, 5m160z, 5m240z, and 5m570z devices each have two i/o banks while the 5m1270z and 5m2210z devices each have four i/o banks. connect vccio pins to either a 1.2-, 1.5-, 1.8-, 2.5-, or 3.3-v power supply, depending on the output requirements. the output levels are compatible with systems of the same voltage as the power supply (that is, when vccio pins are connected to a 1.5-v power supply, the output levels are compatible with 1.5-v systems). when vccio pins are connected to a 3.3-v power supply, the output high is 3.3 v and is compatible with 3.3-v or 5.0-v systems. table 2?8 summarizes max v multivolt i/o support. table 2?8. multivolt i/o support in max v devices (part 1 of 2) (note 1) vccio (v) input signal output signal 1.2 v 1.5 v 1.8 v 2.5 v 3.3 v 5.0 v 1.2 v 1.5 v 1.8 v 2.5 v 3.3 v 5.0 v 1.2 v ????? v ????? 1.5 ? vvvv ? vv ???? 1.8 ? vvvv ? v (2) v (2) v ??? 2.5 ??? vv ? v (3) v (3) v (3) v ??
2?36 chapter 2: max v architecture document revision history max v device handbook december 2010 altera corporation document revision history table 2?9 lists the revision history for this chapter. 3.3 ??? v (4) vv (5) v (6) v (6) v (6) v (6) vv (7) notes to ta bl e 2? 8 : (1) to drive inputs higher than v ccio but less than 4.0 v including the overshoot, disable the i/o clamp diode. however, to drive 5.0-v signals to the device, enable the i/o clamp diode to prevent v i from rising above 4.0 v. use an external diode if the i/o pin does not support the clamp diode. (2) when v ccio = 1.8 v, a max v device can drive a 1.2-v or 1.5-v device with 1.8-v tolerant inputs. (3) when v ccio = 2.5 v, a max v device can drive a 1.2-v, 1.5-v, or 1.8-v device with 2.5-v tolerant inputs. (4) when v ccio = 3.3 v and a 2.5-v input signal feeds an input pin, the vccio s upply current will be slightly larger than expected. (5) max v devices can be 5.0-v tolerant with the use of an external resistor and the internal i/o clamp diode on the 5m1270z and 5m2210z devices. use an external clamp diode if the internal clamp diode is not available. (6) when v ccio = 3.3 v, a max v device can drive a 1.2-v, 1.5-v, 1.8-v, or 2.5-v device with 3.3-v tolerant inputs. (7) when v ccio = 3.3 v, a max v device can drive a device with 5.0-v ttl inputs but not 5.0-v cmos inputs. for 5.0-v cmos, open-drain setting with internal i/o clamp diode (available only on 5m1270z and 5m2210z devices) and external resistor is required. use an externa l clamp diode if the internal clamp diode is not available. table 2?8. multivolt i/o support in max v devices (part 2 of 2) (note 1) vccio (v) input signal output signal 1.2 v 1.5 v 1.8 v 2.5 v 3.3 v 5.0 v 1.2 v 1.5 v 1.8 v 2.5 v 3.3 v 5.0 v table 2?9. document revision history date version changes december 2010 1.0 initial release.
max v device handbook may 2011 mv51003-1.2 subscribe ? 2011 altera corporation. all rights reserved. altera, arria, cyclone, hardcopy, max, megacore, nios, quartus and stratix are reg. u.s. pat. & tm. off. and/or trademarks of altera corporation in the u.s. and other countries. all other trademarks and service marks are the propert y of their respective holders as described at www.altera.com/common/legal.html . altera warrants performance of its semiconductor products to current specifications in accordance with altera?s standard warr anty, but reserves the right to make changes to any products and services at any time without notice. altera assumes no responsibility or liability arising out of the application or use of any information, product, or service described herein except as expressly agreed to in writing by altera. altera customers are advi sed to obtain the latest version of device specifications before relying on any published information and before placing orders for products or services. 3. dc and switching characteristics for max v devices this chapter covers the electrical and switching characteristics for max ? v devices. electrical characteristics include operating conditions and power consumptions. this chapter also describes the timing model and specifications. you must consider the recommended dc and switching conditions described in this chapter to maintain the highest possible performance and reliability of the max v devices. this chapter contains the following sections: ?operating conditions? on page 3?1 ?power consumption? on page 3?10 ?timing model and specifications? on page 3?10 operating conditions ta b l e 3 ?1 through table 3?15 on page 3?9 list information about absolute maximum ratings, recommended operating conditions, dc electrical characteristics, and other specifications for max v devices. absolute maximum ratings ta b l e 3 ?1 lists the absolute maximum ratings for the max v device family. table 3?1. absolute maximum ratings for max v devices (note 1) , (2) symbol parameter conditions minimum maximum unit v ccint internal supply voltage with respect to ground ?0.5 2.4 v v ccio i/o supply voltage ? ?0.5 4.6 v v i dc input voltage ? ?0.5 4.6 v i out dc output current, per pin ? ?25 25 ma t stg storage temperature no bias ?65 150 c t amb ambient temperature under bias (3) ?65 135 c t j junction temperature tqfp and bga packages under bias ? 135 c notes to table 3?1 : (1) for more information, refer to the operating requirements for altera devices data s heet . (2) conditions beyond those listed in table 3?1 may cause permanent damage to a device. additionally, device operation at the absolute maximum ratings for extended periods of time may have adverse affects on the device. (3) for more information about ?under bias? conditions, refer to table 3?2 . may 2011 mv51003-1.2
3?2 chapter 3: dc and switching characteristics for max v devices operating conditions max v device handbook may 2011 altera corporation recommended operating conditions ta b l e 3 ?2 lists recommended operating conditions for the max v device family. table 3?2. recommended operating conditions for max v devices symbol parameter conditions minimum maximum unit v ccint (1) 1.8-v supply voltage for internal logic and in-system programming (isp) max v devices 1.71 1.89 v v ccio (1) supply voltage for i/o buffers, 3.3-v operation ? 3.00 3.60 v supply voltage for i/o buffers, 2.5-v operation ? 2.375 2.625 v supply voltage for i/o buffers, 1.8-v operation ? 1.71 1.89 v supply voltage for i/o buffers, 1.5-v operation ? 1.425 1.575 v supply voltage for i/o buffers, 1.2-v operation ? 1.14 1.26 v v i input voltage (2) , (3) , (4) ?0.5 4.0 v v o output voltage ? 0 v ccio v t j operating junction temperature commercial range 0 85 c industrial range ?40 100 c extended range (5) ?40 125 c notes to table 3?2 : (1) max v device isp and/or user flash memory (ufm) programming using jtag or logic array is not guaranteed outside the recommend ed operating conditions (for example, if brown-out occurs in the system during a potential write/program sequence to the ufm, alte ra recommends that you read back the ufm contents and verify it against the intended write data). (2) the minimum dc input is ?0.5 v. during transitions, the inputs may undershoot to ?2.0 v for input currents less than 100 ma and periods shorter than 20 ns. (3) during transitions, the inputs may overshoot to the voltages shown below based on the input duty cycle. the dc case is equiv alent to 100% duty cycle. for more information about 5.0-v tolerance, refer to the using max v devices in multi-voltage s ystems chapter. v in max. duty cycle 4.0 v 100% (dc) 4.1 v 90% 4.2 v 50% 4.3 v 30% 4.4 v 17% 4.5 v 10% (4) all pins, including the clock, i/o, and jtag pins, may be driven before v ccint and v ccio are powered. (5) for the extended temperature range of 100 to 125c, max v ufm programming (erase/write) is only supported using the jtag inte rface. ufm programming using the logic array interface is not guaranteed in this range.
chapter 3: dc and switching characteristics for max v devices 3?3 operating conditions may 2011 altera corporation max v device handbook programming/erasure specifications ta b l e 3 ?3 lists the programming/erasure specifications for the max v device family. dc electrical characteristics ta b l e 3 ?4 lists dc electrical characteristics for the max v device family. table 3?3. programming/erasure specifications for max v devices parameter block minimum typical maximum unit erase and reprogram cycles ufm ? ? 1000 (1) cycles configuration flash memory (cfm) ? ? 100 cycles note to table 3?3 : (1) this value applies to the commercial grade devices. for the industrial grade devices, the value is 100 cycles. table 3?4. dc electrical characteristics for max v devices (note 1) (part 1 of 2) symbol parameter conditions minimum typical maximum unit i i input pin leakage current v i = v ccio max to 0 v (2) ?10 ? 10 a i oz tri-stated i/o pin leakage current v o = v ccio max to 0 v (2) ?10 ? 10 a i ccstandby v ccint supply current (standby) (3) 5m40z, 5m80z, 5m160z, and 5m240z (commercial grade) (4) , (5) ?2590a 5m240z (commercial grade) (6) ?2796a 5m40z, 5m80z, 5m160z, and 5m240z (industrial grade) (5) , (7) ? 25 139 a 5m240z (industrial grade) (6) ? 27 152 a 5m570z (commercial grade) (4) ?2796a 5m570z (industrial grade) (7) ? 27 152 a 5m1270z and 5m2210z ? 2 ? ma v schmitt (8) hysteresis for schmitt trigger input (9) v ccio = 3.3 v ? 400 ? mv v ccio = 2.5 v ? 190 ? mv i ccpowerup v ccint supply current during power-up (10) max v devices ? ? 40 ma r pullup value of i/o pin pull-up resistor during user mode and isp v ccio = 3.3 v (11) 5?25k ? v ccio = 2.5 v (11) 10 ? 40 k ? v ccio = 1.8 v (11) 25 ? 60 k ? v ccio = 1.5 v (11) 45 ? 95 k ? v ccio = 1.2 v (11) 80 ? 130 k ?
3?4 chapter 3: dc and switching characteristics for max v devices operating conditions max v device handbook may 2011 altera corporation i pullup i/o pin pull-up resistor current when i/o is unprogrammed ? ? ? 300 a c io input capacitance for user i/o pin ???8pf c gclk input capacitance for dual-purpose gclk/user i/o pin ???8pf notes to table 3?4 : (1) typical values are for t a = 25c, v ccint = 1.8 v and v ccio = 1.2, 1.5, 1.8, 2.5, or 3.3 v. (2) this value is specified for normal device operation. the value may vary during power-up. this applies to all v ccio settings (3.3, 2.5, 1.8, 1.5, and 1.2 v). (3) v i = ground, no load, and no toggling inputs. (4) commercial temperature ranges from 0c to 85c with the maximum current at 85c. (5) not applicable to the t144 package of the 5m240z device. (6) only applicable to the t144 package of the 5m240z device. (7) industrial temperature ranges from ?40c to 100c with the maximum current at 100c. (8) this value applies to commercial and industrial range devices. for extended temperature range devices, the v schmitt typical value is 300 mv for v ccio = 3.3 v and 120 mv for v ccio = 2.5 v. (9) the tck input is susceptible to high pulse glitches when the input signal fall time is greater than 200 ns for all i/o standards. (10) this is a peak current value with a maximum duration of t config time. (11) pin pull-up resistance values will lower if an external source drives the pin higher than v ccio . table 3?4. dc electrical characteristics for max v devices (note 1) (part 2 of 2) symbol parameter conditions minimum typical maximum unit
chapter 3: dc and switching characteristics for max v devices 3?5 operating conditions may 2011 altera corporation max v device handbook output drive characteristics figure 3?1 shows the typical drive strength characteristics of max v devices. i/o standard specifications ta b l e 3 ?5 through table 3?13 on page 3?8 list the i/o standard specifications for the max v device family. figure 3?1. output drive characteristics of max v devices (note 1) notes to figure 3?1 : (1) the dc output current per pin is subject to the absolute maximum rating of table 3?1 on page 3?1 . (2) 1.2-v v ccio is only applicable to the maximum drive strength. 0 5 10 15 20 25 30 35 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 voltage (v) typical i o output current (ma) 3.3-v vccio 2.5-v vccio 1.8-v vccio 1.5-v vccio (minimum drive strength) max v output drive i oh characteristics 0 5 10 15 20 25 30 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 voltage (v) typical i o output current (ma) 3.3-v vccio 2.5-v vccio 1.8-v vccio 1.5-v vccio (minimum drive strength) max v output drive i ol characteristics 0 10 20 30 40 50 60 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 voltage (v) typical i o output current (ma) 3.3-v vccio 2.5-v vccio 1.8-v vccio 1.5-v vccio (maximum drive strength) max v output drive i ol characteristics 1.2-v vccio (2) max v output drive i oh characteristics (maximum drive strength) 0 10 20 30 40 50 60 70 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 voltage (v) typical i o output current (ma) 3.3-v vccio 2.5-v vccio 1.8-v vccio 1.5-v vccio 1.2-v vccio (2) table 3?5. 3.3-v lvttl specifications for max v devices symbol parameter conditions minimum maximum unit v ccio i/o supply voltage ? 3.0 3.6 v v ih high-level input voltage ? 1.7 4.0 v v il low-level input voltage ? ?0.5 0.8 v v oh high-level output voltage ioh = ?4 ma (1) 2.4 ? v v ol low-level output voltage iol = 4 ma (1) ?0.45v note to table 3?5 : (1) this specification is supported across all the programmable drive strength settings available for this i/o standard, as show n in the max v device architecture chapter.
3?6 chapter 3: dc and switching characteristics for max v devices operating conditions max v device handbook may 2011 altera corporation table 3?6. 3.3-v lvcmos specifications for max v devices symbol parameter conditions minimum maximum unit v ccio i/o supply voltage ? 3.0 3.6 v v ih high-level input voltage ? 1.7 4.0 v v il low-level input voltage ? ?0.5 0.8 v v oh high-level output voltage v ccio = 3.0, ioh = ?0.1 ma (1) v ccio ? 0.2 ? v v ol low-level output voltage v ccio = 3.0, iol = 0.1 ma (1) ?0.2v note to table 3?6 : (1) this specification is supported across all the programmable drive strength settings available for this i/o standard, as show n in the max v device architecture chapter. table 3?7. 2.5-v i/o specifications for max v devices symbol parameter conditions minimum maximum unit v ccio i/o supply voltage ? 2.375 2.625 v v ih high-level input voltage ? 1.7 4.0 v v il low-level input voltage ? ?0.5 0.7 v v oh high-level output voltage ioh = ?0.1 ma (1) 2.1 ? v ioh = ?1 ma (1) 2.0 ? v ioh = ?2 ma (1) 1.7 ? v v ol low-level output voltage iol = 0.1 ma (1) ?0.2v iol = 1 ma (1) ?0.4v iol = 2 ma (1) ?0.7v note to table 3?7 : (1) this specification is supported across all the programmable drive strength settings available for this i/o standard, as show n in the max v device architecture chapter. table 3?8. 1.8-v i/o specifications for max v devices symbol parameter conditions minimum maximum unit v ccio i/o supply voltage ? 1.71 1.89 v v ih high-level input voltage ? 0.65 v ccio 2.25 (2) v v il low-level input voltage ? ?0.3 0.35 v ccio v v oh high-level output voltage ioh = ?2 ma (1) v ccio ? 0.45 ? v v ol low-level output voltage iol = 2 ma (1) ?0.45v notes to table 3?8 : (1) this specification is supported across all the programmable drive strength settings available for this i/o standard, as show n in the max v device architecture chapter. (2) this maximum v ih reflects the jedec specification. the max v input buffer can tolerate a v ih maximum of 4.0, as specified by the v i parameter in table 3?2 on page 3?2 .
chapter 3: dc and switching characteristics for max v devices 3?7 operating conditions may 2011 altera corporation max v device handbook table 3?9. 1.5-v i/o specifications for max v devices symbol parameter conditions minimum maximum unit v ccio i/o supply voltage ? 1.425 1.575 v v ih high-level input voltage ? 0.65 v ccio v ccio + 0.3 (2) v v il low-level input voltage ? ?0.3 0.35 v ccio v v oh high-level output voltage ioh = ?2 ma (1) 0.75 v ccio ?v v ol low-level output voltage iol = 2 ma (1) ?0.25 v ccio v notes to table 3?9 : (1) this specification is supported across all the programmable drive strength settings available for this i/o standard, as show n in the max v device architecture chapter. (2) this maximum v ih reflects the jedec specification. the max v input buffer can tolerate a v ih maximum of 4.0, as specified by the v i parameter in table 3?2 on page 3?2 . table 3?10. 1.2-v i/o specifications for max v devices symbol parameter conditions minimum maximum unit v ccio i/o supply voltage ? 1.14 1.26 v v ih high-level input voltage ? 0.8 v ccio v ccio +0.3 v v il low-level input voltage ? ?0.3 0.25 v ccio v v oh high-level output voltage ioh = ?2 ma (1) 0.75 v ccio ?v v ol low-level output voltage iol = 2 ma (1) ?0.25v ccio v note to table 3?10 : (1) this specification is supported across all the programmable drive strength settings available for this i/o standard, as show n in the max v device architecture chapter. table 3?11. 3.3-v pci specifications for max v devices (note 1) symbol parameter conditions minimum typical maximum unit v ccio i/o supply voltage ? 3.0 3.3 3.6 v v ih high-level input voltage ? 0.5 v ccio ?v ccio + 0.5 v v il low-level input voltage ? ?0.5 ? 0.3 v ccio v v oh high-level output voltage ioh = ?500 a 0.9 v ccio ??v v ol low-level output voltage iol = 1.5 ma ? ? 0.1 v ccio v note to table 3?11 : (1) 3.3-v pci i/o standard is only supported in bank 3 of the 5m1270z and 5m2210z devices. table 3?12. lvds specifications for max v devices (note 1) symbol parameter conditions minimum typical maximum unit v ccio i/o supply voltage ? 2.375 2.5 2.625 v v od differential output voltage swing ? 247 ? 600 mv v os output offset voltage ? 1.125 1.25 1.375 v note to table 3?12 : (1) supports emulated lvds output using a three-resistor network (lvds_e_3r).
3?8 chapter 3: dc and switching characteristics for max v devices operating conditions max v device handbook may 2011 altera corporation bus hold specifications ta b l e 3 ?1 4 lists the bus hold specifications for the max v device family. table 3?13. rsds specifications for max v devices (note 1) symbol parameter conditions minimum typical maximum unit v ccio i/o supply voltage ? 2.375 2.5 2.625 v v od differential output voltage swing ? 247 ? 600 mv v os output offset voltage ? 1.125 1.25 1.375 v note to table 3?13 : (1) supports emulated rsds output using a three-resistor network (rsds_e_3r). table 3?14. bus hold specifications for max v devices parameter conditions v ccio level unit 1.2 v 1.5 v 1.8 v 2.5 v 3.3 v min max min max min max min max min max low sustaining current v in > v il (maximum) 10 ? 20 ? 30 ? 50 ? 70 ? a high sustaining current v in < v ih (minimum) ?10 ? ?20 ? ?30 ? ?50 ? ?70 ? a low overdrive current 0 v < v in < v ccio ?130?160?200?300?500a high overdrive current 0 v < v in < v ccio ? ?130 ? ?160 ? ?200 ? ?300 ? ?500 a
chapter 3: dc and switching characteristics for max v devices 3?9 operating conditions may 2011 altera corporation max v device handbook power-up timing ta b l e 3 ?1 5 lists the power-up timing characteristics for the max v device family. table 3?15. power-up timing for max v devices symbol parameter device temperature range min typ max unit t config the amount of time from when minimum v ccint is reached until the device enters user mode (1) 5m40z commercial and industrial ? ? 200 s extended ? ? 300 s 5m80z commercial and industrial ? ? 200 s extended ? ? 300 s 5m160z commercial and industrial ? ? 200 s extended ? ? 300 s 5m240z (2) commercial and industrial ? ? 200 s extended ? ? 300 s 5m240z (3) commercial and industrial ? ? 300 s extended ? ? 400 s 5m570z commercial and industrial ? ? 300 s extended ? ? 400 s 5m1270z (4) commercial and industrial ? ? 300 s extended ? ? 400 s 5m1270z (5) commercial and industrial ? ? 450 s extended ? ? 500 s 5m2210z commercial and industrial ? ? 450 s extended ? ? 500 s notes to table 3?15 : (1) for more information about power-on reset (por) trigger voltage, refer to the hot s ocketing and power-on reset in max v devices chapter. (2) not applicable to the t144 package of the 5m240z device. (3) only applicable to the t144 package of the 5m240z device. (4) not applicable to the f324 package of the 5m1270z device. (5) only applicable to the f324 package of the 5m1270z device.
3?10 chapter 3: dc and switching characteristics for max v devices power consumption max v device handbook may 2011 altera corporation power consumption you can use the altera ? powerplay early power estimator and powerplay power analyzer to estimate the device power. f for more information about these power analysis tools, refer to the powerplay early power estimator for altera cplds user guide and the powerplay power analysis chapter in volume 3 of the quartus ii handbook. timing model and specifications max v devices timing can be analyzed with the altera quartus ? ii software, a variety of industry-standard eda simulators and timing analyzers, or with the timing model shown in figure 3?2 . max v devices have predictable internal delays that allow you to determine the worst-case timing of any design. the software provides timing simulation, point-to-point delay prediction, and detailed timing analysis for device-wide performance evaluation. you can derive the timing characteristics of any signal path from the timing model and parameters of a particular device. you can calculate external timing parameters, which represent pin-to-pin timing delays, as the sum of the internal parameters. f for more information, refer to an629: und erstanding timing in altera cplds . figure 3?2. timing model for max v devices i/o pin i/o input delay t in input global input delay t c4 t r4 output delay t od t xz t zx t local t glob logic element i/o pin t fastio output routing delay user flash memory f r om adjace n t le to adjace n t le input routing delay t dl t lut t c lut delay register control delay regi s te r delay s t co t su t h t pre t clr data-i n /lut chai n data-o u t t iodr output and output enable data delay t ioe t comb combi n atio n al path delay
chapter 3: dc and switching characteristics for max v devices 3?11 timing model and specifications may 2011 altera corporation max v device handbook preliminary and final timing this section describes the performance, internal, external, and ufm timing specifications. all specifications are representative of the worst-case supply voltage and junction temperature conditions. timing models can have either preliminary or final status. the quartus ii software issues an informational message during the design compilation if the timing models are preliminary. table 3?16 lists the status of the max v device timing models. preliminary status means the timing model is subject to change. initially, timing numbers are created using simulation results, process data, and other known parameters. these tests are used to make the preliminary numbers as close to the actual timing parameters as possible. final timing numbers are based on actual device operation and testing. these numbers reflect the actual performance of the device under the worst-case voltage and junction temperature conditions. performance ta b l e 3 ?1 7 lists the max v device performance for some common designs. all performance values were obtained with the quartus ii software compilation of megafunctions. table 3?16. timing model status for max v devices device final 5m40z v 5m80z v 5m160z v 5m240z v 5m570z v 5m1270z v 5m2210z v table 3?17. device performance for max v devices (part 1 of 2) resource used design size and function resources used performance unit 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z mode les ufm blocks c4 c5, i5 c4 c5, i5 le 16-bit counter (1) ? 16 0 184.1 118.3 247.5 201.1 mhz 64-bit counter (1) ? 64 0 83.2 80.5 154.8 125.8 mhz 16-to-1 multiplexer ? 11 0 17.4 20.4 8.0 9.3 ns 32-to-1 multiplexer ? 24 0 12.5 25.3 9.0 11.4 ns 16-bit xor function ? 5 0 9.0 16.1 6.6 8.2 ns 16-bit decoder with single address line ? 5 0 9.2 16.1 6.6 8.2 ns
3?12 chapter 3: dc and switching characteristics for max v devices timing model and specifications max v device handbook may 2011 altera corporation internal timing parameters internal timing parameters are specified on a speed grade basis independent of device density. table 3?18 through table 3?25 on page 3?19 list the max v device internal timing microparameters for les, input/output elements (ioes), ufm blocks, and multitrack interconnects. f for more information about each internal timing microparameters symbol, refer to an629: understanding timing in altera cplds . ufm 512 16 none 3 1 10.0 10.0 10.0 10.0 mhz 512 16 spi (2) 37 1 9.7 9.7 8.0 8.0 mhz 512 8 parallel (3) 73 1 (4) (4) (4) (4) mhz 512 16 i 2 c (3) 142 1 100 (5) 100 (5) 100 (5) 100 (5) khz notes to table 3?17 : (1) this design is a binary loadable up counter. (2) this design is configured for read-only operation in extended mode. read and write ability increases the number of logic ele ments (les) used. (3) this design is configured for read-only operation. read and write ability increases the number of les used. (4) this design is asynchronous. (5) the i 2 c megafunction is verified in hardware up to 100-khz serial clock line rate. table 3?17. device performance for max v devices (part 2 of 2) resource used design size and function resources used performance unit 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z mode les ufm blocks c4 c5, i5 c4 c5, i5 table 3?18. le internal timing microparameters for max v devices (part 1 of 2) symbol parameter 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z unit c4 c5, i5 c4 c5, i5 min max min max min max min max t lut le combinational look-up table (lut) delay ? 1,215 ? 2,247 ? 742 ? 914 ps t comb combinational path delay ? 243 ? 309 ? 192 ? 236 ps t clr le register clear delay 401 ? 545 ? 309 ? 381 ? ps t pre le register preset delay 401 ? 545 ? 309 ? 381 ? ps t su le register setup time before clock 260 ? 321 ? 271 ? 333 ? ps t h le register hold time after clock 0 ?0 ?0 ?0 ?ps t co le register clock-to-output delay ? 380 ? 494 ? 305 ? 376 ps
chapter 3: dc and switching characteristics for max v devices 3?13 timing model and specifications may 2011 altera corporation max v device handbook t clkhl minimum clock high or low time 253 ? 339 ? 216 ? 266 ? ps t c register control delay ? 1,356 ? 1,741 ? 1,114 ? 1,372 ps table 3?18. le internal timing microparameters for max v devices (part 2 of 2) symbol parameter 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z unit c4 c5, i5 c4 c5, i5 min max min max min max min max table 3?19. ioe internal timing microparameters for max v devices symbol parameter 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z unit c4 c5, i5 c4 c5, i5 min max min max min max min max t fastio data output delay from adjacent le to i/o block ? 170 ? 428 ? 207 ? 254 ps t in i/o input pad and buffer delay ? 907 ? 986 ? 920 ? 1,132 ps t glob (1) i/o input pad and buffer delay used as global signal pin ? 2,261 ? 3,322 ? 1,974 ? 2,430 ps t ioe internally generated output enable delay ? 530 ? 1,410 ? 374 ? 460 ps t dl input routing delay ? 318 ? 509 ? 291 ? 358 ps t od (2) output delay buffer and pad delay ? 1,319 ? 1,543 ? 1,383 ? 1,702 ps t xz (3) output buffer disable delay ? 1,045 ? 1,276 ? 982 ? 1,209 ps t zx (4) output buffer enable delay ? 1,160 ? 1,353 ? 1,303 ? 1,604 ps notes to table 3?19 : (1) delay numbers for t glob differ for each device density and speed grade. the delay numbers for t glob , shown in table 3?19 , are based on a 5m240z device target. (2) for more information about delay adders associated with different i/o standards, drive strengths, and slew rates, refer to table 3?34 on page 3?24 and table 3?35 on page 3?25 . (3) for more information about t xz delay adders associated with different i/o standards, drive strengths, and slew rates, refer to table 3?22 on page 3?15 and table 3?23 on page 3?15 . (4) for more information about t zx delay adders associated with different i/o standards, drive strengths, and slew rates, refer to table 3?20 on page 3?14 and table 3?21 on page 3?14 .
3?14 chapter 3: dc and switching characteristics for max v devices timing model and specifications max v device handbook may 2011 altera corporation ta b l e 3 ?2 0 through ta b l e 3 ?2 3 list the adder delays for t zx and t xz microparameters when using an i/o standard other than 3.3-v lvttl with 16 ma drive strength. table 3?20. t zx ioe microparameter adders for fast slew rate for max v devices standard 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z unit c4 c5, i5 c4 c5, i5 min max min max min max min max 3.3-v lvttl 16 ma ?0 ?0 ?0 ?0 ps 8 ma ? 72 ? 74 ? 101 ? 125 ps 3.3-v lvcmos 8 ma ?0 ?0 ?0 ?0 ps 4 ma ? 72 ? 74 ? 101 ? 125 ps 2.5-v lvttl / lvcmos 14 ma ? 126 ? 127 ? 155 ? 191 ps 7 ma ? 196 ? 197 ? 545 ? 671 ps 1.8-v lvttl / lvcmos 6 ma ? 608 ? 610 ? 721 ? 888 ps 3 ma ? 681 ? 685 ? 2012 ? 2477 ps 1.5-v lvcmos 4 ma ? 1162 ? 1157 ? 1590 ? 1957 ps 2 ma ? 1245 ? 1244 ? 3269 ? 4024 ps 1.2-v lvcmos 3 ma ? 1889 ? 1856 ? 2860 ? 3520 ps 3.3-v pci 20 ma ? 72 ? 74 ? ?18 ? ?22 ps lvds ? ? 126 ? 127 ? 155 ? 191 ps rsds ? ? 126 ? 127 ? 155 ? 191 ps table 3?21. t zx ioe microparameter adders for slow slew rate for max v devices standard 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z unit c4 c5, i5 c4 c5, i5 min max min max min max min max 3.3-v lvttl 16 ma ? 5,951 ? 6,063 ? 6,012 ? 5,743 ps 8 ma ? 6,534 ? 6,662 ? 8,785 ? 8,516 ps 3.3-v lvcmos 8 ma ? 5,951 ? 6,063 ? 6,012 ? 5,743 ps 4 ma ? 6,534 ? 6,662 ? 8,785 ? 8,516 ps 2.5-v lvttl / lvcmos 14 ma ? 9,110 ? 9,237 ? 10,072 ? 9,803 ps 7 ma ? 9,830 ? 9,977 ? 12,945 ? 12,676 ps 1.8-v lvttl / lvcmos 6 ma ? 21,800 ? 21,787 ? 21,185 ? 20,916 ps 3 ma ? 23,020 ? 23,037 ? 24,597 ? 24,328 ps 1.5-v lvcmos 4 ma ? 39,120 ? 39,067 ? 34,517 ? 34,248 ps 2 ma ? 40,670 ? 40,617 ? 39,717 ? 39,448 ps 1.2-v lvcmos 3 ma ? 69,505 ? 70,461 ? 55,800 ? 55,531 ps 3.3-v pci 20 ma ? 6,534 ? 6,662 ? 35 ? 44 ps
chapter 3: dc and switching characteristics for max v devices 3?15 timing model and specifications may 2011 altera corporation max v device handbook table 3?22. t xz ioe microparameter adders for fast slew rate for max v devices standard 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z unit c4 c5, i5 c4 c5, i5 min max min max min max min max 3.3-v lvttl 16 ma?0?0?0?0 ps 8 ma ? ?69 ? ?69 ? ?74 ? ?91 ps 3.3-v lvcmos 8 ma?0?0?0?0 ps 4 ma ? ?69 ? ?69 ? ?74 ? ?91 ps 2.5-v lvttl / lvcmos 14 ma ? ?7 ? ?10 ? ?46 ? ?56 ps 7 ma ? ?66 ? ?69 ? ?82 ? ?101 ps 1.8-v lvttl / lvcmos 6 ma ? 45 ? 37 ? ?7 ? ?8 ps 3 ma ? 34 ? 25 ? 119 ? 147 ps 1.5-v lvcmos 4 ma ? 166 ? 155 ? 339 ? 418 ps 2 ma ? 190 ? 179 ? 464 ? 571 ps 1.2-v lvcmos 3 ma ? 300 ? 283 ? 817 ? 1,006 ps 3.3-v pci 20 ma ? ?69 ? ?69 ? 80 ? 99 ps lvds ? ? ?7 ? ?10 ? ?46 ? ?56 ps rsds ? ? ?7 ? ?10 ? ?46 ? ?56 ps table 3?23. t xz ioe microparameter adders for slow slew rate for max v devices standard 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z unit c4 c5, i5 c4 c5, i5 min max min max min max min max 3.3-v lvttl 16 ma ? 171 ? 174 ? 73 ? ?132 ps 8 ma ? 112 ? 116 ? 758 ? 553 ps 3.3-v lvcmos 8 ma ? 171 ? 174 ? 73 ? ?132 ps 4 ma ? 112 ? 116 ? 758 ? 553 ps 2.5-v lvttl / lvcmos 14 ma ? 213 ? 213 ? 32 ? ?173 ps 7 ma ? 166 ? 166 ? 714 ? 509 ps 1.8-v lvttl / lvcmos 6 ma ? 441 ? 438 ? 96 ? ?109 ps 3 ma ? 496 ? 494 ? 963 ? 758 ps 1.5-v lvcmos 4 ma ? 765 ? 755 ? 238 ? 33 ps 2 ma ? 903 ? 897 ? 1,319 ? 1,114 ps 1.2-v lvcmos 3 ma ? 1,159 ? 1,130 ? 400 ? 195 ps 3.3-v pci 20 ma ? 112 ? 116 ? 303 ? 373 ps
3?16 chapter 3: dc and switching characteristics for max v devices timing model and specifications max v device handbook may 2011 altera corporation 1 the default slew rate setting for max v devices in the quartus ii design software is ?fast?. table 3?24. ufm block internal timing microparameters for max v devices (part 1 of 2) symbol parameter 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z unit c4 c5, i5 c4 c5, i5 min max min max min max min max t aclk address register clock period 100 ? 100 ? 100 ? 100 ? ns t asu address register shift signal setup to address register clock 20?20?20?20?ns t ah address register shift signal hold to address register clock 20?20?20?20?ns t ads address register data in setup to address register clock 20?20?20?20?ns t adh address register data in hold from address register clock 20?20?20?20?ns t dclk data register clock period 100 ? 100 ? 100 ? 100 ? ns t dss data register shift signal setup to data register clock 60?60?60?60?ns t dsh data register shift signal hold from data register clock 20?20?20?20?ns t dds data register data in setup to data register clock 20?20?20?20?ns t ddh data register data in hold from data register clock 20?20?20?20?ns t dp program signal to data clock hold time 0?0?0?0?ns t pb maximum delay between program rising edge to ufm busy signal rising edge ? 960 ? 960 ? 960 ? 960 ns t bp minimum delay allowed from ufm busy signal going low to program signal going low 20?20?20?20?ns t ppmx maximum length of busy pulse during a program ? 100 ? 100 ? 100 ? 100 s
chapter 3: dc and switching characteristics for max v devices 3?17 timing model and specifications may 2011 altera corporation max v device handbook t ae minimum erase signal to address clock hold time 0?0?0?0 ?ns t eb maximum delay between the erase rising edge to the ufm busy signal rising edge ? 960 ? 960 ? 960 ? 960 ns t be minimum delay allowed from the ufm busy signal going low to erase signal going low 20?20?20?20?ns t epmx maximum length of busy pulse during an erase ? 500 ? 500 ? 500 ? 500 ms t dco delay from data register clock to data register output ?5?5?5?5ns t oe delay from osc_ena signal reaching ufm to rising clock of osc leaving the ufm 180 ? 180 ? 180 ? 180 ? ns t ra maximum read access time ?65?65?65?65ns t oscs maximum delay between the osc_ena rising edge to the erase/program signal rising edge 250 ? 250 ? 250 ? 250 ? ns t osch minimum delay allowed from the erase/program signal going low to osc_ena signal going low 250 ? 250 ? 250 ? 250 ? ns table 3?24. ufm block internal timing microparameters for max v devices (part 2 of 2) symbol parameter 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z unit c4 c5, i5 c4 c5, i5 min max min max min max min max
3?18 chapter 3: dc and switching characteristics for max v devices timing model and specifications max v device handbook may 2011 altera corporation figure 3?3 through figure 3?5 show the read, program, and erase waveforms for ufm block timing parameters listed in table 3?24 . figure 3?3. ufm read waveform t dco t dclk t dss t dsh t adh t ads t asu t aclk t ah arshft arclk ardin drshft drclk drdin drdo u t program erase b u sy 16 data bits 9 address bits osc_e n a figure 3?4. ufm program waveform t ads t asu t aclk t adh t ah t dds t dclk t dss t dsh t ddh t pb t bp t ppmx t oscs t osch arshft arclk ardin drshft drclk drdin drdo u t program erase b u sy 16 data bits 9 address bits osc_e n a
chapter 3: dc and switching characteristics for max v devices 3?19 timing model and specifications may 2011 altera corporation max v device handbook external timing parameters external timing parameters are specified by device density and speed grade. all external i/o timing parameters shown are for the 3.3-v lvttl i/o standard with the maximum drive strength and fast slew rate. for external i/o timing using standards other than lvttl or for different drive strengths, use the i/o standard input and output delay adders in table 3?32 on page 3?23 through table 3?36 on page 3?25 . f for more information about each external timing parameters symbol, refer to an629: understanding timing in altera cplds . figure 3?5. ufm erase waveform arshft arclk ardin drshft drclk drdin drdo u t program erase b u sy 9 address bits t asu t aclk t ah t adh t ads t eb t epmx t oscs t osch osc_e n a t be table 3?25. routing delay internal timing microparameters for max v devices routing 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z unit c4 c5, i5 c4 c5, i5 min max min max min max min max t c4 ? 860 ? 1,973 ? 561 ? 690 ps t r4 ? 655 ? 1,479 ? 445 ? 548 ps t local ? 1,143 ? 2,947 ? 731 ? 899 ps
3?20 chapter 3: dc and switching characteristics for max v devices timing model and specifications max v device handbook may 2011 altera corporation ta b l e 3 ?2 6 lists the external i/o timing parameters for the 5m40z, 5m80z, 5m160z, and 5m240z devices. ta b l e 3 ?2 7 lists the external i/o timing parameters for the t144 package of the 5m240z device. table 3?26. global clock external i/o timing paramete rs for the 5m40z, 5m80z, 5m160z, and 5m240z devices (note 1) , (2) symbol parameter condition c4 c5, i5 unit min max min max t pd1 worst case pin-to-pin delay through one lut 10 pf ? 7.9 ? 14.0 ns t pd2 best case pin-to-pin delay through one lut 10 pf ? 5.8 ? 8.5 ns t su global clock setup time ? 2.4 ? 4.6 ? ns t h global clock hold time ? 0 ? 0 ? ns t co global clock to output delay 10 pf 2.0 6.6 2.0 8.6 ns t ch global clock high time ? 253 ? 339 ? ps t cl global clock low time ? 253 ? 339 ? ps t cnt minimum global clock period for 16-bit counter ? 5.4 ? 8.4 ? ns f cnt maximum global clock frequency for 16-bit counter ? ? 184.1 ? 118.3 mhz notes to table 3?26 : (1) the maximum frequency is limited by the i/o standard on the clock input pin. the 16-bit counter critical delay performs fast er than this global clock input pin maximum frequency. (2) not applicable to the t144 package of the 5m240z device. table 3?27. global clock external i/o timing parameters for the 5m240z device (note 1) , (2) symbol parameter condition c4 c5, i5 unit min max min max t pd1 worst case pin-to-pin delay through one lut 10 pf ? 9.5 ? 17.7 ns t pd2 best case pin-to-pin delay through one lut 10 pf ? 5.7 ? 8.5 ns t su global clock setup time ? 2.2 ? 4.4 ? ns t h global clock hold time ? 0 ? 0 ? ns t co global clock to output delay 10 pf 2.0 6.7 2.0 8.7 ns t ch global clock high time ? 253 ? 339 ? ps t cl global clock low time ? 253 ? 339 ? ps t cnt minimum global clock period for 16-bit counter ? 5.4 ? 8.4 ? ns f cnt maximum global clock frequency for 16-bit counter ? ? 184.1 ? 118.3 mhz notes to table 3?27 : (1) the maximum frequency is limited by the i/o standard on the clock input pin. the 16-bit counter critical delay performs fast er than this global clock input pin maximum frequency. (2) only applicable to the t144 package of the 5m240z device.
chapter 3: dc and switching characteristics for max v devices 3?21 timing model and specifications may 2011 altera corporation max v device handbook ta b l e 3 ?2 8 lists the external i/o timing parameters for the 5m570z device. ta b l e 3 ?2 9 lists the external i/o timing parameters for the 5m1270z device. table 3?28. global clock external i/o timing parameters for the 5m570z device (note 1) symbol parameter condition c4 c5, i5 unit min max min max t pd1 worst case pin-to-pin delay through one lut 10 pf ? 9.5 ? 17.7 ns t pd2 best case pin-to-pin delay through one lut 10 pf ? 5.7 ? 8.5 ns t su global clock setup time ? 2.2 ? 4.4 ? ns t h global clock hold time ? 0 ? 0 ? ns t co global clock to output delay 10 pf 2.0 6.7 2.0 8.7 ns t ch global clock high time ? 253 ? 339 ? ps t cl global clock low time ? 253 ? 339 ? ps t cnt minimum global clock period for 16-bit counter ? 5.4 ? 8.4 ? ns f cnt maximum global clock frequency for 16-bit counter ? ? 184.1 ? 118.3 mhz note to table 3?28 : (1) the maximum frequency is limited by the i/o standard on the clock input pin. the 16-bit counter critical delay performs fast er than this global clock input pin maximum frequency. table 3?29. global clock external i/o timing parameters for the 5m1270z device (note 1) , (2) symbol parameter condition c4 c5, i5 unit min max min max t pd1 worst case pin-to-pin delay through one lut 10 pf ? 8.1 ? 10.0 ns t pd2 best case pin-to-pin delay through one lut 10 pf ? 4.8 ? 5.9 ns t su global clock setup time ? 1.5 ? 1.9 ? ns t h global clock hold time ? 0 ? 0 ? ns t co global clock to output delay 10 pf 2.0 5.9 2.0 7.3 ns t ch global clock high time ? 216 ? 266 ? ps t cl global clock low time ? 216 ? 266 ? ps t cnt minimum global clock period for 16-bit counter ? 4.0 ? 5.0 ? ns f cnt maximum global clock frequency for 16-bit counter ? ? 247.5 ? 201.1 mhz notes to table 3?29 : (1) the maximum frequency is limited by the i/o standard on the clock input pin. the 16-bit counter critical delay performs fast er than this global clock input pin maximum frequency. (2) not applicable to the f324 package of the 5m1270z device.
3?22 chapter 3: dc and switching characteristics for max v devices timing model and specifications max v device handbook may 2011 altera corporation ta b l e 3 ?3 0 lists the external i/o timing parameters for the f324 package of the 5m1270z device. ta b l e 3 ?3 1 lists the external i/o timing parameters for the 5m2210z device. table 3?30. global clock external i/o timing parameters for the 5m1270z device (note 1) , (2) symbol parameter condition c4 c5, i5 unit min max min max t pd1 worst case pin-to-pin delay through one lut 10 pf ? 9.1 ? 11.2 ns t pd2 best case pin-to-pin delay through one lut 10 pf ? 4.8 ? 5.9 ns t su global clock setup time ? 1.5 ? 1.9 ? ns t h global clock hold time ? 0 ? 0 ? ns t co global clock to output delay 10 pf 2.0 6.0 2.0 7.4 ns t ch global clock high time ? 216 ? 266 ? ps t cl global clock low time ? 216 ? 266 ? ps t cnt minimum global clock period for 16-bit counter ? 4.0 ? 5.0 ? ns f cnt maximum global clock frequency for 16-bit counter ? ? 247.5 ? 201.1 mhz notes to table 3?30 : (1) the maximum frequency is limited by the i/o standard on the clock input pin. the 16-bit counter critical delay performs fast er than this global clock input pin maximum frequency. (2) only applicable to the f324 package of the 5m1270z device. table 3?31. global clock external i/o timing parameters for the 5m2210z device (note 1) symbol parameter condition c4 c5, i5 unit min max min max t pd1 worst case pin-to-pin delay through one lut 10 pf ? 9.1 ? 11.2 ns t pd2 best case pin-to-pin delay through one lut 10 pf ? 4.8 ? 5.9 ns t su global clock setup time ? 1.5 ? 1.9 ? ns t h global clock hold time ? 0 ? 0 ? ns t co global clock to output delay 10 pf 2.0 6.0 2.0 7.4 ns t ch global clock high time ? 216 ? 266 ? ps t cl global clock low time ? 216 ? 266 ? ps t cnt minimum global clock period for 16-bit counter ? 4.0 ? 5.0 ? ns f cnt maximum global clock frequency for 16-bit counter ? ? 247.5 ? 201.1 mhz note to table 3?31 : (1) the maximum frequency is limited by the i/o standard on the clock input pin. the 16-bit counter critical delay performs fast er than this global clock input pin maximum frequency.
chapter 3: dc and switching characteristics for max v devices 3?23 timing model and specifications may 2011 altera corporation max v device handbook external timing i/o delay adders the i/o delay timing parameters for the i/o standard input and output adders and the input delays are specified by speed grade, independent of device density. ta b l e 3 ?3 2 through table 3?36 on page 3?25 list the adder delays associated with i/o pins for all packages. if you select an i/o standard other than 3.3-v lvttl, add the input delay adder to the external t su timing parameters listed in table 3?26 on page 3?20 through table 3?31 . if you select an i/o standard other than 3.3-v lvttl with 16 ma drive strength and fast slew rate, add the output delay adder to the external t co and t pd listed in table 3?26 on page 3?20 through ta b l e 3 ?3 1 . table 3?32. external timing input delay adders for max v devices i/o standard 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z unit c4 c5, i5 c4 c5, i5 min max min max min max min max 3.3-v lvttl without schmitt trigger ?0?0?0?0ps with schmitt trigger ? 387 ? 442 ? 480 ? 591 ps 3.3-v lvcmos without schmitt trigger ?0?0?0?0ps with schmitt trigger ? 387 ? 442 ? 480 ? 591 ps 2.5-v lvttl / lvcmos without schmitt trigger ? 42 ? 42 ? 246 ? 303 ps with schmitt trigger ? 429 ? 483 ? 787 ? 968 ps 1.8-v lvttl / lvcmos without schmitt trigger ? 378 ? 368 ? 695 ? 855 ps 1.5-v lvcmos without schmitt trigger ? 681 ? 658 ? 1,334 ? 1,642 ps 1.2-v lvcmos without schmitt trigger ? 1,055 ? 1,010 ? 2,324 ? 2,860 ps 3.3-v pci without schmitt trigger ?0?0?0?0ps table 3?33. external timing input delay t glob adders for gclk pins for max v devices (part 1 of 2) i/o standard 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z unit c4 c5, i5 c4 c5, i5 min max min max min max min max 3.3-v lvttl without schmitt trigger ?0?0?0?0ps with schmitt trigger ? 387 ? 442 ? 400 ? 493 ps
3?24 chapter 3: dc and switching characteristics for max v devices timing model and specifications max v device handbook may 2011 altera corporation 3.3-v lvcmos without schmitt trigger ?0?0?0?0ps with schmitt trigger ? 387 ? 442 ? 400 ? 493 ps 2.5-v lvttl / lvcmos without schmitt trigger ? 242 ? 242 ? 287 ? 353 ps with schmitt trigger ? 429 ? 483 ? 550 ? 677 ps 1.8-v lvttl / lvcmos without schmitt trigger ? 378 ? 368 ? 459 ? 565 ps 1.5-v lvcmos without schmitt trigger ? 681 ? 658 ? 1,111 ? 1,368 ps 1.2-v lvcmos without schmitt trigger ? 1,055 ? 1,010 ? 2,067 ? 2,544 ps 3.3-v pci without schmitt trigger ?0?0?7?9ps table 3?33. external timing input delay t glob adders for gclk pins for max v devices (part 2 of 2) i/o standard 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z unit c4 c5, i5 c4 c5, i5 min max min max min max min max table 3?34. external timing output delay and t od adders for fast slew rate for max v devices i/o standard 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z unit c4 c5, i5 c4 c5, i5 min max min max min max min max 3.3-v lvttl 16 ma?0?0?0?0ps 8 ma ? 39 ? 58 ? 84 ? 104 ps 3.3-v lvcmos 8 ma?0?0?0?0ps 4 ma ? 39 ? 58 ? 84 ? 104 ps 2.5-v lvttl / lvcmos 14 ma ? 122 ? 129 ? 158 ? 195 ps 7 ma ? 196 ? 188 ? 251 ? 309 ps 1.8-v lvttl / lvcmos 6 ma ? 624 ? 624 ? 738 ? 909 ps 3 ma ? 686 ? 694 ? 850 ? 1,046 ps 1.5-v lvcmos 4 ma ? 1,188 ? 1,184 ? 1,376 ? 1,694 ps 2 ma ? 1,279 ? 1,280 ? 1,517 ? 1,867 ps 1.2-v lvcmos 3 ma ? 1,911 ? 1,883 ? 2,206 ? 2,715 ps 3.3-v pci 20 ma ? 39 ? 58 ? 4 ? 5 ps lvds ? ? 122 ? 129 ? 158 ? 195 ps rsds ? ? 122 ? 129 ? 158 ? 195 ps
chapter 3: dc and switching characteristics for max v devices 3?25 timing model and specifications may 2011 altera corporation max v device handbook table 3?35. external timing output delay and t od adders for slow slew rate for max v devices i/o standard 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z unit c4 c5, i5 c4 c5, i5 min max min max min max min max 3.3-v lvttl 16 ma ? 5,913 ? 6,043 ? 6,612 ? 6,293 ps 8 ma ? 6,488 ? 6,645 ? 7,313 ? 6,994 ps 3.3-v lvcmos 8 ma ? 5,913 ? 6,043 ? 6,612 ? 6,293 ps 4 ma ? 6,488 ? 6,645 ? 7,313 ? 6,994 ps 2.5-v lvttl / lvcmos 14 ma ? 9,088 ? 9,222 ? 10,021 ? 9,702 ps 7 ma ? 9,808 ? 9,962 ? 10,881 ? 10,562 ps 1.8-v lvttl / lvcmos 6 ma ? 21,758 ? 21,782 ? 21,134 ? 20,815 ps 3 ma ? 23,028 ? 23,032 ? 22,399 ? 22,080 ps 1.5-v lvcmos 4 ma ? 39,068 ? 39,032 ? 34,499 ? 34,180 ps 2 ma ? 40,578 ? 40,542 ? 36,281 ? 35,962 ps 1.2-v lvcmos 3 ma ? 69,332 ? 70,257 ? 55,796 ? 55,477 ps 3.3-v pci 20 ma ? 6,488 ? 6,645 ? 339 ? 418 ps table 3?36. ioe programmable delays for max v devices parameter 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z 5m1270z/ 5m2210z unit c4 c5, i5 c4 c5, i5 min max min max min max min max input delay from pin to internal cells = 1 ? 1,858 ? 2,214 ? 1,592 ? 1,960 ps input delay from pin to internal cells = 0 ? 569 ? 616 ? 115 ? 142 ps
3?26 chapter 3: dc and switching characteristics for max v devices timing model and specifications max v device handbook may 2011 altera corporation maximum input and output clock rates ta b l e 3 ?3 7 and table 3?38 list the maximum input and output clock rates for standard i/o pins in max v devices. table 3?37. maximum input clock rate for i/os for max v devices i/o standard 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z/5m1270z/ 5m2210z unit c4, c5, i5 3.3-v lvttl without schmitt trigger 304 mhz with schmitt trigger 304 mhz 3.3-v lvcmos without schmitt trigger 304 mhz with schmitt trigger 304 mhz 2.5-v lvttl without schmitt trigger 304 mhz with schmitt trigger 304 mhz 2.5-v lvcmos without schmitt trigger 304 mhz with schmitt trigger 304 mhz 1.8-v lvttl without schmitt trigger 200 mhz 1.8-v lvcmos without schmitt trigger 200 mhz 1.5-v lvcmos without schmitt trigger 150 mhz 1.2-v lvcmos without schmitt trigger 120 mhz 3.3-v pci without schmitt trigger 304 mhz table 3?38. maximum output clock rate for i/os for max v devices i/o standard 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z/5m1270z/ 5m2210z unit c4, c5, i5 3.3-v lvttl 304 mhz 3.3-v lvcmos 304 mhz 2.5-v lvttl 304 mhz 2.5-v lvcmos 304 mhz 1.8-v lvttl 200 mhz 1.8-v lvcmos 200 mhz 1.5-v lvcmos 150 mhz 1.2-v lvcmos 120 mhz 3.3-v pci 304 mhz lvds 304 mhz rsds 200 mhz
chapter 3: dc and switching characteristics for max v devices 3?27 timing model and specifications may 2011 altera corporation max v device handbook lvds and rsds output timing specifications ta b l e 3 ?3 9 lists the emulated lvds output timing specifications for max v devices. table 3?39. emulated lvds output timing specifications for max v devices parameter mode 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z/5m1270z/ 5m2210z unit c4, c5, i5 min max data rate (1) , (2) ? 10 ? 304 mbps ? 9 ? 304 mbps ? 8 ? 304 mbps ? 7 ? 304 mbps ? 6 ? 304 mbps ? 5 ? 304 mbps ? 4 ? 304 mbps ? 3 ? 304 mbps ? 2 ? 304 mbps ? 1 ? 304 mbps t duty ?4555% total jitter (3) ??0.2ui t rise ??450ps t fall ??450ps notes to table 3?39 : (1) the performance of the lvds_e_3r transmitter system is limited by the lower of the two?the maximum data rate supported by lv ds_e_3r i/o buffer or 2x (f max of the altlvds_tx instance). the actual performance of your lvds_e_3r transmitter system must be attained through the quartus ii timing analysis of the complete design. (2) for the input clock pin to achieve 304 mbps, use i/o standard with v ccio of 2.5 v and above. (3) this specification is based on external clean clock source.
3?28 chapter 3: dc and switching characteristics for max v devices timing model and specifications max v device handbook may 2011 altera corporation ta b l e 3 ?4 0 lists the emulated rsds output timing specifications for max v devices. table 3?40. emulated rsds output timing specifications for max v devices parameter mode 5m40z/ 5m80z/ 5m160z/ 5m240z/ 5m570z/5m1270z/ 5m2210z unit c4, c5, i5 min max data rate (1) ? 10 ? 200 mbps ? 9 ? 200 mbps ? 8 ? 200 mbps ? 7 ? 200 mbps ? 6 ? 200 mbps ? 5 ? 200 mbps ? 4 ? 200 mbps ? 3 ? 200 mbps ? 2 ? 200 mbps ? 1 ? 200 mbps t duty ?4555% total jitter (2) ??0.2ui t rise ??450ps t fall ??450ps notes to table 3?40 : (1) for the input clock pin to achieve 200 mbps, use i/o standard with v ccio of 1.8 v and above. (2) this specification is based on external clean clock source.
chapter 3: dc and switching characteristics for max v devices 3?29 timing model and specifications may 2011 altera corporation max v device handbook jtag timing specifications figure 3?6 shows the timing waveform for the jtag signals for the max v device family. ta b l e 3 ?4 1 lists the jtag timing parameters and values for the max v device family. figure 3?6. jtag timing waveform for max v devices tdi tms tdo tck signal to be captured signal to be driven t jcp t jch t jcl t jpsu t jph t jpco t jpxz t jpzx t jssu t jsh t jszx t jsco t jsxz table 3?41. jtag timing parameters for max v devices (part 1 of 2) symbol parameter min max unit t jcp (1) tck clock period for v ccio1 = 3.3 v 55.5 ? ns tck clock period for v ccio1 = 2.5 v 62.5 ? ns tck clock period for v ccio1 = 1.8 v 100 ? ns tck clock period for v ccio1 = 1.5 v 143 ? ns t jch tck clock high time 20 ? ns t jcl tck clock low time 20 ? ns t jpsu jtag port setup time (2) 8?ns t jph jtag port hold time 10 ? ns t jpco jtag port clock to output (2) ?15ns t jpzx jtag port high impedance to valid output (2) ?15ns t jpxz jtag port valid output to high impedance (2) ?15ns t jssu capture register setup time 8 ? ns t jsh capture register hold time 10 ? ns t jsco update register clock to output ? 25 ns t jszx update register high impedance to valid output ? 25 ns
3?30 chapter 3: dc and switching characteristics for max v devices document revision history max v device handbook may 2011 altera corporation document revision history ta b l e 3 ?4 2 lists the revision history for this chapter. t jsxz update register valid output to high impedance ? 25 ns notes to table 3?41 : (1) minimum clock period specified for 10 pf load on the tdo pin. larger loads on tdo degrades the maximum tck frequency. (2) this specification is shown for 3.3-v lvttl/lvcmos and 2.5-v lvttl/lvcmos operation of the jtag pins. for 1.8-v lvttl/lvcmos and 1.5-v lvcmos operation, the t jpsu minimum is 6 ns and t jpco , t jpzx , and t jpxz are maximum values at 35 ns. table 3?41. jtag timing parameters for max v devices (part 2 of 2) symbol parameter min max unit table 3?42. document revision history date version changes may 2011 1.2 updated table 3?2 , table 3?15 , table 3?16 , and table 3?33 . january 2011 1.1 updated table 3?37, table 3?38, table 3?39, and table 3?40. december 2010 1.0 initial release.
may 2011 altera corporation max v device handbook section ii. system integration in max v devices this section provides information about system integration in max ? v devices. this section includes the following chapters: chapter 4, hot socketing and power-on reset in max v devices chapter 5, using max v devices in multi-voltage systems chapter 6, jtag and in-system programmability in max v devices chapter 7, user flash memory in max v devices chapter 8, jtag boundary-scan testing in max v devices
ii?2 section ii: system integration in max v devices max v device handbook may 2011 altera corporation
max v device handbook december 2010 mv51004-1.0 subscribe ? 2010 altera corporation. all rights reserved. altera, arria, cyclone, hardcopy, max, megacore, nios, quartus and stratix are reg. u.s. pat. & tm. off. and/or trademarks of altera corporation in the u.s. and other countries. all other trademarks and service marks are the propert y of their respective holders as described at www.altera.com/common/legal.html . altera warrants performance of its semiconductor products to current specifications in accordance with altera?s standard warr anty, but reserves the right to make changes to any products and services at any time without notice. altera assumes no responsibility or liability arising out of the application or use of any information, product, or service described herein except as expressly agreed to in writing by altera. altera customers are advi sed to obtain the latest version of device specifications before relying on any published information and before placing orders for products or services. 4. hot socketing and power-on reset in max v devices this chapter provides information about hot-socketing specifications, power-on reset (por) requirements, and their implementation in max ? v devices. max v devices offer hot socketing, also known as hot plug-in or hot swap, and power sequencing support. you can insert or remove a max v device in a system during system operation without causing undesirable effects to the running system bus. the hot-socketing feature removes some of the difficulty when using max v devices on pcbs that contain a mixture of 3.3-, 2.5-, 1.8-, and 1.5-v devices. the max v hot-socketing feature provides the following: board or device insertion and removal support for any power-up sequence non-intrusive i/o buffers to system buses during hot insertion this chapter contains the following sections: ?max v hot-socketing specifications? on page 4?1 ?hot-socketing feature implementation in max v devices? on page 4?3 ?power-on reset circuitry? on page 4?5 max v hot-socketing specifications max v devices offer the hot-socketing feature without the need for external components or special design requirements. the advantages of hot-socketing support in max v devices includes the following: the device can be driven before and during power up or power down without damaging the device. i/o pins remain tri-stated during power up. the device does not drive out before or during power up, thereby affecting other operating buses. signal pins do not drive the v ccio or v ccint power supplies. external input signals to the device i/o pins do not power the device v ccio or v ccint power supplies using internal paths. this is true if the v ccint and v ccio power supplies are held at gnd. 1 altera uses gnd as a reference for the hot-socketing and i/o buffers circuitry designs. to ensure device reliability and compliance to the hot-socketing specifications, you must connect gnd between boards before connecting the v ccint and v ccio power supplies. december 2010 mv51004-1.0
4?2 chapter 4: hot socketing and power-on reset in max v devices max v hot-socketing specifications max v device handbook december 2010 altera corporation devices can be driven before power up you can drive signals into the i/o pins and gclk[3..0] pins of max v devices before or during power up or power down without damaging the device. to simplify the system-level design, max v devices support any power-up or power-down sequence (v ccio1 , v ccio2 , v ccio3 , v ccio4 , and v ccint ). i/o pins remain tri-stated during power up a device that does not support hot socketing may interrupt system operation or cause contention by driving out before or during power up. in a hot-socketing situation, the max v device?s output buffers are turned off during system power up. max v devices do not drive out until the device attains proper operating conditions and is fully configured. for more information about turn-on voltages, refer to ?power-on reset circuitry? on page 4?5 . signal pins do not drive the v ccio or v ccint power supplies max v devices do not have a current path from the i/o pins or gclk[3..0] pins to the v ccio or v ccint power supplies before or during power up. a max v device may be inserted into (or removed from) a system board that is powered up without damaging or interfering with system-board operation. when hot socketing, max v devices may have a minimal effect on the signal integrity of the backplane. ac and dc specifications you can power up or power down the v ccio and v ccint power supplies in any sequence. during hot socketing, the i/o pin capacitance is less than 8 pf. max v devices meet the following hot-socketing specifications: dc specification: | i iopin | < 300 ? a. ac specification: | i iopin | < 8 ma for 10 ns or less. 1 max v devices are immune to latch-up when hot socketing. if the tck jtag input pin is driven high during hot socketing, the current on that pin might exceed the specifications listed above. i iopin is the current for any user i/o pin on the device. the ac specification applies when the device is being powered up or powered down. this specification takes into account the pin capacitance but not the board trace and external loading capacitance. you must consider additional capacitance for trace, connector, and loading separately. the peak current duration due to power-up transients is 10 ns or less. the dc specification applies when all v cc supplies to the device are stable in the powered-up or powered-down conditions.
chapter 4: hot socketing and power-on reset in max v devices 4?3 hot-socketing feature implementation in max v devices december 2010 altera corporation max v device handbook hot-socketing feature implementation in max v devices the hot-socketing feature tri-states the output buffer during the power-up event (either the v ccint or v ccio power supplies) or power-down event. the hot-socketing circuitry generates an internal hotsckt signal when either v ccint or v ccio is below the threshold voltage during power up or power down. the hotsckt signal cuts off the output buffer to ensure that no dc current leaks through the pin (except for weak pull-up leaking). when v cc ramps up very slowly during power up, v cc may still be relatively low even after the por signal is released and device configuration is complete. 1 ensure that v ccint is within the recommended operating range even though sram download has completed. figure 4?1 shows the circuitry for each i/o and clock pin. the por circuit monitors the v ccint and v ccio voltage levels and keeps the i/o pins tri-stated until the device has completed its flash memory configuration of the sram logic. the weak pull-up resistor (r) from the i/o pin to v ccio is enabled during download to keep the i/o pins from floating. the 3.3-v tolerance control circuit permits the i/o pins to be driven by 3.3 v before v ccio and/or v ccint are powered, and it prevents the i/o pins from driving out when the device is not fully powered or operational. the hot-socketing circuitry prevents the i/o pins from internally powering v ccio and v ccint when driven by external signals before the device is powered. f for more information about the 5.0-v tolerance, refer to the using max v devices in multi-voltage systems chapter. figure 4?1. hot-socketing circuitry for max v devices output enable v ccio hot socket voltage tolerance control power on reset monitor weak p u ll-up re s i s to r pad input buffer to logic array
4?4 chapter 4: hot socketing and power-on reset in max v devices hot-socketing feature implementation in max v devices max v device handbook december 2010 altera corporation figure 4?2 shows a transistor-level cross section of the max v device i/o buffers. this design ensures that the output buffers do not drive when v ccio is powered before v ccint or if the i/o pad voltage is higher than v ccio . this also applies for sudden voltage spikes during hot insertion. the v pa d leakage current charges the 3.3-v tolerant circuit capacitance. the cmos output drivers in the i/o pins intrinsically provide electrostatic discharge (esd) protection. there are two cases to consider for esd voltage strikes?positive voltage zap and negative voltage zap. a positive esd voltage zap occurs when a positive voltage is present on an i/o pin due to an esd charge event. this can cause the n+ (drain)/ p-substrate junction of the n-channel drain to break down and the n+ (drain)/p-substrate/n+ (source) intrinsic bipolar transistor turn on to discharge esd current from i/o pin to gnd. the dashed line in figure 4?3 shows the esd current discharge path during a positive esd zap. figure 4?2. transistor-level i/o buffers for max v devices p - substrate p+ p+ n - well n+ vccio n+ n+ p - well ioe signal vpad ioe signal or the larger of vccio or vpad the larger of vccio or vpad ensures 3.3-v tolerance and hot-socket protection figure 4?3. esd protection during positive voltage zap i/o i/o gate gate drain drain pmos nmos source source gnd gnd n+ n+ p-substrate g s d
chapter 4: hot socketing and power-on reset in max v devices 4?5 power-on reset circuitry december 2010 altera corporation max v device handbook when the i/o pin receives a negative esd zap at the pin that is less than ?0.7 v (0.7 v is the voltage drop across a diode), the intrinsic p-substrate/n+ drain diode is forward biased. therefore, the discharge esd current path is from gnd to the i/o pin, as shown in figure 4?4 . power-on reset circuitry max v devices have por circuits to monitor the v ccint and v ccio voltage levels during power up. the por circuit monitors these voltages, triggering download from the non-volatile configuration flash memory block to the sram logic, maintaining the tri-state of the i/o pins (with weak pull-up resistors enabled) before and during this process. when the max v device enters user mode, the por circuit releases the i/o pins to user functionality. the por circuit of the max v device does not monitor the v ccint voltage level after the device enters into user mode. power-up characteristics when power is applied to a max v device, the por circuit monitors v ccint and begins sram download at 1.55 v for max v devices. from this voltage reference, the sram download and entry into user mode takes 200 to 450 s maximum, depending on your device density. this period of time is specified as t config in the power-up timing section of the dc and switching characteristics for max v devices chapter. entry into user mode is gated by whether all the v ccio banks are powered with sufficient operating voltage. if v ccint and v ccio are powered simultaneously, the device enters user mode within the t config specifications. if v ccio is powered more than t config after v ccint , the device does not enter user mode until 2 s after all v ccio banks are powered. figure 4?4. esd protection during negative voltage zap i/o i/o gate gate drain drain pmos nmos source source gnd gnd n+ n+ p-substrate g s d
4?6 chapter 4: hot socketing and power-on reset in max v devices document revision history max v device handbook december 2010 altera corporation for max v devices, the por circuitry does not monitor the v ccint and v ccio voltage levels after the device enters user mode. if there is a v ccint voltage sag below 1.4 v during user mode, the functionality of the device is not guaranteed and you must power down v ccint to 250 mv for a minimum of 10 s before powering v ccint and v ccio up again. after v ccint rises from 250 mv back to approximately 1.55 v, the sram download restarts and the device begins to operate after the t config time has passed. figure 4?5 shows the voltages for por of max v devices during power up into user mode and from user mode to power down or brown out. 1 all v ccint and v ccio power supplies of all banks must be powered on before entering user mode. 1 after sram configuration, all registers in the device are cleared and released into user function before the i/o tri-states are released. to release clears after the tri-states are released, use the dev_clrn pin option. to hold the tri-states beyond the power-up configuration time, use the dev_oe pin option. document revision history ta b l e 4 ?1 lists the revision history for this chapter. figure 4?5. power-up characteristics for max v devices (note 1) , (2) notes to figure 4?5 : (1) time scale is relative. (2) for this figure, all the v ccio banks are powered up simultaneously with the v ccint profile shown. if this is not the case, t config stretches out until all v ccio banks are powered. 3.3 v 1.55 v tri-state user mode operation 250 mv 1.8 v tri-state 1.4 v max v device app r oximate voltage fo r sram dow n load sta r t v ccint m us t be powe r ed dow n to 250 mv if the v ccint dip s below thi s level t config t config user mode operation v ccint minimum 10 s table 4?1. document revision history date version changes december 2010 1.0 initial release.
max v device handbook december 2010 mv51005-1.0 subscribe ? 2010 altera corporation. all rights reserved. altera, arria, cyclone, hardcopy, max, megacore, nios, quartus and stratix are reg. u.s. pat. & tm. off. and/or trademarks of altera corporation in the u.s. and other countries. all other trademarks and service marks are the propert y of their respective holders as described at www.altera.com/common/legal.html . altera warrants performance of its semiconductor products to current specifications in accordance with altera?s standard warr anty, but reserves the right to make changes to any products and services at any time without notice. altera assumes no responsibility or liability arising out of the application or use of any information, product, or service described herein except as expressly agreed to in writing by altera. altera customers are advi sed to obtain the latest version of device specifications before relying on any published information and before placing orders for products or services. 5. using max v devices in multi-voltage systems this chapter describes how to implement altera ? devices in multi-voltage systems without damaging the device or the system. technological advancements in deep submicron processes have lowered the supply voltage levels of semiconductor devices, creating a design environment where devices on a system board may potentially use many different supply voltages such as 5.0, 3.3, 2.5, 1.8, 1.5, and 1.2 v, which can ultimately lead to voltage conflicts. to accommodate interfacing with a variety of devices on system boards, max ? v devices have multivolt i/o interfaces that allow devices in a mixed-voltage design environment to communicate directly with max v devices. the multivolt interface separates the power supply voltage (v ccint ) from the output voltage (v ccio ), allowing max v devices to interface with other devices using a different voltage level on the same pcb. the 1.8-v input directly powers the core of the max v devices. f for more information about hot socketing and power-on reset (por), refer to the hot socketing and power-on reset in max v devices chapter. this chapter contains the following sections: ?i/o standards? on page 5?1 ?multivolt i/o operation? on page 5?3 ?5.0-v device compatibility? on page 5?3 ?recommended operating conditions for 5.0-v compatibility? on page 5?7 ?power-up sequencing? on page 5?8 i/o standards the i/o buffer of max v devices is programmable and supports a wide range of i/o voltage standards. you can program each i/o bank in a max v device to comply with a different i/o standard. you can configure all i/o banks with the following standards: 3.3-v lvttl/lvcmos 2.5-v lvttl/lvcmos 1.8-v lvttl/lvcmos 1.5-v lvcmos 1.2-v lvcmos emulated lvds output (lvds_e_3r) emulated rsds output (rsds_e_3r) december 2010 mv51005-1.0
5?2 chapter 5: using max v devices in multi-voltage systems i/o standards max v device handbook december 2010 altera corporation the schmitt trigger input option is supported by the 3.3-v and 2.5-v i/o standards. the i/o bank 3 also includes the 3.3-v pci i/o standard interface capability on the 5m1270z and 5m2210z devices. figure 5?1 shows the i/o standards supported by max v devices. figure 5?1. i/o standards supported by max v devices (note 1) , (2) , (3) , (4) , (5) notes to figure 5?1 : (1) figure 5?1 is a top view of the silicon die. (2) figure 5?1 is a graphical representation only. for the exact pin locations, refer to the pin list and the quartus ? ii software. (3) 5m40z, 5m80z, 5m160z, 5m240z, and 5m570z devices only have two i/o banks. (4) the 3.3-v pci i/o standard is only supported in 5m1270z and 5m2210z devices. (5) the schmitt trigger input option for 3.3-v and 2.5-v i/o standards is supported for all i/o pins. i/o ba n k 1 i/o ba n k 2 i/o ba n k 3 i/o ba n k 4 i/o ba n k 3 al s o su ppo r t s the 3.3-v pci i/o sta n da r d all i/o ba n k s s u ppo r t 3.3-v lvttl/lvcmos 2.5-v lvttl/lvcmos 1.8-v lvttl/lvcmos 1.5-v lvcmos 1.2-v lvcmos em u lated lvds o u tp u t (lvds_e_3r) em u lated rsds o u tp u t (rsds_e_3r) i n divid u al powe r b us
chapter 5: using max v devices in multi-voltage systems 5?3 multivolt i/o operation december 2010 altera corporation max v device handbook multivolt i/o operation max v devices allow the device core and i/o blocks to be powered-up with separate supply voltages. the vccint pins supply power to the device core and the vccio pins supply power to the device i/o buffers. the vccint pins are powered-up with 1.8 v for max v devices. all the vccio pins for a given i/o bank that have multivolt capability must be supplied from the same voltage level (for example, 5.0, 3.3, 2.5, 1.8, 1.5, or 1.2 v). figure 5?2 shows how to implement a multiple-voltage system for max v devices. 5.0-v device compatibility a max v device can drive a 5.0-v ttl device by connecting the vccio pins of the max v device to 3.3 v. this is possible because the output high voltage (v oh ) of a 3.3-v interface meets the minimum high-level voltage of 2.4 v of a 5.0-v ttl device. a max v device may not correctly interoperate with a 5.0-v cmos device if the output of the max v device is connected directly to the input of the 5.0-v cmos device. if the max v device?s v out is greater than v ccio , the pmos pull-up transistor still conducts if the pin is driving high, preventing an external pull-up resistor from pulling the signal to 5.0 v. to make max v device outputs compatible with 5.0-v cmos devices, configure the output pins as open-drain pins with the i/o clamp diode enabled and use an external pull-up resistor. figure 5?2. implementing a multi-voltage system with a max v device (note 1) , (2) notes to figure 5?2 : (1) max v devices can drive a 5.0-v transistor-to-transistor logic (ttl) input when v ccio = 3.3 v. to drive a 5.0-v cmos, you must have an open-drain setting with an internal i/o clamp diode and external resistor. (2) max v devices can be 5.0-v tolerant with the use of an external resistor and the internal i/o clamp diode on 5m1270z and 5m2210z devices. max v device 3.3-, 2.5-, 1.8-, 1.5-, 1.2-v device 5.0-v device 1.8-v power supply v ccint v ccio v ccio
5?4 chapter 5: using max v devices in multi-voltage systems 5.0-v device compatibility max v device handbook december 2010 altera corporation figure 5?3 shows max v device compatibility with 5.0-v cmos devices. the open-drain pin never drives high, only low or tri-state. when the open-drain pin is active, it drives low. when the open-drain pin is inactive, the pin is tri-stated and the trace pulls up to 5.0 v by the external resistor. the purpose of enabling the i/o clamp diode is to protect the max v device?s i/o pins. the 3.3-v v ccio supplied to the i/o clamp diodes causes the voltage at point a to clamp at 4.0 v, which meets the max v device?s reliability limits when the trace voltage exceeds 4.0 v. the device operates successfully because a 5.0-v input is within its input specification. 1 the i/o clamp diode is only supported in the 5m1270z and 5m2210z devices? i/o bank 3. you must have an external protection diode for the other i/o banks in the 5m1270z and 5m2210z devices and all the i/o pins in the 5m40z, 5m80z, 5m160z, 5m240z, and 5m570z devices. the pull-up resistor value must be small enough for a sufficient signal rise time, but large enough so that it does not violate the i ol (output low) specification of the max v devices. the maximum max v device i ol depends on the programmable drive strength of the i/o output. table 5?1 lists the programmable drive strength settings that are available for the 3.3-v lvttl/lvcmos i/o standard for max v devices. the quartus ii software uses the maximum current strength as the default setting. the pci i/o standard is always set to 20 ma with no alternate setting. figure 5?3. max v device compatibility with 5.0-v cmos devices note to figure 5?3 : (1) this diode is only active after power-up. max v devices require an external diode if driven by 5.0 v before power-up. v ccio 3.3 v v ccio 5.0 v 0.5 v model as r int v in vss v ccio r ext 5.0-v cmos device a v out open drain (1) table 5?1. 3.3-v lvttl/lvcmos programmable drive strength (part 1 of 2) i/o standard i oh /i ol current strength setting (ma) 3.3-v lvttl 16 8
chapter 5: using max v devices in multi-voltage systems 5?5 5.0-v device compatibility december 2010 altera corporation max v device handbook to compute the required value of r ext , first calculate the model of the open-drain transistors on the max v device. you can model this output resistor (r ext ) by dividing v ol by i ol (r ext = v ol /i ol ). table 5?2 lists the maximum v ol for the 3.3-v lvttl/lvcmos i/o standard for max v devices. f for more information about i/o standard specifications, refer to the dc and switching characteristics for max v devices chapter. select r ext so that the max v device?s i ol specification is not violated. you can compute the required pull-up resistor value of r ext by using the equation: r ext =(v cc /i ol )?r int . for example, if an i/o pin is configured as a 3.3-v lvttl with a 16 ma drive strength, given that the maximum power supply (v cc ) is 5.5 v, you can calculate the value of r ext as follows: this resistor value computation assumes worst-case conditions. you can adjust the r ext value according to the device configuration drive strength. additionally, if your system does not see a wide variation in voltage-supply levels, you can adjust these calculations accordingly. because max v devices are 3.3-v, 32-bit, 66-mhz pci compliant, the input circuitry accepts a maximum high-level input voltage (v ih ) of 4.0 v. to drive a max v device with a 5.0-v device, you must connect a resistor (r 2 ) between the max v device and the 5.0-v device. 3.3-v lvcmos 8 4 table 5?1. 3.3-v lvttl/lvcmos programmable drive strength (part 2 of 2) i/o standard i oh /i ol current strength setting (ma) table 5?2. 3.3-v lvttl/lvcmos maximum v ol i/o standard voltage (v) 3.3-v lvttl 0.45 3.3-v lvcmos 0.20 equation 5?1. r ext 5.5 v 0.45 v ? ?? 16 ma ---------------------------------------- - 315.6 ? ==
5?6 chapter 5: using max v devices in multi-voltage systems 5.0-v device compatibility max v device handbook december 2010 altera corporation figure 5?4 shows how to drive a max v pci-compliant device with a 5.0-v device. if v ccio for the max v devices is 3.3 v and you enabled the i/o clamp diode, the voltage at point b in figure 5?4 is 4.0 v, which meets the max v devices reliability limits when the trace voltage exceeds 4.0 v. to limit large current draw from the 5.0-v device, r 2 must be small enough for a fast signal rise time and large enough so that it does not violate the high-level output current (i oh ) specifications of the devices driving the trace. to compute the required value of r 2 , first calculate the model of the pull-up transistors on the 5.0-v device. you can model this output resistor (r 1 ) by dividing the 5.0-v device supply voltage (v cc ) by i oh : r 1 =v cc /i oh . figure 5?5 shows an example of typical output drive characteristics of a 5.0 v device. figure 5?4. driving a max v pci-compliant device with a 5.0-v device note to figure 5?4 : (1) this diode is only active after power-up. max v devices require an external diode if driven by 5.0 v before power-up. figure 5?5. output drive characteristics of a 5.0-v device v cc r 2 i i 5.0 v 0.5 v model as r 1 5.0-v device max v device v ccio v ccio 3.3 v pci clamp b (1) 150 90 5 4 3 2 1 30 60 120 135 v o o u tp u t v oltage ( v ) typical o u tp u t c u rrent (ma) i o i oh i ol v cci n t = 5.0 v v ccio = 5.0 v
chapter 5: using max v devices in multi-voltage systems 5?7 recommended operating conditions for 5.0-v compatibility december 2010 altera corporation max v device handbook as shown in figure 5?5 , r 1 = 5.0 v/135 ma. the values usually shown in the data sheets reflect typical operating conditions. subtract 20% from the data sheet value for guard band. when you subtract the 20% from the previous example, the r 1 value is 30. select r 2 so that the max v device?s i oh specification is not violated. for example, if the above device has a maximum i oh of 8 ma, given the i/o clamp diode, v in =v ccio + 0.7 v = 3.7 v. given that the maximum supply load of a 5.0-v device (v cc ) is 5.5 v, calculate value of r 2 as follows: this analysis assumes worst-case conditions. if your system does not see a wide variation in voltage-supply levels, you can adjust these calculations accordingly. because 5.0-v device tolerance in max v devices requires the use of the i/o clamp, and this clamp is activated only after power-up, 5.0-v signals may not be driven into the device until it is configured. the i/o clamp diode is only supported in the 5m1270z and 5m2210z devices? i/o bank 3. you must have an external protection diode for the other i/o banks for the 5m1270z and 5m2210z devices and all the i/o pins in the 5m40z, 5m80z, 5m160z, 5m240z, and 5m570z devices. recommended operating conditions for 5.0-v compatibility as mentioned earlier, a 5.0-v tolerance can be supported with the i/o clamp diode enabled with external series/pull-up resistance. to guarantee long term reliability of the device?s i/o buffer, there are restrictions on the signal duty cycle that drive the max v i/o, which is based on the maximum clamp current. ta b l e 5? 3 lists the maximum signal duty cycle for the 3.3-v v ccio given a pci clamp current-handling capability. equation 5?2. r 2 5.5 v 3.7 v ? ?? 8 ma 30 ? ? ?? ? 8ma ----------------------------------------------------------------------------------- - 194 ? == table 5?3. maximum signal duty cycle v in (v) (1) i ch (ma) (2) max duty cycle (%) 4.0 5.00 100 4.1 11.67 90 4.2 18.33 50 4.3 25.00 30 4.4 31.67 17 4.5 38.33 10 4.6 45.00 5 notes to table 5?3 : (1) v in is the voltage at the package pin. (2) the i ch is calculated with a 3.3-v v ccio . a higher v ccio value will have a lower i ch value with the same v in .
5?8 chapter 5: using max v devices in multi-voltage systems power-up sequencing max v device handbook december 2010 altera corporation 1 for signals with a duty cycle greater than 30% on max v input pins, altera recommends using a v ccio voltage of 3.0 v to guarantee long-term i/o reliability. for signals with a duty cycle less than 30%, the v ccio voltage can be 3.3 v. power-up sequencing max v devices are designed to operate in multi-voltage environments where it may be difficult to control power sequencing. therefore, max v devices are designed to tolerate any possible power-up sequence. either v ccint or v ccio can initially supply power to the device and 3.3-, 2.5-, 1.8-, 1.5-, or 1.2-v input signals can drive the devices without special precautions before v ccint or v ccio is applied. max v devices can operate with a v ccio voltage level that is higher than the v ccint level. when v ccio and v ccint are supplied from different power sources to a max v device, a delay between v ccio and v ccint may occur. normal operation does not occur until both power supplies are in their recommended operating range. when v ccint is powered-up, the ieee std. 1149.1 jtag circuitry is active. if tms and tck are connected to v ccio and v ccio is not powered-up, the jtag signals are left floating. thus, any transition on tck can cause the state machine to transition to an unknown jtag state, leading to incorrect operation when v ccio is finally powered-up. to disable the jtag state during the power-up sequence, pull tck low to ensure that an inadvertent rising edge does not occur on tck . document revision history ta b l e 5 ?4 lists the revision history for this chapter. table 5?4. document revision history date version changes december 2010 1.0 initial release.
max v device handbook may 2011 mv51006-1.1 subscribe ? 2011 altera corporation. all rights reserved. altera, arria, cyclone, hardcopy, max, megacore, nios, quartus and stratix are reg. u.s. pat. & tm. off. and/or trademarks of altera corporation in the u.s. and other countries. all other trademarks and service marks are the propert y of their respective holders as described at www.altera.com/common/legal.html . altera warrants performance of its semiconductor products to current specifications in accordance with altera?s standard warr anty, but reserves the right to make changes to any products and services at any time without notice. altera assumes no responsibility or liability arising out of the application or use of any information, product, or service described herein except as expressly agreed to in writing by altera. altera customers are advi sed to obtain the latest version of device specifications before relying on any published information and before placing orders for products or services. 6. jtag and in-system programmability in max v devices this chapter describes the ieee standard 1149.1 jtag bst circuitry that is supported in max ? v devices and how you can enable concurrent in-system programming of multiple devices in a minimum time with the ieee standard 1532 in-system programmability (isp). this chapter also describes the programming sequence, types of programming with the quartus ? ii software or external hardware, and design security. this chapter includes the following sections: ?ieee std. 1149.1 boundary-scan support? on page 6?1 ?in-system programmability? on page 6?5 ieee std. 1149.1 boundary-scan support all max v devices provide jtag bst circuitry that complies with the ieee std. 1149.1-2001 specification. you can only perform jtag boundary-scan testing after you have fully powered the v ccint and all v ccio banks and a certain amount of configuration time (t config ) have passed. for in-system programming, max v devices can use the jtag port with either the quartus ii software or hardware with programmer object file ( .pof) , jam ? standard test and programming language (stapl) format file ( .jam ), or jam byte code files ( .jbc ). jtag pins support 1.5-v, 1.8-v, 2.5-v, and 3.3-v i/o standards. the v ccio of the bank where it is located determines the supported voltage level and standard. the dedicated jtag pins reside in bank 1 of all max v devices. ta b l e 6 ?1 lists the jtag instructions supported in max v devices. table 6?1. jtag instructions for max v devices (part 1 of 2) jtag instruction instruction code description sample/preload 00 0000 0101 allows you to capture and examine a snapshot of signals at the device pins if the device is operating in normal mode. permits an initial data pattern to be an output at the device pins. extest (1) 00 0000 1111 allows you to test the external circuitry and board-level interconnects by forcing a test pattern at the output pins and capturing test results at the input pins. bypass 11 1111 1111 places the 1-bit bypass register between the tdi and tdo pins, which allows the boundary-scan test (bst) data to pass synchronously through target devices to adjacent devices during normal device operation. usercode 00 0000 0111 selects the 32-bit usercode register and places it between the tdi and tdo pins, allowing you to shift the usercode register out of the tdo pin serially. if you do not specify the usercode in the quartus ii software, the 32-bit usercode register defaults to all 1?s. may 2011 mv51006-1.1
6?2 chapter 6: jtag and in-system programmability in max v devices ieee std. 1149.1 boundary-scan support max v device handbook may 2011 altera corporation w you must not issue unsupported jtag instructions to the max v device because this may put the device into an unknown state, requiring a power cycle to recover device operation. idcode 00 0000 0110 selects the idcode register and places it between the tdi and tdo pins, allowing you to shift the idcode register out of the tdo pin serially. highz (1) 00 0000 1011 places the 1-bit bypass register between the tdi and tdo pins, which allows the bst data to pass synchronously through target devices to adjacent devices if the device is operating in normal mode and tri-stating all the i/o pins. clamp (1) 00 0000 1010 places the 1-bit bypass register between the tdi and tdo pins, which allows the bst data to pass synchronously through target devices to adjacent devices during normal device operation and holding i/o pins to a state defined by the data in the boundary-scan register. user0 00 0000 1100 allows you to define the scan chain between the tdi and tdo pins in the max v logic array. use this instruction for custom logic and jtag interfaces. user1 00 0000 1110 allows you to define the scan chain between the tdi and tdo pins in the max v logic array. use this instruction for custom logic and jtag interfaces. ieee 1532 instructions for the instruction codes of the ieee 1532 instructions, refer to the ieee 1532 b s dl files page of the altera website. ieee 1532 in-system concurrent (isc) instructions used if programming a max v device through the jtag port. note to table 6?1 : (1) highz , clamp , and extest instructions do not disable weak pull-up resistors or bus hold features. table 6?1. jtag instructions for max v devices (part 2 of 2) jtag instruction instruction code description
chapter 6: jtag and in-system programmability in max v devices 6?3 ieee std. 1149.1 boundary-scan support may 2011 altera corporation max v device handbook the max v device instruction register length is 10 bits and the usercode register length is 32 bits. table 6?2 and ta b l e 6 ?3 list the boundary-scan register length and device idcode information for max v devices. f for jtag direct current (dc) characteristics, refer to the dc and switching characteristics for max v devices chapter. table 6?2. boundary-scan register length for max v devices device boundary-scan register length 5m40z 240 5m80z 240 5m160z 240 5m240z (1) 240 5m240z (2) 480 5m570z 480 5m1270z (3) 636 5m1270z (4) 816 5m2210z 816 notes to table 6?2 : (1) not applicable to t144 package of the 5m240z device. (2) only applicable to t144 package of the 5m240z device. (3) not applicable to f324 package of the 5m1270z device. (4) only applicable to f324 package of the 5m1270z device. table 6?3. 32-bit idcode for max v devices device binary idcode (32 bits) (1) hex idcode version (4 bits) part number manufacturer identity (11 bits) lsb (1 bit) (2) 5m40z 0000 0010 0000 1010 0101 000 0110 1110 1 0x020a50dd 5m80z 0000 0010 0000 1010 0101 000 0110 1110 1 0x020a50dd 5m160z 0000 0010 0000 1010 0101 000 0110 1110 1 0x020a50dd 5m240z (3) 0000 0010 0000 1010 0101 000 0110 1110 1 0x020a50dd 5m240z (4) 0000 0010 0000 1010 0110 000 0110 1110 1 0x020a60dd 5m570z 0000 0010 0000 1010 0110 000 0110 1110 1 0x020a60dd 5m1270z (5) 0000 0010 0000 1010 0011 000 0110 1110 1 0x020a30dd 5m1270z (6) 0000 0010 0000 1010 0100 000 0110 1110 1 0x020a40dd 5m2210z 0000 0010 0000 1010 0100 000 0110 1110 1 0x020a40dd notes to table 6?2 : (1) the msb is on the left. (2) the lsb for idcode is always 1. (3) not applicable to t144 package of the 5m240z device. (4) only applicable to t144 package of the 5m240z device. (5) not applicable to f324 package of the 5m1270z device. (6) only applicable to f324 package of the 5m1270z device.
6?4 chapter 6: jtag and in-system programmability in max v devices ieee std. 1149.1 boundary-scan support max v device handbook may 2011 altera corporation f for more information about jtag bst, refer to the jtag boundary-scan testing for max v devices chapter. jtag block if you issue either the user0 or user1 instruction to the jtag test access port (tap) controller, the max v jtag block feature allows you to access the jtag tap controller and state signals. the user0 and user1 instructions bring the jtag boundary-scan chain ( tdi ) through the user logic instead of the boundary-scan cells (bscs) of max v devices. each user instruction allows for one unique user-defined jtag chain into the logic array. parallel flash loader max v devices have the ability to interface jtag to non-jtag devices and are suitable to use with the general flash memory devices that require programming during the in-circuit test. you can use the flash memory devices for fpga configuration or be part of the system memory. in many cases, you can use the max v device as a bridge device that controls configuration between fpga and flash devices. unlike isp-capable cplds, bulk flash devices do not have jtag tap pins or connections. for small flash devices, it is common to use the serial jtag scan chain of a connected device to program the non-jtag flash device but this is slow, inefficient, and impractical for large parallel flash devices. using the max v jtag block as a parallel flash loader (pfl) with the quartus ii software to program and verify flash contents provides a fast and cost-effective means of in-circuit programming during testing. f for more information about pfl, refer to the parallel flash loader megafunction user guide .
chapter 6: jtag and in-system programmability in max v devices 6?5 in-system programmability may 2011 altera corporation max v device handbook figure 6?1 shows how you can use the max v jtag block as a pfl. in-system programmability you can program max v devices in-system through the industry standard 4-pin ieee std. 1149.1 interface. isp offers quick and efficient iterations during design development and debugging cycles. the flash-based sram configuration elements configure the logic, circuitry, and interconnects in the max v architecture. each time the device is powered up, the configuration data is loaded into the sram elements. the process of loading the sram data is called configuration. the on-chip configuration flash memory (cfm) block stores the configuration data of the sram element. the cfm block stores the configuration pattern of your design in a reprogrammable flash array. during isp, the max v jtag and isp circuitry programs the design pattern into the non-volatile flash array of the cfm block. the max v jtag and isp controller internally generate the high programming voltages required to program the cfm cells, allowing in-system programming with any of the recommended operating external voltage supplies. you can configure the isp anytime after you have fully powered v ccint and all v ccio banks, and the device has completed the configuration power-up time. by default, during in-system programming, the i/o pins are tri-stated and weakly pulled-up to v ccio banks to eliminate board conflicts. the in-system programming clamp and real-time isp feature allow user control of the i/o state or behavior during isp. for more information, refer to ?in-system programming clamp? on page 6?7 and ?real-time isp? on page 6?8 . these devices also offer an isp_done bit that provides safe operation if in-system programming is interrupted. this isp_done bit, which is the last bit programmed, prevents all i/o pins from driving until the bit is programmed. figure 6?1. pfl for max v devices notes to figure 6?1 : (1) this block is implemented in logic elements (les). (2) this function is supported in the quartus ii software. pfl configuration logic flash memo r y device max v device dq[7..0] ry/by a[20..0] oe we ce dq[7..0] ry/by a[20..0] oe we ce tdi tms tck tdi_u tdo_u tms_u tck_u shift_u clkdr_u update_u runidle_u user1_u tdo al t e r a fpga conf_done nstatus nce dclk data0 nconfig (1), (2)
6?6 chapter 6: jtag and in-system programmability in max v devices in-system programmability max v device handbook may 2011 altera corporation ieee 1532 support the jtag circuitry and isp instruction set in max v devices are compliant to the ieee-1532-2002 programming specification. this provides industry-standard hardware and software for in-system programming among multiple vendor programmable logic devices (plds) in a jtag chain. f for more information about max v 1532 boundary-scan description language ( .bsd ) files, refer to the ieee 1532 bsdl files page of the altera website. jam standard test and programming language you can use the jam stapl to program max v devices with in-circuit testers, pcs, or embedded processors. the jam byte code is also supported for max v devices. these software programming protocols provide a compact embedded solution for programming max v devices. f for more information, refer to an 425: using command-line jam stapl solution for device programming . programming sequence during in-system programming, 1532 instructions, addresses, and data are shifted into the max v device through the tdi input pin. data is shifted out through the tdo output pin and compared with the expected data. to program a pattern into the device, follow these steps: 1. enter isp ?the enter isp stage ensures that the i/o pins transition smoothly from user mode to isp mode. 2. check id ?the silicon id is checked before any program or verify process. the time required to read this silicon id is relatively small compared to the overall programming time. 3. sector erase ?erasing the device in-system involves shifting in the instruction to erase the device and applying an erase pulse or pulses. the erase pulse is automatically generated internally by waiting in the run, test, or idle state for the specified erase pulse time of 500 ms for the cfm block and 500 ms for each sector of the user flash memory (ufm) block. 4. program ?programming the device in-system involves shifting in the address, data, and program instruction and generating the program pulse to program the flash cells. the program pulse is automatically generated internally by waiting in the run/test/idle state for the specified program pulse time of 75 s. this process is repeated for each address in the cfm and ufm blocks. 5. verify ?verifying a max v device in-system involves shifting in addresses, applying the verify instruction to generate the read pulse, and shifting out the data for comparison. this process is repeated for each cfm and ufm address. 6. exit isp ?an exit isp stage ensures that the i/o pins transition smoothly from isp mode to user mode.
chapter 6: jtag and in-system programmability in max v devices 6?7 in-system programmability may 2011 altera corporation max v device handbook a stand-alone verification of a programmed pattern involves only steps 1 , 2 , 5 , and 6 . these steps are automatically executed by third-party programmers, the quartus ii software, or the jam stapl and jam byte-code players. ta b l e 6 ?4 lists the programming times for max v devices with in-circuit testers to execute the algorithm vectors in hardware. because of data processing and data transfer limitations, software-based programming tools used with download cables are slightly slower. user flash memory programming the quartus ii software (with the use of .pof , .jam , or .jbc files) supports programming of the ufm block independent of the logic array design pattern stored in the cfm block. this allows updating or reading ufm contents through isp without altering the current logic array design, or vice versa. by default, these programming files and methods program the entire flash memory contents, which includes the cfm block and ufm contents. the stand-alone embedded jam stapl player and jam byte-code player provide action commands for programming or reading the entire flash memory (ufm and cfm together) or each independently. f for more information, refer to an 425: using the command-line jam stapl solution for device programming . in-system programming clamp by default, the ieee 1532 instruction used for entering isp automatically tri-states all i/o pins with weak pull-up resistors for the duration of the isp sequence. however, some systems may require certain pins on max v devices to maintain a specific dc logic level during an in-field update. for these systems, you can use the optional in- system programming clamp instruction in the max v circuitry to control i/o table 6?4. family programming times for max v devices description 5m40z/ 5m80z/ 5m160z/ 5m240z (1) 5m240z (2) 5m570z 5m1270z (3) 5m1270z (4) 5m2210z unit erase + program (1 mhz) 1.72 2.16 2.16 2.90 3.92 3.92 sec erase + program (10 mhz) 1.65 1.99 1.99 2.58 3.40 3.40 sec verify (1 mhz) 0.09 0.17 0.17 0.30 0.49 0.49 sec verify (10 mhz) 0.01 0.02 0.02 0.03 0.05 0.05 sec complete program cycle (1 mhz) 1.81 2.33 2.33 3.20 4.41 4.41 sec complete program cycle (10 mhz) 1.66 2.01 2.01 2.61 3.45 3.45 sec notes to table 6?4 : (1) not applicable to t144 package of the 5m240z device. (2) only applicable to t144 package of the 5m240z device. (3) not applicable to f324 package of the 5m1270z device. (4) only applicable to f324 package of the 5m1270z device.
6?8 chapter 6: jtag and in-system programmability in max v devices in-system programmability max v device handbook may 2011 altera corporation behavior during the isp sequence. the in-system programming clamp instruction allows the device to sample and sustain the value on an output pin (an input pin remains tri-stated if sampled) or to set a logic high, logic low, or tri-state value explicitly on any pin. setting these options is controlled on an individual pin basis with the quartus ii software. f for more information, refer to an 630: real-time isp and isp clamp for altera cplds . real-time isp for systems that require more than the dc logic level control of i/o pins, the real-time isp feature allows you to update the cfm block with a new design image, while the current design continues to operate in the sram logic array and i/o pins. a new programming file is updated into the max v device without halting the original operation of your design, saving down-time costs for remote or field upgrades. the updated cfm block configures the new design into the sram after the next power cycle. you can execute an immediate sram configuration without a power cycle with a specific sequence of isp commands. the sram configuration without a power cycle takes a specific amount of time (t config ). during this time, the i/o pins are tri-stated and weakly pulled-up to v ccio . design security all max v devices contain a programmable security bit that controls access to the data programmed into the cfm block. if this bit is programmed, you cannot copy or retrieve the design programming information stored in the cfm block. this feature provides a high-level design security because programmed data within flash memory cells is invisible. you can only reset the security bit that controls this function and other programmed data if the device is erased. the sram is also invisible and cannot be accessed regardless of the security bit setting. the security bit does not protect the ufm block data, and the ufm is accessible through jtag or logic array connections. programming with external hardware you can program max v devices by downloading the information through in-circuit testers, embedded processors, the altera ? byteblaster? ii, ethernetblaster ii, ethernetblaster, and usb-blaster? cables. you need to power up these cable?s v cc(trgt) with v ccio of bank 1. f for more information about the respective cables, refer to the cable & adapter drivers information page. bp microsystems, system general, and other programming hardware manufacturers provide programming support for altera devices. for device support information, refer to their websites.
chapter 6: jtag and in-system programmability in max v devices 6?9 document revision history may 2011 altera corporation max v device handbook document revision history ta b l e 6 ?5 lists the revision history for this chapter. table 6?5. document revision history date version changes may 2011 1.1 updated ?programming with external hardware? section. december 2010 1.0 initial release.
6?10 chapter 6: jtag and in-system programmability in max v devices document revision history max v device handbook may 2011 altera corporation
max v device handbook january 2011 mv51007-1.1 subscribe ? 2011 altera corporation. all rights reserved. altera, arria, cyclone, hardcopy, max, megacore, nios, quartus and stratix are reg. u.s. pat. & tm. off. and/or trademarks of altera corporation in the u.s. and other countries. all other trademarks and service marks are the propert y of their respective holders as described at www.altera.com/common/legal.html . altera warrants performance of its semiconductor products to current specifications in accordance with altera?s standard warr anty, but reserves the right to make changes to any products and services at any time without notice. altera assumes no responsibility or liability arising out of the application or use of any information, product, or service described herein except as expressly agreed to in writing by altera. altera customers are advi sed to obtain the latest version of device specifications before relying on any published information and before placing orders for products or services. 7. user flash memory in max v devices this chapter provides guidelines for user flash memory (ufm) applications by describing the features and functionality of the max ? v ufm block and the quartus ? ii altufm megafunction. altera ? max v devices feature a ufm block that can be used for storing non-volatile information up to 8 kbits, similar to a serial eeprom. the ufm provides an ideal storage solution that supports all protocols (serial peripheral interface (spi), parallel, and other protocols) for interfacing through bridging logic designed into the max v logic array. this chapter contains the following sections: ?ufm array description? on page 7?1 ?ufm functional description? on page 7?3 ?ufm operating modes? on page 7?8 ?programming and reading the ufm with jtag? on page 7?12 ?software support for ufm block? on page 7?13 ?creating memory content file? on page 7?39 ?simulation parameters? on page 7?43 ufm array description each ufm array is organized as two separate sectors with 4,096 bits per sector. each sector can be erased independently. ta b l e 7 ?1 lists the dimensions of the ufm array. table 7?1. ufm array size device total bits sectors address bits data width 5m40z 8,192 2 (4,096 bits per sector) 9 16 5m80z 8,192 2 (4,096 bits per sector) 9 16 5m160z 8,192 2 (4,096 bits per sector) 9 16 5m240z 8,192 2 (4,096 bits per sector) 9 16 5m570z 8,192 2 (4,096 bits per sector) 9 16 5m1270z 8,192 2 (4,096 bits per sector) 9 16 5m2210z 8,192 2 (4,096 bits per sector) 9 16 january 2011 mv51007-1.1
7?2 chapter 7: user flash memory in max v devices ufm array description max v device handbook january 2011 altera corporation memory organization map ta b l e 7 ?2 lists the memory organization for the max v ufm block. there are 512 locations with 9 bits addressing a range of 000h to 1ffh . each location stores 16-bit wide data. the msb of the address register indicates the sector in operation. using and accessing ufm storage you can use the ufm to store data of different memory sizes and data widths. even though the ufm storage width is 16 bits, you can implement different data widths or a serial interface with the altufm megafunction. table 7?3 lists the different data widths available for the three types of interfaces supported in the quartus ii software, as well as no interface. for more details about the logic array interface options in the altufm megafunction, refer to ?software support for ufm block? on page 7?13 . 1 the ufm block is accessible through the logic array interface and the jtag interface. however, the ufm logic array interface does not have access to the configuration flash memory (cfm) block. table 7?2. memory organization sector address range 1 100h 1ffh 0 000h 0ffh table 7?3. data widths for logic array interfaces logic array interfaces data widths (bits) interface types i 2 c8 serial spi 8 or 16 serial parallel options of 3 to 16 parallel none 16 serial
chapter 7: user flash memory in max v devices 7?3 ufm functional description january 2011 altera corporation max v device handbook ufm functional description figure 7?1 is the block diagram of the max v ufm block and the interface signals. ta b l e 7 ?4 lists the max v ufm block input and output interface signals. figure 7?1. ufm block and interface signals osc 4 program erase control ufm sector 1 ufm sector 0 : _ address register program erase osc_e n a rtp_busy busy osc data register ufm block drdin drdo u t arclk arshft ardin drclk drshft 16 16 9 table 7?4. ufm interface signals (part 1 of 2) port name port type description drdin input serial input to the data register. it is used to enter a data word when writing to the ufm. the data register is 16 bits wide and data is shifted serially from the lsb to the msb with each drclk . this port is required for writing, but unused if the ufm is in read-only mode. drclk input clock input that controls the data register. it is required and takes control when data is shifted from drdin to drdout or loaded in parallel from the flash memory. the maximum frequency for drclk is 10 mhz. drshft input signal that determines whether to shift the data register or load it on a drclk edge. a high value shifts the data from drdin into the lsb of the data register and from the msb of the data register out to drdout . a low value loads the value of the current address in the flash memory to the data register. ardin input serial input to the address register. it is used to enter the address of a memory location to read, program, or erase. the address register is 9 bits wide for the ufm size of 8,192 bits. arclk input clock input that controls the address register. it is required when shifting the address data from ardin into the address register or during the increment stage. the maximum frequency for arclk is 10 mhz. arshft input signal that determines whether to shift the address register or increment it on an arclk edge. a high value shifts the data from ardin serially into the address register. a low value increments the current address by 1. the address register rolls over to 0 when the address space is at the maximum.
7?4 chapter 7: user flash memory in max v devices ufm functional description max v device handbook january 2011 altera corporation f for more information about the interaction between the ufm block and the logic array of max v devices, refer to the max v device architecture chapter. program input signal that initiates a program sequence. on the rising edge, the data in the data register is written to the address pointed to by the address register. the busy signal asserts until the program sequence is completed. erase input signal that initiates an erase sequence. on a rising edge, the memory sector indicated by the msb of the address register is erased. the busy signal asserts until the erase sequence is completed. osc_ena input this signal turns on the internal oscillator in the ufm block. it is required when the osc output is used, but optional otherwise. if osc_ena is driven high, the internal oscillator is enabled and the osc output will toggle. if osc_ena is driven low, the internal oscillator is disabled and the osc output drives constant high. drdout output serial output of the data register. each time the drclk signal is applied, a new value is available. the drdout data depends on the drshft signal. when the drshft signal is high, drdout contains the new value that is shifted into the msb of the data register. if drshft is low, drdout contains the msb of the memory location read into the data register. busy output signal that indicates when the memory is busy performing a program or erase instruction. when it is high, the address and data register should not be clocked. the new program or erase instruction is not executed until the busy signal is deasserted. osc output output of the internal oscillator. it can be used to generate a clock to control user logic with the ufm. it requires an osc_ena input to produce an output. rtp_busy output this output signal is optional and only needed if the real-time isp feature is used. the signal is asserted high during real-time isp and stays in the run_state for 500 ms before initiating real-time isp to allow for the final read/erase/write operation. no read, write, erase, or address and data shift operations are allowed to be issued after the rtp_busy signal goes high. the data and address registers do not retain the contents of the last read or write operation for the ufm block during real-time isp. table 7?4. ufm interface signals (part 2 of 2) port name port type description
chapter 7: user flash memory in max v devices 7?5 ufm functional description january 2011 altera corporation max v device handbook ufm address register the max v ufm block is organized as a 512 16 memory. because the ufm block is organized into two sectors, the msb of the address indicates the sector that is used; 0 is for sector 0 (ufm0) while 1 is for sector 1 (ufm1). an erase instruction erases the content of the specific sector that is indicated by the msb of the address register. figure 7?2 shows the selection of the ufm sector using the msb of the address register. for more information about the erase mode, refer to ?erase? on page 7?11 . three control signals exist for the address register: arshft , arclk , and ardin . arshft is used as both a shift-enable control signal and an auto-increment signal. if the arshft signal is high, a rising edge on arclk loads address data serially from the ardin port and moves data serially through the register. a clock edge with the arshft signal low increments the address register by 1. this implements an auto-increment of the address to allow data streaming. when a program, read, or erase sequence is executing, the address that is in the address register becomes the active ufm location. figure 7?2. selection of the ufm sector using the msb of the address register 1 0 ardin arclk address register sector 0 sector 1 ufm block ufm block a0 a1 a2 a3 a4 a5 a6 a7 a 8 lsb msb
7?6 chapter 7: user flash memory in max v devices ufm functional description max v device handbook january 2011 altera corporation ufm data register the ufm data register is 16 bits wide with four control signals: drshft , drclk , drdin , and drdout . drshft distinguishes between clock edges that move data serially from drdin to drdout and clock edges that latch parallel data from the ufm sectors. if the drshft signal is high, a clock edge moves data serially through the registers from drdin to drdout . if the drshft signal is low, a clock edge captures data from the ufm sector pointed by the address register in parallel. the msb is the first bit that is seen at drdout . the data register drshft signal is also used to enable the ufm for reading data. when the drshft signal is low, the ufm latches data into the data register. figure 7?3 shows the ufm data register. ufm program/erase control block the ufm program/erase control block is used to generate all the control signals necessary to program and erase the ufm block independently. this block reduces the number of logic elements (les) necessary to implement a ufm controller in the logic array. it also guarantees correct timing of the control signals to the ufm. a rising edge on either program or erase signal causes this control signal block to activate and begin sequencing through the program or erase cycle. at this point, for a program instruction, the data currently in the data register is written to the address pointed to by the address register. only sector erase is supported by the ufm. when an erase command is executed, this control block erases the sector whose address is stored in the address register. when the program or erase command first activates the program/erase control block, the busy signal will be driven high to indicate an operation in progress in the ufm. after the program or erase algorithm is completed, the busy signal is forced low. figure 7?3. ufm data register lsb msb max v ufm block drdin drclk drdout data register d0 d1 d3 d4 d11 d12 d13 d14 d15 d5 d6 d7 d8 d9 d10 16 16 d2
chapter 7: user flash memory in max v devices 7?7 ufm functional description january 2011 altera corporation max v device handbook oscillator osc _ ena , one of the input signals in the ufm block, is used to enable the oscillator signal to output through the osc output port. you can use this osc output port to connect with the interface logic in the logic array. it can be routed through the logic array and fed back as an input clock for the address register ( arclk ) and the data register ( drclk ). the output frequency of the osc port is one-fourth that of the oscillator frequency. as a result, the frequency range of the osc port is 3.9 to 5.3 mhz. the maximum clock frequency accepted by arclk and drclk is 10 mhz and the duty cycle accepted by the drclk and arclk input ports is approximately 45% to 50%. when the osc _ ena input signal is asserted, the oscillator is enabled and the output is routed to the logic array through the osc output. when the osc _ ena signal is set low, the osc output drives constant high. the routing delay from the osc port of the ufm block to osc output pin depends on placement. you can analyze this delay using the timequest timing analyzer. the undivided internal oscillator, which is not accessible, operates in a frequency range from 15.6 to 21.2 mhz. the internal oscillator is enabled during power-up, in-system programming, and real-time isp. at all other times, the oscillator is not running unless the ufm is instantiated in the design and the osc _ ena port is asserted. to see how specific operating modes of the altufm megafunction handle osc _ ena and the oscillator, refer to ?software support for ufm block? on page 7?13 . for user- generated logic interfacing to the ufm, the oscillator must be enabled during program or erase operations, but not during read operations. the osc _ ena signal can be tied low if you are not issuing any program or erase commands. 1 during real-time isp operation, the internal oscillator automatically enables and outputs through the osc output port (if this port is instantiated) even though the osc _ ena signal is tied low. you can use the rtp _ busy signal to detect the beginning and ending of the real-time isp operation for gated control of this self-enabled osc output condition. 1 the internal oscillator is not enabled all the time. the internal oscillator for the program or erase operation is only activated when the flash memory block is being programmed or erased. during a read operation, the internal oscillator is activated whenever the flash memory block is reading data. instantiating the oscillator without the ufm you can use the max ii/max v oscillator megafunction selection in the megawizard ? plug-in manager to instantiate the ufm oscillator if you intend to use this signal without using the ufm memory block. figure 7?4 shows the altufm_osc megafunction instantiation in the quartus ii software. figure 7?4. the quartus ii altufm_osc megafunction
7?8 chapter 7: user flash memory in max v devices ufm operating modes max v device handbook january 2011 altera corporation this megafunction is in the i/o folder on page 2a of the megawizard plug-in manager. on page 3 of the max ii/max v oscillator megafunction, you have an option to choose to simulate the osc output port at its maximum or minimum frequency during the design simulation. the frequency chosen is only used as a timing parameter simulation and does not affect the real max v device osc output frequency. ufm operating modes there are three different modes for the ufm block: read/stream read program (write) erase during program mode, address and data can be loaded concurrently. you can manipulate the ufm interface controls as necessary to implement the specific protocol provided the ufm timing specifications are met. figure 7?5 through figure 7?8 show the control waveforms for accessing ufm in three different modes. for program mode ( figure 7?7 ) and erase mode ( figure 7?8 ), the program and erase signals can be asserted anytime after the address register and data register have been loaded. do not assert the read , program , and erase signals or shift data and address into the ufm after entering the real-time isp mode. you can use the rtp _ busy signal to detect the beginning and end of real-time isp operation and generate control logic to stop all ufm port operations. this user-generated control logic is only necessary for the altufm_none megafunction, which provides no auto-generated logic. the other interfaces for the altufm megafunction (altufm_parallel, altufm_spi, altufm_i2c) contain control logic to automatically monitor the rtp _ busy signal and will cease operations to the ufm when a real-time isp operation is in progress. 1 you can program the ufm or cfm block independently without overwriting the other block, which is not programmed. the quartus ii programmer provides the options to program the ufm and cfm blocks individually or together (the entire max v device). f for guidelines about using isp and real-time isp while using the ufm block within your design, refer to an 100: in-system programmability guidelines . f for a complete description of the device architecture, and for the specific values of the timing parameters listed in this chapter, refer to the max v device architecture chapter.
chapter 7: user flash memory in max v devices 7?9 ufm operating modes january 2011 altera corporation max v device handbook read/stream read the three control signals, program , erase , and busy are not required during a read or stream read operation. to perform a read operation, the address register must be loaded with the reference address where the data is or is going to be located in the ufm. the address register can be stopped from incrementing or shifting addresses from ardin by stopping the arclk clock pulse. drshft must be asserted low at the next rising edge of drclk to load the data from the ufm to the data register. to shift the bits from the register, 16 clock pulses must be provided to read 16-bit wide data. you can use drclk to control the read time or disable the data register by discontinuing the drclk clock pulse. figure 7?5 shows the ufm control waveforms during read mode. the ufm block can also perform a stream read operation, using the address increment feature to read continuously from the ufm. stream read mode is started by loading the base address into the address register. drshft must then be asserted low at the first rising edge of drclk to load data into the data register from the address pointed to by the address register. drshft will then assert high to shift out the 16-bit wide data with the msb out first. figure 7?6 shows the ufm control waveforms during stream read mode. figure 7?5. ufm read waveforms figure 7?6. ufm stream read waveforms t dco t dclk t dss t dsh t adh t ads t asu t aclk t ah arshft arclk ardin drshft drclk drdin drdout program erase busy 16 data bits 9 address bits osc_ena 16 data bits increment address 9 address bits increment address arshft arclk ardin drshft drclk drdin drdout program erase busy osc_ena
7?10 chapter 7: user flash memory in max v devices ufm operating modes max v device handbook january 2011 altera corporation program to program or write to the ufm, you must first perform a sequence to load the reference address into the address register. drshft must then be asserted high to load the data serially into the data register starting with the msb. loading an address into the address register and loading data into the data register can be done concurrently. after the 16 bits of data have been successfully shifted into the data register, the program signal must be asserted high to start writing to the ufm. on the rising edge, the data currently in the data register is written to the location currently in the address register. the busy signal is asserted until the program sequence is completed. the data and address register should not be modified until the busy signal is de-asserted, or the flash content will be corrupted. the program signal is ignored if the busy signal is asserted. when the program signal is applied at exactly the same time as the erase signal, the behavior is undefined and the flash content is corrupted. figure 7?7 shows the ufm waveforms during program mode. figure 7?7. ufm program waveforms t ads t asu t aclk t adh t ah t dds t dclk t dss t dsh t ddh t pb t bp t ppmx t oscs t osch 16 data bits 9 address bits arshft arclk ardin drshft drclk drdin drdout program erase busy osc_ena
chapter 7: user flash memory in max v devices 7?11 ufm operating modes january 2011 altera corporation max v device handbook erase the erase signal initiates an erase sequence to erase one sector of the ufm. the data register is not needed to perform an erase sequence. to indicate the sector of the ufm to be erased, the msb of the address register should be loaded with 0 to erase ufm sector 0, or 1 to erase ufm sector 1 ( figure 7?2 on page 7?5 ). on a rising edge of the erase signal, the memory sector indicated by the msb of the address register will be erased. the busy signal is asserted until the erase sequence is completed. the address register should not be modified until the busy signal is de-asserted to prevent the flash content from being corrupted. this erase signal is ignored when the busy signal is asserted. figure 7?8 illustrates the ufm waveforms during erase mode. 1 when the ufm sector is erased, it has 16-bit locations all filled with ffff . each ufm storage bit can be programmed only once between erase sequences. you can write to any word up to two times providing the second programming attempt at that location only adds 0s. 1s are mask bits for your input word that cannot overwrite 0s in the flash array. new 1s in the location can only be achieved by an erase. therefore, it is possible for you to perform byte writes because the ufm array is 16 bits for each location. figure 7?8. ufm erase waveforms 9 address bits t asu t aclk t ah t adh t ads t eb t epmx t oscs t osch t be arshft arclk ardin drshft drclk drdin drdo u t program erase busy osc_e n a
7?12 chapter 7: user flash memory in max v devices programming and reading the ufm with jtag max v device handbook january 2011 altera corporation programming and reading the ufm with jtag in max v devices, you can write data to or read data from the ufm using the ieee std. 1149.1 jtag interface. you can use a pc or unix workstation, the quartus ii programmer, or the byteblastermv tm or byteblaster tm ii parallel port download cable to download programmer object file ( .pof ), jam tm standard test and programming language (stapl) files ( .jam ), or jam byte-code files ( .jbc ) from the quartus ii software targeting the max v device ufm block. 1 the .pof , .jam , and .jbc files can be generated using the quartus ii software. jam files both .jam stapl and .jbc files support programming for the ufm block. jam players jam players read the descriptive information in jam files and translate them into data that programs the target device. jam players do not program a particular device architecture or vendor; they only read and understand the syntax defined by the jam file specification. in-field changes are confined to the jam file, not the jam player. as a result, you do not need to modify the jam player source code for each in-field upgrade. there are two types of jam players to accommodate the two types of jam files: an ascii jam stapl player and a jam stapl byte-code player. both ascii jam stapl player and jam stapl byte-code player are coded in the c programming language for 16-bit and 32-bit processors. f for information about ufm operation during isp, refer to an 100: in-system programmability guidelines .
chapter 7: user flash memory in max v devices 7?13 software support for ufm block january 2011 altera corporation max v device handbook software support for ufm block the altera quartus ii software includes sophisticated tools that fully utilize the advantages of the ufm block in max v devices, while maintaining simple, easy-to- use procedures that accelerate the design process. the following section describes how the altufm megafunction supports a simple design methodology for instantiating standard interface protocols for the ufm block, such as: i 2 c spi parallel none (altera serial interface) this section includes the megafunction symbol, the input and output ports, and a description of the megawizard plug-in manager options. refer to quartus ii help for the altufm megafunction altera hardware description language (ahdl) functional prototypes (applicable to verilog hdl), vhdl component declarations, and parameter descriptions. you can access this megafunction from the memory compiler directory on page 2a of the megawizard plug-in manager. the altufm megawizard plug-in manager has separate pages that apply to the max v ufm block. during compilation, the quartus ii compiler verifies the altufm parameters selected against the available logic array interface options, and any specific assignments. inter-integrated circuit inter-integrated circuit (i 2 c) is a bidirectional two-wire interface protocol, requiring only two bus lines: a serial data/address line (sda), and a serial clock line (scl). each device connected to the i 2 c bus is software addressable by a unique address. the i 2 c bus is a multi-master bus where more than one integrated circuit (ic) capable of initiating a data transfer can be connected to it, which allows masters to function as transmitters or receivers. the altufm_i2c megafunction features a serial, 8-bit bidirectional data transfer up to 100 kbits per second. with the altufm_i2c megafunction, the max v ufm and logic can be configured as a slave device for the i 2 c bus. the altufm megafunction?s i 2 c interface is designed to function similar to i 2 c serial eeproms. the quartus ii software supports four different memory sizes: (128 8) 1 kbits (256 8) 2 kbits (512 8) 4 kbits (1,024 8) 8 kbits i 2 c protocol the following defines the characteristics of the i 2 c bus protocol: only two bus lines are required: sda and scl. both sda and scl are bidirectional lines that remain high when the bus is free.
7?14 chapter 7: user flash memory in max v devices software support for ufm block max v device handbook january 2011 altera corporation data transfer can be initiated only when the bus is free. the data on the sda line must be stable during the high period of the clock. the high or low state of the data line can only change when the clock signal on the scl line is low. any transition on the sda line while the scl is high indicates a start or stop condition. ta b l e 7 ?5 lists the altufm_i2c megafunction input and output interface signals. start and stop condition the master always generates start (s) and stop (p) conditions. after the start condition, the bus is considered busy. only a stop (p) condition frees the bus. the bus stays busy if the repeated start (sr) condition is executed instead of a stop condition. in this occurrence, the start (s) and repeated start (sr) conditions are functionally identical. a high-to-low transition on the sda line while the scl is high indicates a start condition. a low-to-high transition on the sda line while the scl is high indicates a stop condition. figure 7?9 shows the start and stop conditions. table 7?5. altufm_i2c interface signals pin description function sda serial data/address line the bidirectional sda port is used to transmit and receive serial data from the ufm. the output stage of the sda port is configured as an open drain pin to perform the wired -and function. scl serial clock line the bidirectional scl port is used to synchronize the serial data transfer to and from the ufm. the output stage of the scl port is configured as an open drain pin to perform a wired -and function. wp write protect optional active high signal that disables the erase and write function for read/write mode. the altufm_i2c megafunction gives you an option to protect the entire ufm memory or only the upper half of memory. a 2 , a 1 , a 0 slave address input these inputs set the ufm slave address. the a 6 , a 5 , a 4 , a 3 slave address bits are programmable, set internally to 1010 by default. figure 7?9. start and stop conditions sda scl sda scl s p start condition stop condition
chapter 7: user flash memory in max v devices 7?15 software support for ufm block january 2011 altera corporation max v device handbook acknowledge acknowledged data transfer is a requirement of i 2 c. the master must generate a clock pulse to signify the acknowledge bit. the transmitter releases the sda line (high) during the acknowledge clock pulse. the receiver (slave) must pull the sda line low during the acknowledge clock pulse so that sda remains a stable low during the clock high period, indicating positive acknowledgement from the receiver. if the receiver pulls the sda line high during the acknowledge clock pulse, the receiver sends a not-acknowledge condition indicating that it is unable to process the last byte of data. if the receiver is busy (for example, executing an internally-timed erase or write operation), it will not acknowledge any new data transfer. figure 7?10 shows the acknowledge condition on the i 2 c bus. device addressing after the start condition, the master sends the address of the particular slave device it is requesting. the four most significant bits (msbs) of the 8-bit slave address are usually fixed while the next three significant bits (a 2 , a 1 , a 0 ) are device address bits that define which device the master is accessing. the last bit of the slave address specifies whether a read or write operation is to be performed. when this bit is set to 1, a read operation is selected. when this bit is set to 0, a write operation is selected. the four msbs of the slave address (a 6 , a 5 , a 4 , a 3 ) are programmable and can be defined on page 3 of the altufm megawizard plug-in manager. the default value for these four msbs is 1010 . the next three significant bits are defined using the three a 2 , a 1 , a 0 input ports of the altufm_i2c megafunction. you can connect these ports to input pins in the design file and connect them to switches on the board. the other option is to connect them to v cc and gnd primitives in the design file, which conserves pins. figure 7?11 shows the slave address bits. figure 7?10. acknowledge on the i 2 c bus data o u tp u t by transmitter data o u tp u t by recei v er scl from master s start condition clock pulse for acknowledgement acknowledge not acknowledge
7?16 chapter 7: user flash memory in max v devices software support for ufm block max v device handbook january 2011 altera corporation after the master sends a start condition and the slave address byte, the altufm_i2c logic monitors the bus and responds with an acknowledge (on the sda line) when its address matches the transmitted slave address. the altufm_i2c megafunction then performs a read or write operation to or from the ufm, depending on the state of the bit. byte write operation the master initiates a transfer by generating a start condition, then sending the correct slave address (with the r/w bit set to 0) to the slave. if the slave address matches, the altufm_i2c slave acknowledges on the ninth clock pulse. the master then transfers an 8-bit byte address to the ufm, which acknowledges the reception of the address. the master transfers the 8-bit data to be written to the ufm. after the altufm_i2c logic acknowledges the reception of the 8-bit data, the master generates a stop condition. the internal write from the max v logic array to the ufm begins only after the master generates a stop condition. while the ufm internal write cycle is in progress, the altufm_i2c logic ignores any attempt made by the master to initiate a new transfer. figure 7?12 shows the byte write sequence. figure 7?11. slave address bits notes to figure 7?11 : (1) for the 4-kbit memory size, the a 0 location in the slave address becomes the msb (a8) of the memory byte address. (2) for the 8-kbit memory size, the a 0 location in the slave address becomes a8 of the memory byte address, while the a 1 location in the slave address becomes the msb (a9) of the memory byte address. 1 4-k b it memory size (1) msb lsb 0 1 0 a 2 a 1 a 8 r/w 1 8 -k b it memory size (2) msb lsb 0 1 0 a 2 a9 a 8 r/w 1 1- or 2-k b it memory size msb lsb 0 1 0 a 2 a 1 a 0 r/w figure 7?12. byte write sequence s a byte address sla v e address a data a p from master to slave from slave to master r/w "0" (write) s ? start condition p ? stop condition a ? acknowledge
chapter 7: user flash memory in max v devices 7?17 software support for ufm block january 2011 altera corporation max v device handbook page write operation page write operation has a similar sequence as the byte write operation, except that several bytes of data are transmitted in sequence before the master issues a stop condition. the internal write from the max v logic array to the ufm begins only after the master generates a stop condition. while the ufm internal write cycle is in progress, the altufm_i2c logic ignores any attempt made by the master to initiate a new transfer. the altufm_i2c megafunction allows you to choose the page size of 8 bytes, 16 bytes, or 32 bytes for the page write operation. a write operation is only possible to an erased ufm block or word location. the ufm block differs from serial eeproms, requiring an erase operation before writing new data in the ufm block. a special erase sequence is required, as discussed in ?erase operation? . acknowledge polling the master can detect whether the internal write cycle is completed by polling for an acknowledgement from the slave. the master can re-send the start condition together with the slave address as soon as the byte write sequence is finished. the slave does not acknowledge if the internal write cycle is still in progress. the master can repeat the acknowledge polling and proceed with the next instruction after the slave acknowledges. write protection the altufm_i2c megafunction includes an optional write protection (wp) port available on page 4 of the altufm megawizard plug-in manager. in the megawizard plug-in manager, you can choose the wp port to protect either the full or upper half memory. when wp is set to 1, the upper half or the entire memory array (depending on the write protection level selected) is protected, and the write and erase operations are not allowed. the altufm_i2c megafunction acknowledges the slave address and memory address. after the master transfers the first data byte, the altufm_i2c megafunction sends a not-acknowledge condition to the master to indicate that the instruction will not execute. when wp is set to 0 , the write and erase operations are allowed. erase operation commercial serial eeproms automatically erase each byte of memory before writing into that particular memory location during a write operation. however, the max v ufm block is flash based and only supports sector erase operations. byte erase operations are not supported. when using read/write mode, a sector or full memory erase operation is required before writing new data into any location that previously contained data. the block cannot be erased when the altufm_i2c megafunction is in read-only mode. data can be initialized into memory for read/write and read-only modes by including a memory initialization file ( .mif ) or hexadecimal file ( .hex ) in the altufm megawizard plug-in manager. this data is automatically written into the ufm during device programming by the quartus ii software or third-party programming tool.
7?18 chapter 7: user flash memory in max v devices software support for ufm block max v device handbook january 2011 altera corporation the altufm_i2c megafunction supports four different erase operation methods shown on page 4 of the altufm megawizard plug-in manager: full erase (device slave address triggered) sector erase (byte address triggered) sector erase (a 2 triggered) no erase these erase options only work as described if that particular option is selected in the megawizard plug-in manager before compiling the design files and programming the device. only one option can be selected for the altufm_i2c megafunction. each erase option is discussed in more detail in the following sections. full erase (device slave address triggered) the full erase option uses the a 2 , a 1 , a 0 bits of the slave address to distinguish between an erase or read/write operation. this slave operation decoding occurs when the master transfers the slave address to the slave after generating the start condition. if the a 2 , a 1 , and a 0 slave address bits transmitted to the ufm slave equals 111 and the four remaining msbs match the rest of the slave addresses, then the full erase operation is selected. if the a 6 , a 5 , a 4 , a 3 a 2 , a 1 , and a 0 slave address bits transmitted to the ufm match its unique slave address setting, the read/write operation is selected and functions as expected. as a result, this erase option utilizes two slave addresses on the bus reserving a 6 , a 5 , a 4 , a 3 , 1, 1, 1 as the erase trigger. both sectors of the ufm block will be erased when the full erase operation is executed. this operation requires acknowledge polling. the internal ufm erase function only begins after the master generates a stop condition. figure 7?13 shows the full erase sequence triggered by using the slave address. if the memory is write-protected (wp = 1), the slave does not acknowledge the erase trigger slave address (a 6 , a 5 , a 4 , a 3 , 1, 1, 1) sent by the master. the master should then send a stop condition to terminate the transfer. the full erase operation will not be executed. figure 7?13. full erase sequence triggered using the slave address s sla v e address a 6 a 5 a 4 a 3 111 a p from master to slave from slave to master s ? start condition p ? stop condition a ? acknowledge r/w '0' (write)
chapter 7: user flash memory in max v devices 7?19 software support for ufm block january 2011 altera corporation max v device handbook sector erase (byte address triggered) this sector erase operation is triggered by defining a 7- to 10-bit byte address for each sector depending on the memory size. the trigger address for each sector is entered on page 4 of the altufm megawizard plug-in manager. when a write operation is executed targeting this special byte address location, the ufm sector that contains that byte address location is erased. this sector erase operation is automatically followed by a write of the intended write byte to that address. the default byte address location for ufm sector 0 erase is address 000. the default byte address location for ufm sector 1 erase is [(selected memory size)/2]. you can specify another byte location as the trigger-erase addresses for each sector. this sector erase operation supports up to eight ufm blocks or serial eeproms on the i 2 c bus. this sector erase operation requires acknowledge polling. sector erase (a 2 triggered) this sector erase operation uses the received a 2 slave address bit to distinguish between an erase or read/write operation. this slave operation decoding occurs when the master transmits the slave address after generating the start condition. if the a 2 bit received by the ufm slave is 1, the sector erase operation is selected. if the a 2 bit received is 0, the read/write operation is selected. while this reserves the a 2 bit as an erase or read/write operation bit, the a 0 and a 1 bits still act as slave address bits to address the ufm. with this erase option, there can be up to four ufm slaves cascaded on the bus for 1-kbit and 2-kbit memory sizes. only two ufm slaves can be cascaded on the bus for 4-kbit memory size, because a 0 of the slave address becomes the ninth bit (msb) of the byte address. after the slave acknowledges the slave address and its erase or read/write operation bit, the master can transfer any byte address within the sector that must be erased. the internal ufm sector erase operation only begins after the master generates a stop condition. figure 7?14 shows the sector erase sequence using the a 2 bit of the slave address. if the altufm_i2c megafunction is write-protected (wp=1), the slave does not acknowledge the byte address (that indicates the ufm sector to be erased) sent in by the master. the master should then send a stop condition to terminate the transfer and the sector erase operation will not be executed. figure 7?14. sector erase sequence indicated using the a 2 bit of the slave address note to figure 7?14 : (1) a 2 = 0 indicates a read/write operation is executed in place of an erase. here, the r/w bit determines whether it is a read or write operation. s sla v e address a 2 = '1' a byte address a p from master to slav e from slave to maste r s ? start condition p ? stop condition a ? acknowledge r/w '0' (write) (1)
7?20 chapter 7: user flash memory in max v devices software support for ufm block max v device handbook january 2011 altera corporation no erase the no erase operation never erases the ufm contents. this method is recommended when ufm does not require constant re-writing after its initial write of data. for example, if the ufm data is to be initialized with data during manufacturing using i 2 c, you may not require writing to the ufm again. in that case, you should use the no erase option and save le resources from being used to create erase logic. read operation the read operation is initiated in the same manner as the write operation except that the r/w bit must be set to 1. three different read operations are supported: current address read (single byte) random address read (single byte) sequential read (multi-byte) after each ufm data has been read and transferred to the master, the ufm address register is incremented for all single and multi-byte read operations. current address read this read operation targets the current byte location pointed to by the ufm address register. figure 7?15 shows the current address read sequence. figure 7?15. current address read sequence ?1? (read) sa data sla v e address p from master to slave from slave to master s ? start condition p ? stop condition a ? acknowledge r/w
chapter 7: user flash memory in max v devices 7?21 software support for ufm block january 2011 altera corporation max v device handbook random address read random address read operation allows the master to select any byte location for a read operation. the master first performs a ?dummy? write operation by sending the start condition, slave address, and byte address of the location it wishes to read. after the altufm_i2c megafunction acknowledges the slave and byte address, the master generates a repeated start condition, the slave address, and the r/w bit is set to 1. the altufm_i2c megafunction then responds with acknowledge and sends the 8-bit data requested. the master then generates a stop condition. figure 7?16 shows the random address read sequence. sequential read sequential read operation can be initiated by either the current address read operation or the random address read operation. instead of sending a stop condition after the slave has transmitted one byte of data to the master, the master acknowledges that byte and sends additional clock pulses (on the scl line) for the slave to transmit data bytes from consecutive byte addresses. the operation is terminated when the master generates a stop condition instead of responding with an acknowledge. figure 7?17 shows the sequential read sequence. figure 7?16. random address read sequence ?1? (read) ?0? (write) s sla v e address byte address sla v e address aasr data ap from master to slave from slave to master s ? start condition sr ? repeated start p ? stop condition a ? acknowledge r/ w r/ w figure 7?17. sequential read sequence ? ?0? (write) s sla v e address byte address sla v e address aasr a data a data p from master to slave from slave to master s ? start condition sr ? repeated start p ? stop condition a ? acknowledge r/w r/w ?1? (read) data (n - bytes) + acknowledgment (n - 1 bytes)
7?22 chapter 7: user flash memory in max v devices software support for ufm block max v device handbook january 2011 altera corporation altufm_i2c interface timing specification figure 7?18 shows the timing waveform for the altufm_i2c megafunction read/write mode. ta b l e 7 ?6 through ta b l e 7? 8 list the timing specification needed for the altufm_i2c megafunction read/write mode. figure 7?18. timing waveform for the altufm_i2c megafunction sda scl t su:sta t hd:sta t hd:dat t su:dat t su:sto t buf t lo w t high t sclsda table 7?6. i2c interface timing specification symbol parameter min max unit f scl scl clock frequency ? 100 khz t scl:sda scl going low to sda data out ? 15 ns t buf bus free time between a stop and start condition 4.7 ? s t hd:sta (repeated) start condition hold time 4 ? s t su:sta (repeated) start condition setup time 4.7 ? s t low scl clock low period 4.7 ? s t high scl clock high period 4 ? s t hd:dat sda data in hold time 0 ? ns t su:dat sda data in setup time 20 ? ns t su:sto stop condition setup time 4 ? ns table 7?7. ufm write cycle time parameter min max unit write cycle time ? 110 s table 7?8. ufm erase cycle time parameter min max unit sector erase cycle time ?501 ms full erase cycle time ? 1,002 ms
chapter 7: user flash memory in max v devices 7?23 software support for ufm block january 2011 altera corporation max v device handbook instantiating the i 2 c interface using the quartus ii altufm_i2c megafunction figure 7?19 shows the altufm_i2c megafunction symbol for a i 2 c interface instantiation in the quartus ii software. altufm_i2c megafunction is under the memory compiler folder on page 2a of the megawizard plug-in manager. on page 3, you can choose whether to implement the read/write or read only mode for the ufm. you also have an option to choose the memory size for the altufm_i2c megafunction as well as defining the four msbs of the slave address (default 1010). you can select the optional write protection and erase operation methods on page 4 of the altufm megawizard plug-in manager. 1 the ufm block?s internal oscillator is always running when the altufm_i2c megafunction is instantiated for both read-only and read/write interfaces. serial peripheral interface serial peripheral interface (spi) is a four-pin serial communication subsystem included on the motorola 6805 and 68hc11 series microcontrollers. it allows the microcontroller unit to communicate with peripheral devices, and is also capable of inter-processor communications in a multiple-master system. the spi bus consists of masters and slaves. the master device initiates and controls the data transfers and provides the clock signal for synchronization. the slave device responds to the data transfer request from the master device. the master device in an spi bus initiates a service request with the slave devices responding to the service request. with the altufm megafunction, the ufm and max v logic can be configured as a slave device for the spi bus. the osc _ ena is always asserted to enable the internal oscillator when the spi megafunction is instantiated for both read only and read/write interfaces. figure 7?19. altufm_i2c megafunction symbol for the i 2 c interface instantiation in the quartus ii software
7?24 chapter 7: user flash memory in max v devices software support for ufm block max v device handbook january 2011 altera corporation the quartus ii software supports both the base mode (uses 8-bit address and data) and the extended mode (uses 16-bit address and data). base mode uses only ufm sector 0 (2,048 bits), while extended mode uses both ufm sector 0 and sector 1 (8,192 bits). there are only four pins in spi: si , so , sck , and ncs . table 7?9 describes the spi pins and functions. data transmitted to the si port of the slave device is sampled by the slave device at the positive sck clock. data transmits from the slave device through so at the negative sck clock edge. when ncs is asserted, it means the current device is being selected by the master device from the other end of the spi bus for service. when ncs is not asserted, the si and sck ports should be blocked from receiving signals from the master device, and so should be in high impedance state to avoid causing contention on the shared spi bus. all instructions, addresses, and data are transferred with the msb first and start with high-to-low ncs transition. the circuit diagram is shown in figure 7?20 . table 7?9. spi interface signals pin description function si serial data input receive data serially. so serial data output transmit data serially. sck serial data clock the clock signal produced from the master device to synchronize the data transfer. ncs chip select active low signal that enables the slave device to receive or transfer data from the master device. figure 7?20. circuit diagram for spi interface read or write operations read, write, and erase state machine op-code decoder eight-bit status shift register address and data hub ufm block spi interface control logic si so sck ncs
chapter 7: user flash memory in max v devices 7?25 software support for ufm block january 2011 altera corporation max v device handbook opcodes ta b l e 7 ?1 0 lists the 8-bit instruction opcodes. after ncs is pulled low, the indicated opcode must be provided. otherwise, the interface assumes that the master device has internal logic errors and ignores the rest of the incoming signals. when ncs is pulled back to high, the interface is back to normal. ncs should be pulled low again for a new service request. the read and write opcodes are instructions for transmission, which means the data will be read from or written to the ufm. wren , wrdi , rdsr , and wrsr are instructions for the status register, where they do not have any direct interaction with ufm, but read or set the status register within the interface logic. the status register provides status on whether the ufm block is available for any read or write operation, whether the interface is write enabled, and the state of the ufm write protection. table 7?11 lists the status register format. for the read only implementation of altufm spi (base or extended mode), the status register does not exist, saving le resources. the following sections describe the instructions for spi. table 7?10. instruction set for spi name opcode operation wren 00000110 enable write to ufm wrdi 00000100 disable write to ufm rdsr 00000101 read status register wrsr 00000001 write status register read 00000011 read data from ufm write 00000010 write data to ufm sector-erase 00100000 sector erase ufm-erase 01100000 erase the entire ufm block (both sectors) table 7?11. status register format position status default at power-up description bit 7 x 0 ? bit 6 x 0 ? bit 5 x 0 ? bit 4 x 0 ? bit 3 bp1 0 indicate the current level of block write protection (1) bit 2 bp0 0 indicate the current level of block write protection (1) bit 1 wen 0 1= spi write enabled state 0= spi write disabled state bit 0 nrdy 0 1 = busy, ufm write or erase cycle in progress 0 = no ufm write or erase cycle in progress note to table 7?11 : (1) for more information about status register bits bp1 and bp0 , refer to table 7?12 and table 7?13 on page 7?34 .
7?26 chapter 7: user flash memory in max v devices software support for ufm block max v device handbook january 2011 altera corporation read read is the instruction for data transmission, where the data is read from the ufm block. when data transfer is taking place, the msb is always the first bit to be transmitted or received. the data output stream is continuous through all addresses until it is terminated by a low-to-high transition at the ncs port. the read operation is always performed through the following sequence in spi, as shown in figure 7?21 : 1. ncs is pulled low to indicate the start of transmission. 2. an 8-bit read opcode ( 00000011 ) is received from the master device. (if internal programming is in progress, read is ignored and not accepted). 3. a 16-bit address is received from the master device. the lsb of the address is received last. because the ufm block can take only nine bits of address maximum, the first seven address bits received are discarded. 4. data is transmitted for as many words as needed by the slave device through so for read operation. when the end of the ufm storage array is reached, the address counter rolls over to the start of the ufm to continue the read operation. 5. ncs is pulled back to high to indicate the end of transmission. for spi base mode, the read operation is always performed through the following sequence in spi: 1. ncs is pulled low to indicate the start of transmission. 2. an 8-bit read opcode ( 00000011 ) is received from the master device, followed by an 8-bit address. if internal programming is in progress, the read operation is ignored and not accepted. 3. data is transmitted for as many words as needed by the slave device through so for read operation. the internal address pointer automatically increments until the highest memory address is reached (address 255 only because the ufm sector 0 is used). the address counter will not roll over when address 255 is reached. the so output is set to high-impedance (z) when all eight data bits from address 255 have been shifted out through the so port. 4. ncs is pulled back to high to indicate the end of transmission. figure 7?21. read operation sequence for extended mode 0123 45678 9 10 11 20 21 22 23 24 25 26 27 36 37 38 39 ncs sck si so high impedance 03 h msb msb msb msb 16-bit data out 1 16-bit data out 2 8-bit instruction 16-bit address
chapter 7: user flash memory in max v devices 7?27 software support for ufm block january 2011 altera corporation max v device handbook figure 7?22 shows the read operation sequence for base mode. write write is the instruction for data transmission, where the data is written to the ufm block. the targeted location in the ufm block that will be written must be in the erased state ( ffffh ) before initiating a write operation. when data transfer is taking place, the msb is always the first bit to be transmitted or received. ncs must be driven high before the instruction is executed internally. you may poll the nrdy bit in the software status register for the completion of the internal self-timed write cycle. for spi extended mode, the write operation is always done through the following sequence, as shown in figure 7?23 : 1. ncs is pulled low to indicate the start of transmission. 2. an 8-bit write opcode ( 00000010 ) is received from the master device. if internal programming is in progress, the write operation is ignored and not accepted. 3. a 16-bit address is received from the master device. the lsb of the address will be received last. because the ufm block can take only nine bits of address maximum, the first seven address bits received are discarded. 4. a check is carried out on the status register (see table 7?11 ) to determine if the write operation has been enabled, and the address is outside of the protected region; otherwise, step 5 is bypassed. 5. one word (16 bits) of data is transmitted to the slave device through si . 6. ncs is pulled back to high to indicate the end of transmission. for spi base mode, the write operation is always performed through the following sequence in spi: 1. ncs is pulled low to indicate the start of transmission. 2. an 8-bit write opcode ( 00000010 ) is received. if the internal programming is in progress, the write operation is ignored and not accepted. 3. an 8-bit address is received. a check is carried out on the status register (see table 7?11 ) to determine if the write operation has been enabled, and the address is outside of the protected region; otherwise, step 4 is skipped. figure 7?22. read operation for base mode 123456789 10 11 12 13 14 15 16 17 18 19 ncs sck si so high impedance 03 h msb msb msb msb 8-bit data out 1 8-bit data out 2 8-bit instruction 8-bit 20 21 22 23 23 address
7?28 chapter 7: user flash memory in max v devices software support for ufm block max v device handbook january 2011 altera corporation 4. an 8-bit data is transmitted through si . 5. ncs is pulled back to high to indicate the end of transmission. figure 7?24 shows the write operation sequence for base mode. sector-erase sector-erase (se) is the instruction of erasing one sector of the ufm block. each sector contains 256 words. wen bit and the sector must not be protected for se operation to be successful. ncs must be driven high before the instruction is executed internally. you may poll the nrdy bit in the software status register for the completion of the internal self-timed sector-erase cycle. for spi extended mode, the se operation is performed in the following sequence, as shown in figure 7?25 : 1. ncs is pulled low. 2. opcode 00100000 is transmitted into the interface. 3. the 16-bit address is sent. the eighth bit (the first seven bits will be discarded) of the address indicates which sector is erased; a 0 means sector 0 (ufm0) is erased, and a 1 means sector 1 (ufm1) is erased. figure 7?23. write operation sequence for extended mode 0123 45678 9 10 11 20 21 22 23 24 25 26 27 36 37 38 39 ncs sck si so high impedance 02 h 16-bit data in msb msb msb 8-bit instruction 16-bit address figure 7?24. write operation sequence for base mode 0123 45678 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 ncs sck si so high impedance 02 h msb msb 8-bit data in 8-bit instruction 8-bit address
chapter 7: user flash memory in max v devices 7?29 software support for ufm block january 2011 altera corporation max v device handbook 4. ncs is pulled back to high. for spi base mode, the se instruction erases ufm sector 0. because there are no choices of ufm sectors to be erased, there is no address component to this instruction. the se operation is always done through the following sequence in spi base mode: 1. ncs is pulled low. 2. opcode 00100000 is transmitted into the interface. 3. ncs is pulled back to high. figure 7?26 shows the sector-erase operation sequence for base mode. figure 7?25. sector-erase operation sequence for extended mode figure 7?26. sector_erase operation sequence for base mode 0123 45678 9 10 11 20 21 22 23 ncs sck si so high impedance 20 h msb msb 8-bit instruction 16-bit address 0123 4567 ncs sck si so high impedance 20 h msb 8-bit instruction
7?30 chapter 7: user flash memory in max v devices software support for ufm block max v device handbook january 2011 altera corporation ufm-erase the ufm-erase (ce) instruction erases both ufm sector 0 and sector 1 for spi extended mode. while for spi base mode, the ce instruction has the same functionality as the sector-erase (se) instruction, which erases ufm sector 0 only. wen bit and the ufm sectors must not be protected for ce operation to be successful. ncs must be driven high before the instruction is executed internally. you may poll the nrdy bit in the software status register for the completion of the internal self-timed ce cycle. for both spi extended mode and base mode, the ce operation is performed in the following sequence as shown in figure 7?27 : 1. ncs is pulled low. 2. opcode 01100000 is transmitted into the interface. 3. ncs is pulled back to high. figure 7?27 shows the ufm-erase operation sequence. figure 7?27. ufm-erase operation sequence 0123 4567 ncs sck si so high impedance 60 h msb 8-bit instruction
chapter 7: user flash memory in max v devices 7?31 software support for ufm block january 2011 altera corporation max v device handbook wren (write enable) the interface is powered-up in the write disable state. therefore, wen in the status register (refer to ta b l e 7 ?11 ) is 0 at power-up. before any write is allowed to take place, wren must be issued to set wen in the status register to 1 . if the interface is in read-only mode, wren does not have any effect on wen , because the status register does not exist. after wen is set to 1, it can be reset by the wrdi instruction; the write and sector-erase instructions will not reset the wen bit. wren is issued through the following sequence, as shown in figure 7?28 : 1. ncs is pulled low. 2. opcode 00000110 is transmitted into the interface to set wen to 1 in the status register. 3. after the transmission of the eighth bit of wren , the interface is in wait state (waiting for ncs to be pulled back to high). any transmission after this is ignored. 4. ncs is pulled back to high. figure 7?28. wren operation sequence 0123 4567 ncs sck si so high impedance 06 h msb 8-bit instruction
7?32 chapter 7: user flash memory in max v devices software support for ufm block max v device handbook january 2011 altera corporation wrdi (write disable) after the ufm is programmed, wrdi can be issued to set wen back to 0 , disabling write and preventing inadvertent writing to the ufm. wrdi is issued through the following sequence, as shown in figure 7?29 : 1. ncs is pulled low. 2. opcode 00000100 is transmitted to set wen to 0 in the status register. 3. after the transmission of the eighth bit of wrdi , the interface is in wait state (waiting for ncs to be pulled back to high). any transmission after this is ignored. 4. ncs is pulled back to high. figure 7?29. wrdi operation sequence 0123 4567 ncs sck si so high impedance 04 h msb 8-bit instruction
chapter 7: user flash memory in max v devices 7?33 software support for ufm block january 2011 altera corporation max v device handbook rdsr (read status register) the content of the status register can be read by issuing rdsr . after rdsr is received, the interface outputs the content of the status register through the so port. although the four most significant bits (bit 7 to bit 4) do not hold valuable information, all eight bits in the status register will output through the so port. this allows future compatibility when bit 7 to bit 4 have new meaning in the status register. during the internal program cycle in the ufm, rdsr is the only valid opcode recognized by the interface (therefore, the status register can be read at any time), and nrdy is the only valid status bit. other status bits are frozen and remain unchanged until the internal program cycle is ended. rdsr is issued through the following sequence, as shown in figure 7?30 : 1. ncs is pulled low. 2. opcode 00000101 is transmitted into the interface. 3. si ignores incoming signals; so outputs the content of the status register, bit 7 first and bit 0 last. 4. if ncs is kept low, repeat step 3. 5. ncs is pulled back to high to terminate the transmission. figure 7?30. rdsr operation sequence status register out 0123 45678 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 ncs sck si so high impedance 05 h msb msb msb msb 8-bit instruction
7?34 chapter 7: user flash memory in max v devices software support for ufm block max v device handbook january 2011 altera corporation wrsr (write status register) the block protection bits (bp1 and bp0 ) are the status bits used to protect certain sections of the ufm from inadvertent write. the bp1 and bp0 status are updated by wrsr . during wrsr , only bp1 and bp0 in the status register can be written with valid information. the rest of the bits in the status register are ignored and not updated. when both bp1 and bp0 are 0 , there is no protection for the ufm. when both bp1 and bp0 are 1 , there is full protection for the ufm. bp0 and bp1 are set to 0 upon power-up. ta b l e 7 ?1 2 lists the block write protect bits for extended mode, while table 7?13 lists the block write protect bits for base mode. wrsr is issued through the following sequence, as shown in figure 7?31 : 1. ncs is pulled low. 2. opcode 00000001 is transmitted into the interface. 3. an 8-bit status is transmitted into the interface to update bp1 and bp0 of the status register. 4. if ncs is pulled high too early (before all the eight bits in step 2 or step 3 are transmitted) or too late (the ninth bit or more is transmitted), wrsr is not executed. 5. ncs is pulled back to high to terminate the transmission. figure 7?31. wrsr operation sequence table 7?12. block write protect bits for extended mode level status register bits ufm array address protected bp1 bp0 0 (no protection) 0 0 none 3 (full protection) 1 1 000 to 1ff table 7?13. block write protect bits for base mode level status register bits ufm array address protected bp1 bp0 0 (no protection) 0 0 none 3 (full protection) 1 1 000 to 0ff 0123 45678 9 10 11 12 13 14 15 ncs sck si so high impedance 01 h msb msb status register in 8-bit instruction
chapter 7: user flash memory in max v devices 7?35 software support for ufm block january 2011 altera corporation max v device handbook altufm spi timing specification figure 7?32 shows the timing specification needed for the spi extended mode (read/write). these ncs timing specifications do not apply to the spi extended read-only mode nor to any of the spi base modes. however, for the spi extended mode (read only) and the spi base mode (both read only and read/write), the ncs signal and sck are not allowed to toggle at the same time. table 7?14 lists the timing parameters that only apply to the spi extended mode (read/write). instantiating spi using quartus ii altufm_spi megafunction figure 7?33 shows the altufm_spi megafunction symbol for spi instantiation in the quartus ii software. altufm_spi megafunction is under the memory compiler folder on page 2a of the megawizard plug-in manager. on page 3, you can choose whether to implement the read/write or read only mode as the access mode for the ufm. you can also select the configuration mode (base or extended) for spi on this page. you can specify the initial content of the ufm block on page of the altufm megawizard plug-in manager as discussed in ?creating memory content file? on page 7?39 . 1 the ufm block?s internal oscillator is always running when the altufm_spi megafunction is instantiated for read/write interface. the ufm block?s internal oscillator is disabled when the altufm_spi megafunction is instantiated for read only interface. figure 7?32. spi timing waveform ncs sck t h n cshigh t n cs2sck t sck2 n cs table 7?14. spi timing parameters for extended mode symbol description minimum (ns) maximum (ns) t sck2ncs the time required for the sck signal falling edge to ncs signal rising edge 50 ? t hncshigh the time that the ncs signal must be held high 600 ? t ncs2sck the time required for the ncs signal falling edge to sck signal rising edge 750 ? figure 7?33. altufm_spi megafunction symbol for spi instantiation
7?36 chapter 7: user flash memory in max v devices software support for ufm block max v device handbook january 2011 altera corporation parallel interface this interface allows for parallel communication between the ufm block and outside logic. after the read request, write request, or erase request is asserted (active low assertion), the outside logic or device (such as a microcontroller) can continue its operation while the data in the ufm is retrieved, written, or erased. during this time, the nbusy signal is driven ?low? to indicate that it is not available to respond to any further request. after the operation is complete, the nbusy signal is brought back to ?high? to indicate that it is now available to service a new request. if it was the read request, the data _ valid is driven ?high? to indicate that the data at the do port is the valid data from the last read address. asserting read , write , and erase at the same time is not allowed. multiple requests are ignored and nothing is read from, written to, or erased in the ufm block. there is no support for sequential read and page write in the parallel interface. for both the read only and the read/write modes of the parallel interface, osc _ ena is always asserted, enabling the internal oscillator. ta b l e 7 ?1 5 lists the parallel interface pins and functions. even though the altufm megafunction allows you to select the address widths range from 3 bits to 9 bits, the ufm block always expects a full 9 bits for the width of the address register. therefore, the altufm megafunction will always pad the remaining lsbs of the address register with '0's if the register width selected is less than 9 bits. the address register will point to sector 0 if the address received at the address register starts with a '0'. the address register will point to sector 1 if the address received starts with a '1'. even though you can select an optional data register width of 3 to 16 bits using the altufm megafunction, the ufm block always expects full 16 bits width for the data register. reading from the data register always proceeds from msb to lsb. the altufm megafunction always pads the remaining lsbs of the data register with 1s if the user selects a data width of less than 16-bits. table 7?15. parallel interface signals pin description function di[15..0] 16-bit data input receive 16-bit data in parallel. you can select an optional width of 3 to 16 bits using the altufm megafunction. do[15..0] 16-bit data output transmit 16-bit data in parallel. you can select an optional width of 3 to 16 bits using the altufm megafunction. addr[8..0] address register operation sequence refers to the data that is pointed to by the address register. you can determine the address bus width using the altufm megafunction. nread read instruction signal initiates a read sequence. nwrite write instruction signal initiates a write sequence. nerase erase instruction signal initiates a sector-erase sequence indicated by the msb of the addr[] port. nbusy busy signal driven low to notify that it is not available to respond to any further request. data_valid data valid driven high to indicate that the data at the do port is the valid data from the last read address for read request.
chapter 7: user flash memory in max v devices 7?37 software support for ufm block january 2011 altera corporation max v device handbook altufm parallel interface timing specification figure 7?34 shows the timing specifications for the parallel interface. table 7?16 lists the parallel interface instruction signals. the nread , nwrite , and nerase signals are active low signals. instantiating parallel interface using quartus ii altufm_parallel megafunction figure 7?35 shows the altufm_parallel megafunction symbol for a parallel interface instantiation in the quartus ii software. figure 7?34. parallel interface timing waveform nb u sy command data or address b u s t comma n d t h n busy t hbus table 7?16. parallel interface timing parameters symbol description minimum (ns) maximum (ns) t command the time required for the command signal ( nread / nwrite / nerase ) to be asserted and held low to initiate a read/write/erase sequence 600 3,000 t hnbusy maximum delay between command signal?s falling edge to the nbusy signal?s falling edge ? 300 t hbus the time that the data and address buses must be present at the data input and address register ports after the command signal has been asserted low 600 ? figure 7?35. altufm_parallel megafunction symbol for parallel interface instantiation
7?38 chapter 7: user flash memory in max v devices software support for ufm block max v device handbook january 2011 altera corporation altufm_parallel megafunction is under the memory compiler folder on page 2a of the megawizard plug-in manager. on page 3, you can choose whether to implement the read/write or read only mode for the ufm. you also have an option to choose the width for address bus (up to 9 bits) and for the data bus (up to 16 bits). you can specify the initial content of the ufm block on page 4 of the altufm megawizard plug-in manager as discussed in ?creating memory content file? on page 7?39 . 1 the ufm block?s internal oscillator is always running when the altufm_parallel megafunction is instantiated for read/write interface. the ufm block?s internal oscillator is disabled when the altufm_parallel megafunction is instantiated for a read only interface. none (altera serial interface) select none for the interface protocol to use the dedicated ufm serial interface. the built-in ufm interface uses 13 pins for the communication. the functional description of the 13 pins are described in table 7?4 on page 7?3 . you can produce your own interface design to communicate to/from the dedicated ufm interface and implement it in the logic array. instantiating none using quartus ii altufm_none megafunction figure 7?36 shows the altufm_none megafunction symbol for none instantiation in the quartus ii software. altufm_none megafunction is under the memory compiler folder on page 2a of the megawizard plug-in manager. you can specify the initial content of the ufm block on page 3 of the altufm megawizard plug-in manager as discussed in ?creating memory content file? . figure 7?36. altufm_none megafunction symbol for none instantiation
chapter 7: user flash memory in max v devices 7?39 creating memory content file january 2011 altera corporation max v device handbook creating memory content file you can initialize the content of the ufm through a memory content file. the quartus ii software supports two types of initial memory content file format: memory initialization file ( .mif ) and hexadecimal file ( .hex ). a new memory content file for the ufm block can be created by clicking new on the file menu. select the .mif or .hex file in the other files tab. after clicking ok , a dialog box appears. in this dialog box, the number of words represents the numbers of address lines while the word size represents the data width. to create a memory content file for the altufm megafunction, enter 512 for the number of words and 16 for the word size. the memory content is written into a .hex file. on the tools menu, click megawizard plug-in manager . the memory content file ( data.hex ) is included on the respective altufm megawizard plug-in manager. click yes to use this file for the memory content file. click browse to include the memory content file. memory initialization for the altufm_parallel megafunction for the parallel interface, if a .hex file is used to initialize the memory content for the altufm megafunction, you must fully specify all 16 bits in each memory address, regardless of the data width selected. if your data width is less than 16 bits wide, your data must be placed in the msbs of the data word and the remaining lsbs must be padded with 1?s. for an example, if address _ width = 3 and data _ width = 8 are selected for the altufm_parallel megafunction, the .hex file should contain eight addresses of data (2 3 addresses), each word containing 16 bits. if the initial content at the location 000 is intended to be 10101010 , you should specify 1010101011111111 for address 000 in the .hex file. 1 this specification applies only to .hex files used with the parallel interface. .mif s do not require you to fully specify 16 bits for each data word. however, both .mif and .hex files require you to specify all addresses of data according to the address _ width selected in the megafunction. memory initialization for the altufm_spi megafunction the same 16-bit data padding mentioned for altufm_parallel is required for .hex files used with the spi base (8 bits) and extended (16 bits) mode interface. in addition, for spi base and extended modes, you must fully specify memory content for all 512 addresses (both sector 0 and sector 1) in the .mif and .hex files, even if sector 1 is not used. you can put valid data for spi base mode addresses 0 to 255 (sector 0), and initialize sector 1 to all ones.
7?40 chapter 7: user flash memory in max v devices creating memory content file max v device handbook january 2011 altera corporation memory initialization for the altufm_i2c megafunction the max v ufm physical memory block contains a 16-bit wide and 512 deep (9-bit address) array. the altufm_i2c megafunction uses the following smaller array sizes: an 8-bit wide and 128 deep (7-bit address) mapping for 1 kbit memory size an 8-bit wide and 256 deep (8-bit address) mapping for 2 kbits memory size an 8-bit wide and 512 deep (9-bit address) mapping for 4 kbits memory size an 8-bit wide and 1,024 deep (10-bit address) mapping for 8 kbits memory size altera recommends that you pad the .mif or .hex file for both address and data width to fill the physical memory map for the ufm block and ensure the .mif or .hex file represents a full 16-bit word size and a 9-bit address space. memory map for 1-kbit memory initialization figure 7?37 shows the memory map initialization for the altufm_i2c megafunction of 1-kbit memory size. the altufm_i2c megafunction byte address location of 00h to 3fh is mapped to the ufm block address location of 000h to 03fh . the altufm_i2c megafunction byte address location of 40h to 7fh is mapped to the ufm block address location of 1c0h to 1ffh . altera recommends that you pad the unused address locations of the ufm block with all 1 s. figure 7?37. memory map for 1-kbit memory initialization upper half ? addresses 40h to 7fh lower half ? addresses 00h to 3fh 00h 000h 3fh 03fh 40h 7fh 1c0h 1ffh address 40h in logical memory maps to 1c0h in the mif/hex file. address 7fh in logical memory maps to 1ffh in the mif/hex file, and all data in between follows the order in the logical memory address 00h in logical memory maps to address 000h in the mif/hex file. address 3fh in logical memory maps to 03fh in the mif/hex file, and all data in between follows the order in the logical memory 040h 1bfh this section of the ufm is unused ? the mif/hex file contents should be set to all ' 1 ' for addresses 040h to 1bfh 1-kbit altufm_i2c megafunction logical memory contents mif or hex file contents ? to represent the actual data and address size for the ufm block
chapter 7: user flash memory in max v devices 7?41 creating memory content file january 2011 altera corporation max v device handbook memory map for 2-kbit memory initialization figure 7?38 shows the memory map initialization for the altufm_i2c megafunction of 2 kbits of memory. the altufm_i2c megafunction byte address location of 00h to 7fh is mapped to the ufm block address location of 000h to 07fh . the altufm_i2c megafunction byte address location of 80h to ffh is mapped to the ufm block address location of 180h to 1ffh . altera recommends that you pad the unused address location of the ufm block with all 1 s. figure 7?38. memory map for 2-kbit memory initialization upper half ? addresses 80h to ffh lower half ? addresses 00h to 7fh 00h 000h 7fh 07fh 80h ffh 180h 1ffh address 80h in logical memory maps to address 180h in the mif/hex file. ffh in logical memory maps to 1ffh in the mif/hex file, and all data in between follows the order in the logical memory address 00h in logical memory maps to address 000h in the mif/hex file. address 7fh in logical memory maps to 07fh in the mif/hex file, and all data in between follows the order in the logical memory 080h 17fh this section of the ufm is unused ? the mif/hex file contents should be set to all ' 1 ' for addresses 080h to 17fh 2-kbit altufm_i2c megafunction logical memory contents mif or hex file contents ? to represent the actual data and address size for the ufm block
7?42 chapter 7: user flash memory in max v devices creating memory content file max v device handbook january 2011 altera corporation memory map for 4-kbit memory initialization figure 7?39 shows the memory map initialization for the altufm_i2c megafunction of 4-kbit memory. the altufm_i2c megafunction byte address location of 00h to ffh is mapped to the ufm block address location of 000h to 0ffh . the altufm_i2c megafunction byte address location of 100h to 1ffh is mapped to the ufm block address location of 100h to 1ffh . memory map for 8-kbit memory initialization figure 7?40 shows the memory map initialization for the altufm_i2c megafunction of 8-kbit memory. the altufm_i2c megafunction of 8-kbit memory fully utilizes all the memory locations in the ufm block. figure 7?39. memory map for 4-kbit memory initialization upper half ? addresses 100h to 1ffh lower half ? addresses 00h to ffh 00h 000h ffh 0ffh 100h 1ffh 100h 1ffh address 100h in logical memory maps to 100h in the mif/hex file. address 1ffh in logical memory maps to 1ffh in the mif/hex file, and all data in between follows the order in the logical memory address 00h in logical memory maps to 000h in the mif/hex file. address ffh in logical memory maps to 0ffh in the mif/hex file, and all data in between follows the order in the logical memory 4-kbit altufm_i2c megafunction logical memory contents mif or hex file contents ? to represent the data and address size for the ufm block figure 7?40. memory map for 8-kbit memory initialization 000h 0ffh 100h 1ffh 200h 2ffh 300h 3ffh upper 8-bit (byte) lower 8-bit (byte) 16-bit data in ufm 000h 0ffh 100h 1ffh 8-kbit altufm_i2c megafunction logical memory contents upper quarter addresses 300h to 3ffh mid-upper quarter addresses 200h to 2ffh mid-lower quarter addresses 100h to 1ffh lower quarter addresses 000h to 0ffh mif or hex file contents - to represent the actual data and address size for the ufm block the upper quarter of logical memory maps to the upper byte of sector 1. address 300h in logical memory maps to address 100h in physical memory and all addresses follow the order in logical memory. the mid-upper quarter of logical memory maps to the lower byte of sector 1. address 200h in logical memory maps to address 100h in physical memory and all addresses follow the order in logical memory. the lower quarter of logical memory maps to the lower byte of sector 0. address 000h in logical memory maps to address 000h in physical memory and all addresses follow the order in logical memory. the mid-lower quarter of logical memory maps to the lower byte of sector 0. address 100h in logical memory maps to address 000h in physical memory and all addresses follow the order in logical memory.
chapter 7: user flash memory in max v devices 7?43 simulation parameters january 2011 altera corporation max v device handbook padding data into memory map the altufm_i2c megafunction uses the upper 8 bits of the ufm 16-bit word; therefore, the 8 least significant bits should be padded with 1s, as shown in figure 7?41 . simulation parameters in the altufm megafunction, you have an option to simulate the osc output port at the maximum or the minimum frequency during the design simulation. the frequency chosen is only used as the timing parameter for the quartus ii simulator and does not affect the real max v device osc output frequency. document revision history ta b l e 7 ?1 7 lists the revision history for this chapter. figure 7?41. padding data into memory map 8 - b it v alid data to b e placed in the u pper b yte pad the lo w er b yte w ith eight '1's 1 0 1 0 1 0 1 0 1 1 1 1 1 1 1 1 table 7?17. document revision history date version changes january 2011 1.1 updated ?oscillator? section. december 2010 1.0 initial release.
7?44 chapter 7: user flash memory in max v devices document revision history max v device handbook january 2011 altera corporation
max v device handbook december 2010 mv51008-1.0 subscribe ? 2010 altera corporation. all rights reserved. altera, arria, cyclone, hardcopy, max, megacore, nios, quartus and stratix are reg. u.s. pat. & tm. off. and/or trademarks of altera corporation in the u.s. and other countries. all other trademarks and service marks are the propert y of their respective holders as described at www.altera.com/common/legal.html . altera warrants performance of its semiconductor products to current specifications in accordance with altera?s standard warr anty, but reserves the right to make changes to any products and services at any time without notice. altera assumes no responsibility or liability arising out of the application or use of any information, product, or service described herein except as expressly agreed to in writing by altera. altera customers are advi sed to obtain the latest version of device specifications before relying on any published information and before placing orders for products or services. 8. jtag boundary-scan testing in max v devices this chapter describes the ieee std.1149.1 (jtag) boundary-scan testing for altera ? max ? v devices. the ieee std. 1149.1 bst circuitry available in max v devices provides a cost-effective and efficient way to test systems that contain devices with tight lead spacing. circuit boards with altera and other ieee std. 1149.1-compliant devices can use extest , sample / preload , and bypass modes to create serial patterns that internally test the pin connections between devices and check device operation. as pcbs become more complex, the requirement for thorough testing becomes increasingly important. advances in surface-mount packaging and pcb manufacturing have resulted in smaller boards, making traditional test methods (for example, external test probes and ?bed-of-nails? test fixtures) harder to implement. as a result, cost savings from pcb space reductions are sometimes offset by cost increases in traditional testing methods. in the 1980s, jtag developed a specification for boundary-scan testing that was later standardized as the ieee std. 1149.1 spec ification. this boundary-scan test (bst) architecture offers the capability to efficiently test components on pcbs with tight lead spacing. bst architecture can test pin connections without using physical test probes and capture functional data while a device is operating normally. boundary-scan cells (bscs) in a device can force signals onto pins, or capture data from pin or core logic signals. forced test data is serially shifted into the bscs. captured data is serially shifted out and externally compared to expected results. figure 8?1 shows the concept of boundary-scan testing. this chapter describes the following topics: ?ieee std. 1149.1 bst architecture? on page 8?2 ?ieee std. 1149.1 boundary-scan register? on page 8?3 ?ieee std. 1149.1 bst operation control? on page 8?6 ?i/o voltage support in the jtag chain? on page 8?13 ?boundary-scan test for programmed devices? on page 8?14 figure 8?1. ieee std. 1149.1 boundary-scan testing core logic serial data in bo un da r y-sca n cell ic core logic serial data out i n te r co nn ectio n to be te s ted jtag device 1 jtag device 2 pi n sig n al december 2010 mv51008-1.0
8?2 chapter 8: jtag boundary-scan testing in max v devices ieee std. 1149.1 bst architecture max v device handbook december 2010 altera corporation ?disabling ieee std. 1149.1 bst circuitry? on page 8?15 ?guidelines for ieee std. 1149.1 boundary-scan testing? on page 8?15 ?boundary-scan description language support? on page 8?15 in addition to bst, you can use the ieee std. 1149.1 controller for in-system programming for max v devices. max v devices support ieee 1532 programming, which uses the ieee std. 1149.1 test access port (tap) interface. however, this chapter only describes the bst feature of the ieee std. 1149.1 circuitry. ieee std. 1149.1 bst architecture a max v device operating in ieee std. 1149.1 bst mode uses four required pins, tdi , tdo , tms , and tck . ta b l e 8 ?1 lists the functions of each of these pins. max v devices do not have a trst pin. the ieee std. 1149.1 bst circuitry requires the following registers: the instruction register determines which action to perform and which data register to access. the bypass register (which is a 1-bit long data register) provides a minimum-length serial path between the tdi and tdo pins. the boundary-scan register that is a shift register composed of all the bscs of the device. table 8?1. ieee std. 1149.1 pin descriptions pin description function tdi (1) test data input serial input pin for instructions as well as test and programming data. data is shifted in on the rising edge of tck . tdo test data output serial data output pin for instructions as well as test and programming data. data is shifted out on the falling edge of tck . the pin is tri-stated if data is not being shifted out of the device. tms (1) test mode select input pin that provides the control signal to determine the transitions of the tap controller state machine. transitions within the state machine occur at the rising edge of tck . therefore, you must set up the tms before the rising edge of tck . tms is evaluated on the rising edge of tck . tck (2) test clock input the clock input to the bst circuitry. some operations occur at the rising edge, while others occur at the falling edge. notes to table 8?1 : (1) the tdi and tms pins have internal weak pull-up resistors ? (2) the tck pin has an internal weak pull-down resistor ?
chapter 8: jtag boundary-scan testing in max v devices 8?3 ieee std. 1149.1 boundary-scan register december 2010 altera corporation max v device handbook figure 8?2 shows a functional model of the ieee std. 1149.1 circuitry. the tap controller controls the ieee std. 1149.1 boundary-scan testing, as described in ?ieee std. 1149.1 bst operation control? on page 8?6 . the tms and tck pins operate the tap controller and the tdi and tdo pins provide the serial path for the data registers. the tdi pin also provides data to the instruction register, which then generates the control logic for the data registers. ieee std. 1149.1 boundary-scan register the boundary-scan register is a large serial shift register that uses the tdi pin as an input and the tdo pin as an output. the boundary-scan register consists of 3-bit peripheral elements that are associated with the i/o pins of the max v devices. you can use the boundary-scan register to test the external pin connections or to capture internal data. figure 8?2. ieee std. 1149.1 circuitry note to figure 8?2 : (1) for the boundary-scan register length in max v devices, refer to the jtag and in- s ystem programmability in max v devices chapter. a updateir clockir shiftir updatedr clockdr shiftdr tdi instruction register bypass register boundary-scan register (1) instruction decode tms tck ta p controller isp registers tdo data registers device id register
8?4 chapter 8: jtag boundary-scan testing in max v devices ieee std. 1149.1 boundary-scan register max v device handbook december 2010 altera corporation figure 8?3 shows how test data is serially shifted around the periphery of the ieee std. 1149.1 device. boundary-scan cells of a max v device i/o pin except for the four jtag pins and power pins, you can use all the pins of a max v device (including clock pins) as user i/o pins and have a bsc. the 3-bit bsc consists of a set of capture registers and a set of update registers. the capture registers can connect to internal device data through the outj and oej signals, while the update registers connect to external data through the pin _ out and pin _ oe signals. the tap controller internally generates the shift , clock , and update global control signals for the ieee std. 1149.1 bst registers; a decode of the instruction register generates the mode signal. the data signal path for the boundary-scan register runs from the serial data in ( sdi ) signal to the serial data out ( sdo ) signal. the scan register begins at the tdi pin and ends at the tdo pin of the device. figure 8?3. boundary-scan register tck tms tap controller tdi internal logic tdo each pe r iphe r al eleme n t i s eithe r a n i/o pi n , dedicated i n p u t pi n , o r dedicated co n fig ur atio n pi n .
chapter 8: jtag boundary-scan testing in max v devices 8?5 ieee std. 1149.1 boundary-scan register december 2010 altera corporation max v device handbook figure 8?4 shows the user i/o bsc for max v devices. ta b l e 8 ?2 lists the capture and update register capabilities of all bsc within max v devices. jtag pins and power pins max v devices do not have bscs for dedicated jtag pins ( tdi , tdo , tms , and tck ) and power pins ( vccint , vccio , gndint , and gndio ). figure 8?4. user i/o bsc with ieee std. 1149.1 bst circuitry for max v devices mode highz pin_in pin_oe pin_out pin output buffer inj oej outj sdo update clock shift sdi dq input 0 1 dq oe dq oe 0 1 dq output dq output 0 1 0 1 0 1 capt ur e regi s te rs update regi s te rs global sig n al s 0 1 f r om o r to device i/o cell ci r c u it r y a n d/o r logic co r e table 8?2. bsc description for max v devices (note 1) pin type captures drives notes output capture register oe capture register input capture register output update register oe update register input update register user i/o outj oej pin_in pin_out pin_oe ? includes user clocks note to table 8?2 : (1) tdi , tdo , tms , and tck pins and all vcc and gnd pin types do not have bscs.
8?6 chapter 8: jtag boundary-scan testing in max v devices ieee std. 1149.1 bst operation control max v device handbook december 2010 altera corporation ieee std. 1149.1 bst operation control max v devices implement the sample / preload , extest , bypass , idcode , usercode , clamp and highz ieee std. 1149.1 bst instructions. the length of the bst instructions is 10 bits. these instructions are described in detail later in this chapter. f for a summary of the bst instructions and their instruction codes, refer to the jtag and in-system programmability in max v devices chapter. the ieee std. 1149.1 tap controller, a 16-state state machine clocked on the rising edge of tck , uses the tms pin to control ieee std. 1149.1 operation in the device. figure 8?5 shows the tap controller state machine. figure 8?5. ieee std. 1149.1 tap controller state machine select_dr_scan capture_dr shift_dr exit1_dr pause_dr exit2_dr update_dr shift_ir exit1_ir pause_ir exit2_ir update_ir tms = 0 tms = 0 tms = 0 tms = 1 tms = 0 tms = 1 tms = 1 tms = 0 tms = 1 tms = 0 tms = 1 tms = 1 tms = 0 tms = 0 tms = 1 tms = 1 tms = 0 tms = 1 tms = 0 tms = 0 tms = 1 tms = 0 tms = 0 tms = 1 tms = 0 run_test/ idle tms = 0 test_logic/ reset tms = 1 tms = 0 tms = 1 tms = 1 tms = 1 tms = 1 capture_ir select_ir_scan
chapter 8: jtag boundary-scan testing in max v devices 8?7 ieee std. 1149.1 bst operation control december 2010 altera corporation max v device handbook when the tap controller is in the test _ logic/reset state, the bst circuitry is disabled, the device is in normal operation, and the instruction register is initialized with idcode as the initial instruction. during device power up, the tap controller starts in this test _ logic/reset state. in addition, the tap controller may be forced to the test _ logic/reset state by holding tms high for five tck clock cycles. after the test _ logic/reset state, the tap controller remains in this state as long as tms continues to be held high while tck is clocked. figure 8?6 shows the timing requirements for the ieee std. 1149.1 signals. to start the ieee std. 1149.1 operation, select an instruction mode by advancing the tap controller to the shift instruction register ( shift _ ir ) state and shift in the appropriate instruction code on the tdi pin. figure 8?7 shows the entry of the instruction code into the instruction register. from the reset state, tms is clocked with the pattern 01100 to advance the tap controller to shift _ ir state. figure 8?6. ieee std. 1149.1 timing waveforms (note 1) note to figure 8?6 : (1) for timing parameter values, refer to the dc and s witching characteristics for max v devices chapter. tdi tms tdo tck signal to be captured signal to be driven t jcp t jpsu t jph t jch t jcl t jpzx t jpco t jssu t jsh t jszx t jsco t jsxz t jpxz figure 8?7. selecting the instruction mode select_dr_scan select_ir_scan capture_ir run_test/idle exit1_ir tck tms tdi tdo tap_state test_logic/reset shift_ir
8?8 chapter 8: jtag boundary-scan testing in max v devices ieee std. 1149.1 bst operation control max v device handbook december 2010 altera corporation the tdo pin is tri-stated in all states except the shift _ ir and shift _ dr states. the tdo pin is activated at the first falling edge of tck after entering either of the shift states and is tri-stated at the first falling edge of tck after leaving either of the shift states. when the shift _ ir state is activated, tdo is no longer tri-stated, and the initial state of the instruction register is shifted out on the falling edge of tck . tdo continues to shift out the contents of the instruction register as long as the shift _ ir state is active. the tap controller remains in the shift _ ir state as long as tms remains low. during the shift _ ir state, an instruction code is entered by shifting data on the tdi pin on the rising edge of tck . you must clock the last bit of the opcode at the same time that the next state, exit1 _ ir , is activated; exit1 _ ir is entered by clocking a logic high on tms . after in the exit1 _ ir state, tdo becomes tri-stated again. tdo is always tri-stated except in the shift _ ir and shift _ dr states. after an instruction code is entered correctly, the tap controller advances to perform the serial shifting of test data in one of three modes ( sample / preload , extest , or bypass ). for max v devices, there are weak pull-up resistors for tdi and tms , and pull-down resistors for tck . however, in a jtag chain, there might be some devices that do not have internal pull-up or pull-down resistors. in this case, altera recommends pulling the tms pin high (through an external 10-k ? resistor), and pulling tck low (through an external 1-k ? resistor) during bst or in-system programmability (isp) to prevent the tap controller from going into an unintended state. pulling-up the tdi signal externally for the max v device is optional. f for more information about the pull-up and pull-down resistors, refer to an 100: in-system programmability guidelines . sample/preload instruction mode sample/preload instruction mode allows you to take a snapshot of device data without interrupting normal device operation. however, sample/preload instruction mode is most often used to preload the test data into the update registers before loading the extest instruction. during the capture phase, multiplexers preceding the capture registers select the active device data signals and clocked data into the capture registers. the multiplexers at the outputs of the update registers also select active device data to prevent functional interruptions to the device. during the shift phase, the boundary-scan shift register is formed by clocking data through capture registers around the device periphery and then out of the tdo pin. new test data can simultaneously be shifted into tdi and replace the contents of the capture registers. during the update phase, data in the capture registers is transferred to the update registers.you can then use this data in extest instruction mode. for more information, refer to ?extest instruction mode? on page 8?10 .
chapter 8: jtag boundary-scan testing in max v devices 8?9 ieee std. 1149.1 bst operation control december 2010 altera corporation max v device handbook figure 8?8 shows the capture, shift, and update phases of sample/preload mode. sample/preload instruction code shifts in through the tdi pin. the tap controller advances to the capture _ dr state and then to the shift _ dr state, where it remains if tms is held low. the data shifted out of the tdo pin consists of the data that was present in the capture registers after the capture phase. new test data shifted into the tdi pin appears at the tdo pin after being clocked through the entire boundary-scan register. figure 8?8. ieee std. 1149. 1 bst sample/preload mode mode highz pin_in pin_oe pin_out pin output buffer inj oej outj sdo update clock shift sdi dq input 0 1 dq oe dq oe 0 1 dq output dq output 0 1 0 1 0 1 capt ur e regi s te rs update regi s te rs global sig n al s 0 1 mode highz pin_in pin_oe pin_out pin output buffer inj oej outj sdo update clock shift sdi dq input 0 1 dq oe dq oe 0 1 dq output dq output 0 1 0 1 0 1 capt ur e regi s te rs update regi s te rs global sig n al s 0 1 (cap t u r e phase) (shif t and upda t e phase)
8?10 chapter 8: jtag boundary-scan testing in max v devices ieee std. 1149.1 bst operation control max v device handbook december 2010 altera corporation figure 8?9 shows that the test data that shifted into tdi does not appear at the tdo pin until after the capture register data that is shifted out. if tms is held high on two consecutive tck clock cycles, the tap controller advances to the update _ dr state for the update phase. if you enable the device output enable feature but the dev _ oe pin is not asserted during boundary-scan testing, the output enable boundary-scan registers of the bscs capture data from the core of the device during sample/preload . these values are not high impedance, although the i/o pins are tri-stated. figure 8?9 shows the sample/preload waveforms. extest instruction mode use extest instruction mode to check the external pin connections between devices. unlike sample/preload mode, extest allows test data to be forced onto the pin signals. by forcing known logic high and low levels on output pins, you can detect opens and shorts at pins of any device in the scan chain. extest selects data differently than sample/preload . extest chooses data from the update registers as the source of the output and output enable signals. after the extest instruction code is entered, the multiplexers select the update register data; thus, you can force the data stored in these registers from a previous extest or sample/preload test cycle onto the pin signals. in the capture phase, the results of this test data are stored in the capture registers and then shifted out of tdo during the shift phase. you can store the new test data in the update registers during the update phase. figure 8?9. sample/preload shift data register waveforms data s to r ed i n bo un da r y- s ca n r egi s te r i s s hifted o u t of tdo. update_ir shift_dr select_dr_scan capture_dr exit1_ir exit1_dr update_dr tck tms tdi tdo tap_state i ns t ru ctio n code shift_ir afte r bo un d r y- s ca n r egi s te r data ha s bee n s hifted o u t, data e n te r ed i n to tdi will s hift o u t of tdo.
chapter 8: jtag boundary-scan testing in max v devices 8?11 ieee std. 1149.1 bst operation control december 2010 altera corporation max v device handbook figure 8?10 shows the capture, shift, and update phases of extest mode. figure 8?10. ieee std. 1149.1 bst extest mode mode highz pin_in pin_oe pin_out pin output buffer inj oej outj sdo update clock shift sdi dq input 0 1 dq oe dq oe 0 1 dq output dq output 0 1 0 1 0 1 capt ur e regi s te rs update regi s te rs global sig n al s 0 1 (cap t u r e phase) mode highz pin_in pin_oe pin_out pin output buffer inj oej outj sdo update clock shift sdi dq input 0 1 dq oe dq oe 0 1 dq output dq output 0 1 0 1 0 1 capt ur e regi s te rs update regi s te rs global sig n al s 0 1 (shif t and upda t e phase)
8?12 chapter 8: jtag boundary-scan testing in max v devices ieee std. 1149.1 bst operation control max v device handbook december 2010 altera corporation figure 8?11 resembles the sample/preload waveform diagram, except that the instruction code for extest is different. the data shifted out of tdo consists of the data that was present in the capture registers after the capture phase. new test data shifted into the tdi pin appears at the tdo pin after being clocked through the entire boundary-scan register. bypass instruction mode you can activate bypass instruction mode with an instruction code made up of only ones. figure 8?12 shows how scan data passes through a device after the tap controller is in the shift _ dr state. in this state, data signals are clocked into the bypass register from tdi on the rising edge of tck and out of tdo on the falling edge of the same clock pulse. idcode instruction mode use idcode instruction mode to identify the devices in an ieee std. 1149.1 chain. when you select idcode , the device identification register loads with the 32-bit vendor-defined identification code. the device id register is connected between the tdi and tdo ports and the device idcode is shifted out. f idcode instruction mode for max v devices are listed in the jtag and in-system programmability in max v devices chapter. figure 8?11. extest shift data register waveforms data s to r ed i n bo un da r y- s ca n r egi s te r i s s hifted o u t of tdo. update_ir shift_dr select_dr_scan capture_dr exit1_ir exit1_dr update_dr tck tms tdi tdo tap_state i ns t ru ctio n code shift_ir afte r bo un d r y- s ca n r egi s te r data ha s bee n s hifted o u t, data e n te r ed i n to tdi will s hift o u t of tdo. figure 8?12. bypass shift data register waveforms data s hifted i n to tdi o n the r i s i n g edge of tck i s s hifted o u t of tdo o n the falli n g edge of the s ame tck p u l s e. update_ir select_dr_scan capture_dr exit1_ir exit1_dr update_dr shift_dr i ns t ru ctio n code tck tms tdi tdo tap_state shift_ir bit 2 bit 3 bit 1 bit 2 bit n bit 1
chapter 8: jtag boundary-scan testing in max v devices 8?13 i/o voltage support in the jtag chain december 2010 altera corporation max v device handbook usercode instruction mode use usercode instruction mode to examine the user electronic signature (ues) within the devices along an ieee std. 1149.1 chain. when you select this instruction, the device identification register is connected between the tdi and tdo ports. the user- defined ues shifts into the device id register in parallel from the 32-bit usercode register. the ues then shifts out through the device id register. the usercode information is only available after the device is successfully configured. non-volatile usercode data is written to the configuration flash memory (cfm) block and then written to the sram at power up. the usercode instruction reads the data values from the sram. when you use real-time isp to update the cfm block and write new usercode data, executing the usercode instruction returns the usercode of the current running design (stored in the sram), not the new usercode data. the usercode of the new design (stored in the cfm) can only be read back correctly if a power cycle or forced sram download has transpired after the real-time isp update. in the quartus ? ii software, there is an auto usercode feature where you can choose to use the checksum value of a programming file as the jtag user code. if selected, the checksum is automatically loaded to the usercode register. to enable the auto usercode feature, follow these steps: 1. on the assignments menu, click device . 2. in the device dialog box, click device and pin options and click the general tab. 3. turn on auto usercode . clamp instruction mode use clamp instruction mode to allow the state of the signals driven from the pins to be determined from the boundary-scan register while the bypass register is selected as the serial path between the tdi and tmv51008.fmdo ports. data held in the boundary- scan register completely defines the state of all signals driven from the output pins. however, clamp instruction mode will not override the i/o weak pull-up resistor or the i/o bus hold if you have any of them selected. highz instruction mode use highz instruction mode to set all of the user i/o pins to an inactive drive state. these pins are tri-stated until you execute a new jtag instruction. when you select this instruction, the bypass register is connected between the tdi and tdo ports. highz instruction mode will not override the i/o weak pull-up resistor or i/o bus hold if you have any of them selected. i/o voltage support in the jtag chain there can be several different altera or non-altera devices in a jtag chain. however, you must pay attention to whether or not the chain contains devices with different v ccio levels. the tdo pin of a device drives out at the voltage level according to the v ccio of the device. for max v devices, the tdo pin drives out at the voltage level according to the v ccio of i/o bank 1. although the devices may have different v ccio
8?14 chapter 8: jtag boundary-scan testing in max v devices boundary-scan test for programmed devices max v device handbook december 2010 altera corporation levels, the devices can interface with each other. for example, a device with 3.3-v v ccio can drive to a device with 5.0-v v ccio because 3.3 v meets the minimum v ih on transistor-to-transistor logic (ttl)-level input for the 5.0-v v ccio device. jtag pins on max v devices can support 1.5-, 1.8-, 2.5-, or 3.3-v input levels, depending on the v ccio voltage of i/o bank 1. f for more information about multivolt i/o support, refer to the max v device architecture chapter. you can interface the tdi and tdo lines of the jtag pins of devices that have different v ccio levels by inserting a level shifter between the devices. if possible, the jtag chain must be built such that a device with a higher v ccio level drives to a device with an equal or lower v ccio level. by building the jtag chain in this manner, a level shifter may be required only to shift the tdo level to a level acceptable to the jtag tester. figure 8?13 shows the jtag chain of mixed voltages and how a level shifter is inserted in the chain. boundary-scan test for programmed devices for a programmed device, the input buffers are turned off by default for i/o pins that are set as output only in the design file. you cannot sample on the programmed device output pins with the default boundary-scan description language (bsdl) file when the input buffers are turned off. for boundary-scan testing, you can set the quartus ii software to always enable the input buffers on a programmed device so it behaves the same as an unprogrammed device, allowing sample function on output pins in the design. this aspect can cause slight increase in standby current as the unused input buffer is always on. to enable the unused input buffers on a programmed device, follow these steps: 1. on the assignments menu, click settings. 2. under category , select assembler . 3. turn on always enable input buffers . figure 8?13. jtag chain of mixed voltages 2.5-v v ccio 1.8-v v cc i o 1.8-v v ccio tdi tdo tester shift tdo to level accepted by te s te r if nece ss a r y m us t be 5.0-v tole r a n t m us t be 3.3-v tole r a n t m us t be 2.5-v tole r a n t 1.5-v v ccio m us t be 1.8-v tole r a n t level shifter 3.3-v v ccio 5.0-v v ccio
chapter 8: jtag boundary-scan testing in max v devices 8?15 disabling ieee std. 1149.1 bst circuitry december 2010 altera corporation max v device handbook disabling ieee std. 1149.1 bst circuitry you can enable the ieee std. 1149.1 bst circuitry for max v devices after device powers up. you must enable this circuitry only if you use the bst or isp features. this section describes how to disable the ieee std. 1149.1 circuitry to ensure that the circuitry is not inadvertently enabled when it is not required. ta b l e 8 ?3 lists the pin connections necessary for disabling jtag in max v devices that have dedicated ieee std. 1149.1 pins. guidelines for ieee std. 1149.1 boundary-scan testing when performing boundary-scan testing with ieee std. 1149.1 devices, use the following guidelines: if a pattern (for example, a 10-bit 1010101010 pattern) does not shift out of the instruction register through the tdo pin during the first clock cycle of the shift _ ir state, the proper tap controller state has not been reached. to solve this problem, try one of the following procedures: verify that the tap controller has reached the shift _ ir state correctly. to advance the tap controller to the shift _ ir state, return to the reset state and clock the code 01100 on the tms pin. check the connections to the vcc , gnd , and jtag pins on the device. perform a sample/preload test cycle before the first extest test cycle to ensure that known data is present at the device pins when extest mode is entered. if the oej update register contains a 0 , the data in the outj update register will be driven out. the state must be known and correct to avoid contention with other devices in the system. do not perform extest and sample/preload tests during isp. these instructions are supported before and after isp but not during isp. 1 if problems persist, contact technical support . boundary-scan description language support the bsdl?a subset of vhdl?provides a syntax that allows you to describe the features of an ieee std. 1149.1 bst-capable device that can be tested. test software development systems then use the bsdl files for test generation, analysis, failure diagnostics, and in-system programming. table 8?3. disabling ieee std. 1149.1 circuitry for max v devices jtag pins (1) tms tck tdi tdo vcc (2) gnd (3) vcc (2) leave open notes to table 8?3 : (1) there is no software option to disable jtag in max v devices. the jtag pins are dedicated. (2) vcc refers to v ccio of bank 1. (3) the tck signal may also be tied high. if tck is tied high, power-up conditions must ensure that tms is pulled high before tck . pulling tck low avoids this power-up condition.
8?16 chapter 8: jtag boundary-scan testing in max v devices document revision history max v device handbook december 2010 altera corporation f for more information, or to receive bsdl files for ieee std. 1149.1-compliant max v devices, refer to the ieee 1149.1 bsdl files page on the altera website. document revision history ta b l e 8 ?4 shows the revision history for this chapter. table 8?4. document revision history date version changes december 2010 1.0 initial release.
may 2011 altera corporation max v device handbook additional information this chapter provides additional information about the document and altera. document revision history the following table shows the revision history for this document. how to contact altera to locate the most up-to-date information about altera ? products, refer to the following table. typographic conventions the following table shows the typographic conventions this document uses. date version changes january 2011 1.1 updated max v device family overview, dc and switching characteristics for max v devices, and user flash memory in max v devices chapters. december 2010 1.0 initial release. contact (1) contact method address technical support website www.altera.com/support technical training website www.altera.com/training email custrain@altera.com product literature website www.altera.com/literature non-technical support (general) email nacomp@altera.com (software licensing) email authorization@altera.com note to table: (1) you can also contact your local altera sales office or sales representative. visual cue meaning bold type with initial capital letters indicate command names, dialog box titles, dialog box options, and other gui labels. for example, save as dialog box. for gui elements, capitalization matches the gui. bold type indicates directory names, project names, disk drive names, file names, file name extensions, software utility names, and gui labels. for example, \qdesigns directory, d: drive, and chiptrip.gdf file. italic type with initial capital letters indicate document titles. for example, s tratix iv design guidelines . italic type indicates variables. for example, n + 1. variable names are enclosed in angle brackets (< >). for example, and .pof file.
info?2 additional information typographic conventions max v device handbook may 2011 altera corporation initial capital letters indicate keyboard keys and menu names. for example, the delete key and the options menu. ?subheading title? quotation marks indicate references to sections within a document and titles of quartus ii help topics. for exam ple, ?typographic conventions.? courier type indicates signal, port, register, bit, block, and primitive names. for example, data1 , tdi , and input . the suffix n denotes an active-low signal. for example, resetn . indicates command line commands and anything that must be typed exactly as it appears. for example, c:\qdesigns\tutorial\chiptrip.gdf . also indicates sections of an actual file, such as a report file, references to parts of files (for example, the ahdl keyword subdesign ), and logic function names (for example, tri ). r an angled arrow instructs you to press the enter key. 1., 2., 3., and a., b., c., and so on numbered steps indicate a list of items when the sequence of the items is important, such as the steps listed in a procedure. bullets indicate a list of items when the sequence of the items is not important. 1 the hand points to information that requires special attention. ? a question mark directs you to a software help system with related information. f the feet direct you to another document or website with related information. c a caution calls attention to a condition or possible situation that can damage or destroy the product or your work. w a warning calls attention to a condition or possible situation that can cause you injury. the envelope links to the email subscription management center page of the altera website, where you can sign up to receive update notifications for altera documents. visual cue meaning

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